JPS57112011A - Heat treatment equipment for semiconductor wafer - Google Patents
Heat treatment equipment for semiconductor waferInfo
- Publication number
- JPS57112011A JPS57112011A JP18727380A JP18727380A JPS57112011A JP S57112011 A JPS57112011 A JP S57112011A JP 18727380 A JP18727380 A JP 18727380A JP 18727380 A JP18727380 A JP 18727380A JP S57112011 A JPS57112011 A JP S57112011A
- Authority
- JP
- Japan
- Prior art keywords
- reaction tube
- temperature
- section
- heat treatment
- treatment equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 235000012431 wafers Nutrition 0.000 abstract 2
- 238000003780 insertion Methods 0.000 abstract 1
- 230000037431 insertion Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- 230000001052 transient effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
PURPOSE:To uniformly maintain the temperature in the reaction tube of the subject heat treatment equipment by a method wherein a main heater section and a correcting heater section, located on both sides of the main heater section, are provided around the reaction tube constituting the heat treatment equipment. CONSTITUTION:On the circumference of the quartz reaction tube 1 having an air admission port 4 and an air exhaust port 5, the main heater section 6 and the correcting heater sections 7 and 8, pinching the main heater section, are provided and a plurality of semiconductor wafers 2 standing on the boat 3 are placed in the reaction tube 1. Then, control sections 9 and 11 are connected to the correcting heater sections 7 and 8 respectively, a measuring instruments 12 and 14 are inserted in the reaction tube 1 corresponding to the control sections 9 and 11, and in the same manner, a control section 10 and a measuring instrument 13 corresponding to the control section 10 are provided. Then, the temperature is set at T1-T3 by corresponding to the temperature in the reaction tube 1 using the control section, the temperature in the reaction tube is uniformalized, and the transient temperature variation at the time of wafer insertion can be quickly recovered.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18727380A JPS57112011A (en) | 1980-12-29 | 1980-12-29 | Heat treatment equipment for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18727380A JPS57112011A (en) | 1980-12-29 | 1980-12-29 | Heat treatment equipment for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57112011A true JPS57112011A (en) | 1982-07-12 |
Family
ID=16203098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18727380A Pending JPS57112011A (en) | 1980-12-29 | 1980-12-29 | Heat treatment equipment for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57112011A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59125832U (en) * | 1983-02-14 | 1984-08-24 | 日本電気株式会社 | heat treatment equipment |
JPS6049624U (en) * | 1983-09-13 | 1985-04-08 | 富士通株式会社 | heat treatment equipment |
JPS60211913A (en) * | 1984-04-06 | 1985-10-24 | Hitachi Ltd | Processing device |
JPS6185821A (en) * | 1984-10-04 | 1986-05-01 | Matsushita Electric Ind Co Ltd | Vapor growth method |
JPS61152010A (en) * | 1984-12-26 | 1986-07-10 | Hitachi Ltd | Heat treating device for semiconductor wafer |
JPS63263730A (en) * | 1987-04-22 | 1988-10-31 | Nec Corp | Heat treatment device for semiconductor wafer |
JPS63278227A (en) * | 1987-05-08 | 1988-11-15 | Teru Sagami Kk | Heat treatment equipment |
JPH08321472A (en) * | 1996-06-24 | 1996-12-03 | Hitachi Ltd | Processor |
-
1980
- 1980-12-29 JP JP18727380A patent/JPS57112011A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59125832U (en) * | 1983-02-14 | 1984-08-24 | 日本電気株式会社 | heat treatment equipment |
JPH0319222Y2 (en) * | 1983-02-14 | 1991-04-23 | ||
JPS6049624U (en) * | 1983-09-13 | 1985-04-08 | 富士通株式会社 | heat treatment equipment |
JPS60211913A (en) * | 1984-04-06 | 1985-10-24 | Hitachi Ltd | Processing device |
JPS6185821A (en) * | 1984-10-04 | 1986-05-01 | Matsushita Electric Ind Co Ltd | Vapor growth method |
JPS61152010A (en) * | 1984-12-26 | 1986-07-10 | Hitachi Ltd | Heat treating device for semiconductor wafer |
JPS63263730A (en) * | 1987-04-22 | 1988-10-31 | Nec Corp | Heat treatment device for semiconductor wafer |
JPS63278227A (en) * | 1987-05-08 | 1988-11-15 | Teru Sagami Kk | Heat treatment equipment |
JPH08321472A (en) * | 1996-06-24 | 1996-12-03 | Hitachi Ltd | Processor |
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