JPS58109837A - 検量線補正方法 - Google Patents

検量線補正方法

Info

Publication number
JPS58109837A
JPS58109837A JP56208047A JP20804781A JPS58109837A JP S58109837 A JPS58109837 A JP S58109837A JP 56208047 A JP56208047 A JP 56208047A JP 20804781 A JP20804781 A JP 20804781A JP S58109837 A JPS58109837 A JP S58109837A
Authority
JP
Japan
Prior art keywords
calibration curve
absorbance
concentration
sample
absorbances
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56208047A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0250416B2 (enExample
Inventor
Taiichi Sakano
坂野　泰一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP56208047A priority Critical patent/JPS58109837A/ja
Priority to US06/451,419 priority patent/US4587624A/en
Priority to DE19823247807 priority patent/DE3247807A1/de
Publication of JPS58109837A publication Critical patent/JPS58109837A/ja
Publication of JPH0250416B2 publication Critical patent/JPH0250416B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP56208047A 1981-12-24 1981-12-24 検量線補正方法 Granted JPS58109837A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP56208047A JPS58109837A (ja) 1981-12-24 1981-12-24 検量線補正方法
US06/451,419 US4587624A (en) 1981-12-24 1982-12-20 Method and apparatus for correcting a curve relating an absorbance to a concentration
DE19823247807 DE3247807A1 (de) 1981-12-24 1982-12-23 Verfahren zum aufnehmen einer extinktion/konzentrations-kurve und vorrichtung zur durchfuehrung des verfahrens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56208047A JPS58109837A (ja) 1981-12-24 1981-12-24 検量線補正方法

Publications (2)

Publication Number Publication Date
JPS58109837A true JPS58109837A (ja) 1983-06-30
JPH0250416B2 JPH0250416B2 (enExample) 1990-11-02

Family

ID=16549758

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56208047A Granted JPS58109837A (ja) 1981-12-24 1981-12-24 検量線補正方法

Country Status (3)

Country Link
US (1) US4587624A (enExample)
JP (1) JPS58109837A (enExample)
DE (1) DE3247807A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154161A (ja) * 1984-01-24 1985-08-13 Shimadzu Corp 免疫反応測定に使用する検量線の作成方法
JPS62842A (ja) * 1985-06-26 1987-01-06 Shimadzu Corp 検量線を使用する成分分析方法
JPS6382360A (ja) * 1986-09-26 1988-04-13 Agency Of Ind Science & Technol 陶石の化学組成による耐火度測定法
JPS63145959A (ja) * 1986-07-30 1988-06-18 Shinotesuto Kenkyusho:Kk 免疫的測定方法及び免疫的測定用キット
JPH08101198A (ja) * 1986-07-30 1996-04-16 Shinotesuto:Kk 免疫的測定方法及び装置
JP2015031676A (ja) * 2013-08-07 2015-02-16 倉敷紡績株式会社 濃度測定装置及び濃度測定方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4627014A (en) * 1984-04-09 1986-12-02 Eastman Kodak Company Method and apparatus for determination of an analyte and method of calibrating such apparatus
JPH0629852B2 (ja) * 1985-08-26 1994-04-20 富士写真フイルム株式会社 偏倚乾式分析要素を用いた液体試料中の被検物質の定量分析方法
US5014216A (en) * 1988-07-19 1991-05-07 Beckman Instruments, Inc. Concentration determination with multiple wavelength flash photometers
JPH0823559B2 (ja) * 1990-03-13 1996-03-06 三共株式会社 酵素免疫測定装置における検量線の設定方法
US5559728A (en) * 1990-10-09 1996-09-24 University Of Washington Calibration transfer for second order analytical instruments
US5459677A (en) * 1990-10-09 1995-10-17 Board Of Regents Of The University Of Washington Calibration transfer for analytical instruments
US5214593A (en) * 1990-11-07 1993-05-25 Rainin Instrument Co., Inc. Method and apparatus for extending the linear dynamic range of absorbance detectors including multi-lightpath flow cells
US5257212A (en) * 1991-03-21 1993-10-26 Eastman Kodak Company Normalizing analyzer systems to a standard analyzer
DE4310204A1 (de) * 1993-03-29 1994-10-06 Siemens Ag Verfahren zum Justieren eines Meßgerätes, insbesondere eines IR-Absorptions-Photometers
US5710713A (en) * 1995-03-20 1998-01-20 The Dow Chemical Company Method of creating standardized spectral libraries for enhanced library searching
US5525521A (en) * 1995-06-15 1996-06-11 Borrego Analytical, Inc. Cystic fibrosis tester
DE19832837A1 (de) * 1998-07-21 2000-01-27 Deutsch Zentr Luft & Raumfahrt Verfahren zur Bereitstellung der Absorptionskoeffizienten zur Ermittlung von Gasphasenspektren
JP2005069969A (ja) * 2003-08-27 2005-03-17 Amano:Kk 消毒液の濃度測定方法とその装置
RU2420728C2 (ru) * 2009-06-26 2011-06-10 Закрытое акционерное общество Научно-производственное объединение "Гранит-НЭМП" Способ коррекции выходного сигнала фотометрического датчика
CN102331412B (zh) * 2011-10-08 2013-12-11 左峰 多功能分析仪装置
CN113567602B (zh) * 2020-04-28 2024-11-22 株式会社岛津制作所 检测方法以及检测设备

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55109948A (en) * 1979-02-15 1980-08-23 Mazda Motor Corp Measuring method for exhaust gas of internal combustion engine

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3529162A (en) * 1967-05-02 1970-09-15 Industrial Nucleonics Corp Absorption curve matching circuit in nucleonic measuring system
US3701601A (en) * 1968-03-04 1972-10-31 Sherwood Medical Ind Inc Photometric read out and analyzing system
US3724957A (en) * 1971-03-04 1973-04-03 Yokogawa Electric Works Ltd Concentration measuring apparatus
US3807875A (en) * 1971-06-09 1974-04-30 Corning Glass Works Densitometry apparatus
US3739164A (en) * 1971-06-21 1973-06-12 Perkin Elmer Corp Device for compensating a derived signal
JPS509485A (enExample) * 1973-05-23 1975-01-30
US4059357A (en) * 1976-04-02 1977-11-22 Beckman Instruments, Inc. Densitometer calibrated reference standard
US4064396A (en) * 1976-12-13 1977-12-20 Sangamo Weston, Inc. Dynamic linearization system for a radiation gauge
JPS5459199A (en) * 1977-10-20 1979-05-12 Olympus Optical Co Ltd Ion concentration measuring apparatus
JPS5469497A (en) * 1977-11-12 1979-06-04 Kyoto Daiichi Kagaku Kk Method and device for measuring blood solidification time
US4238830A (en) * 1979-08-01 1980-12-09 The Perkin-Elmer Corporation Curvature correction

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55109948A (en) * 1979-02-15 1980-08-23 Mazda Motor Corp Measuring method for exhaust gas of internal combustion engine

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154161A (ja) * 1984-01-24 1985-08-13 Shimadzu Corp 免疫反応測定に使用する検量線の作成方法
JPS62842A (ja) * 1985-06-26 1987-01-06 Shimadzu Corp 検量線を使用する成分分析方法
JPS63145959A (ja) * 1986-07-30 1988-06-18 Shinotesuto Kenkyusho:Kk 免疫的測定方法及び免疫的測定用キット
JPH08101198A (ja) * 1986-07-30 1996-04-16 Shinotesuto:Kk 免疫的測定方法及び装置
JPS6382360A (ja) * 1986-09-26 1988-04-13 Agency Of Ind Science & Technol 陶石の化学組成による耐火度測定法
JP2015031676A (ja) * 2013-08-07 2015-02-16 倉敷紡績株式会社 濃度測定装置及び濃度測定方法

Also Published As

Publication number Publication date
JPH0250416B2 (enExample) 1990-11-02
DE3247807A1 (de) 1983-07-14
US4587624A (en) 1986-05-06

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