JPS5789481A - Etching method for thin ni film - Google Patents
Etching method for thin ni filmInfo
- Publication number
- JPS5789481A JPS5789481A JP55166285A JP16628580A JPS5789481A JP S5789481 A JPS5789481 A JP S5789481A JP 55166285 A JP55166285 A JP 55166285A JP 16628580 A JP16628580 A JP 16628580A JP S5789481 A JPS5789481 A JP S5789481A
- Authority
- JP
- Japan
- Prior art keywords
- thin
- film
- solution
- parts
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
- C23F1/28—Acidic compositions for etching iron group metals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
PURPOSE:To selectively etch a thin Ni film, by using a solution containing specified amounts of HNO3 and H2O2 as an etching solution for a back electrode comprising the laminate of Ni and Al layers in a thin film EL display device. CONSTITUTION:Parts 1, 4 at which electrode pattern-forming Ni and Al layers are evaporated in duplicate, are formed on the lead-connecting Al terminals of the stripped back electrode 1 of a thin film EL display device. The thin Ni film is selectively etched. In this case, a water solution containing 10-30% of HNO3 and 10-20% of H2O2 is used as an etchant. The thin Ni, Al double-layer coated parts 1, 4 are dipped in the solution. When the upper thin Ni layer only is rapidly removed by etching, the parts 1, 4 are taken out from the etching solution and then washed with water. The etching solution, being acidic, strongly acts on Ni, so that the thin Ni layer can be selectively etched without generation of any public pollution. Moreover, treatment for the waste solution can be easily performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55166285A JPS6058795B2 (en) | 1980-11-25 | 1980-11-25 | Ni thin film etching method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55166285A JPS6058795B2 (en) | 1980-11-25 | 1980-11-25 | Ni thin film etching method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5789481A true JPS5789481A (en) | 1982-06-03 |
JPS6058795B2 JPS6058795B2 (en) | 1985-12-21 |
Family
ID=15828521
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55166285A Expired JPS6058795B2 (en) | 1980-11-25 | 1980-11-25 | Ni thin film etching method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6058795B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8652972B2 (en) | 2005-08-12 | 2014-02-18 | Basf Aktiengesellschaft | Stabilized etching solutions for CU and CU/NI layers |
-
1980
- 1980-11-25 JP JP55166285A patent/JPS6058795B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8652972B2 (en) | 2005-08-12 | 2014-02-18 | Basf Aktiengesellschaft | Stabilized etching solutions for CU and CU/NI layers |
Also Published As
Publication number | Publication date |
---|---|
JPS6058795B2 (en) | 1985-12-21 |
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