JPS57207383A - Phototransistor - Google Patents
PhototransistorInfo
- Publication number
- JPS57207383A JPS57207383A JP56092858A JP9285881A JPS57207383A JP S57207383 A JPS57207383 A JP S57207383A JP 56092858 A JP56092858 A JP 56092858A JP 9285881 A JP9285881 A JP 9285881A JP S57207383 A JPS57207383 A JP S57207383A
- Authority
- JP
- Japan
- Prior art keywords
- region
- layer
- type
- under
- depletion layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010410 layer Substances 0.000 abstract 8
- 239000000758 substrate Substances 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 1
- 238000005468 ion implantation Methods 0.000 abstract 1
- 239000002344 surface layer Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Abstract
PURPOSE:To increase the product of the speed of response of a photodiode and the gain band width of a transistor, and to obtain the phototransistor operating at high speed by making the width of a depletion layer just under an emitter region narrower than a depletion layer under a base region as a light receiving section. CONSTITUTION:An n<-> type layer 2 is grown onto an n<+> type Si substrate 1 in epitaxial form, an n<+> type region 10 reaching the substrate 1 from the surface is shaped to a predetermined region through diffusion or ion implantation an n<-> type layer is grown to the whole surface containing the region 10 again and unified with the layer 2 previously formed, and the thickness of the layer 2 is brought to prescribed one. The p type base region 3 is diffused and shaped to the surface layer section, and the small n<+> type emitter region 4 is formed to a region corresponding to the region 10 in the region 3. Accordingly, only the width of the depletion layer just under the region 4 is partially made narrower than the depletion layer under the region 3 as the light receiving section, and the speed of response is improved remarkably.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56092858A JPS57207383A (en) | 1981-06-15 | 1981-06-15 | Phototransistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56092858A JPS57207383A (en) | 1981-06-15 | 1981-06-15 | Phototransistor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57207383A true JPS57207383A (en) | 1982-12-20 |
Family
ID=14066123
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56092858A Pending JPS57207383A (en) | 1981-06-15 | 1981-06-15 | Phototransistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57207383A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58125970A (en) * | 1982-01-22 | 1983-07-27 | Nec Corp | Solid-state image pickup device |
US8350301B2 (en) | 2009-08-07 | 2013-01-08 | Hitachi, Ltd. | Semiconductor photodiode device and manufacturing method thereof |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5449087A (en) * | 1977-09-26 | 1979-04-18 | Sharp Corp | Manufacture of photo semiconductor device |
-
1981
- 1981-06-15 JP JP56092858A patent/JPS57207383A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5449087A (en) * | 1977-09-26 | 1979-04-18 | Sharp Corp | Manufacture of photo semiconductor device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58125970A (en) * | 1982-01-22 | 1983-07-27 | Nec Corp | Solid-state image pickup device |
JPH0424870B2 (en) * | 1982-01-22 | 1992-04-28 | Nippon Electric Co | |
US8350301B2 (en) | 2009-08-07 | 2013-01-08 | Hitachi, Ltd. | Semiconductor photodiode device and manufacturing method thereof |
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