JPS5742128A - Exposing method by electron beam - Google Patents
Exposing method by electron beamInfo
- Publication number
- JPS5742128A JPS5742128A JP11795980A JP11795980A JPS5742128A JP S5742128 A JPS5742128 A JP S5742128A JP 11795980 A JP11795980 A JP 11795980A JP 11795980 A JP11795980 A JP 11795980A JP S5742128 A JPS5742128 A JP S5742128A
- Authority
- JP
- Japan
- Prior art keywords
- stage
- point
- wafer
- corrected
- coordinates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
- H01J37/3045—Object or beam position registration
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11795980A JPS5742128A (en) | 1980-08-27 | 1980-08-27 | Exposing method by electron beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11795980A JPS5742128A (en) | 1980-08-27 | 1980-08-27 | Exposing method by electron beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5742128A true JPS5742128A (en) | 1982-03-09 |
Family
ID=14724478
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11795980A Pending JPS5742128A (en) | 1980-08-27 | 1980-08-27 | Exposing method by electron beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5742128A (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58210622A (ja) * | 1982-06-01 | 1983-12-07 | Fujitsu Ltd | 電子ビ−ム露光方法 |
JPS59135727A (ja) * | 1983-01-24 | 1984-08-04 | Jeol Ltd | 荷電粒子ビ−ム露光方法 |
JP2002110516A (ja) * | 2000-09-28 | 2002-04-12 | Advantest Corp | 電子ビーム露光装置、露光方法、及び半導体素子製造方法 |
-
1980
- 1980-08-27 JP JP11795980A patent/JPS5742128A/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58210622A (ja) * | 1982-06-01 | 1983-12-07 | Fujitsu Ltd | 電子ビ−ム露光方法 |
JPH0336297B2 (ja) * | 1982-06-01 | 1991-05-31 | Fujitsu Ltd | |
JPS59135727A (ja) * | 1983-01-24 | 1984-08-04 | Jeol Ltd | 荷電粒子ビ−ム露光方法 |
JP2002110516A (ja) * | 2000-09-28 | 2002-04-12 | Advantest Corp | 電子ビーム露光装置、露光方法、及び半導体素子製造方法 |
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