JPS57107045A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57107045A
JPS57107045A JP18457780A JP18457780A JPS57107045A JP S57107045 A JPS57107045 A JP S57107045A JP 18457780 A JP18457780 A JP 18457780A JP 18457780 A JP18457780 A JP 18457780A JP S57107045 A JPS57107045 A JP S57107045A
Authority
JP
Japan
Prior art keywords
chip
marking
crack
wafer
decision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18457780A
Other languages
Japanese (ja)
Inventor
Susumu Nakamori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP18457780A priority Critical patent/JPS57107045A/en
Publication of JPS57107045A publication Critical patent/JPS57107045A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To make a decision by eye view easy and permit a recognition using an automatic recognizer by providing a special portion for marking a poor electric characteristic for a portion of wiring pattern on the chip. CONSTITUTION:An examination for the electric characteristic of a wafer is performed after the finishing of an element manufacturing process and a mark (crack) for recognizing a defective chip is given. A marked portion A is set at a specific place of a chip on the wafer and a normal wiring pattern B has previously been formed in the marking portion A. A crack C is provided for the marking portion A on pattern B of a defective chip. According to such a constitution, the decision by eye view can be easily performed after separation of the chip, and further, for example, an automatic recognition can be established by difference in a reflecton factor, etc.
JP18457780A 1980-12-25 1980-12-25 Semiconductor device Pending JPS57107045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18457780A JPS57107045A (en) 1980-12-25 1980-12-25 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18457780A JPS57107045A (en) 1980-12-25 1980-12-25 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS57107045A true JPS57107045A (en) 1982-07-03

Family

ID=16155634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18457780A Pending JPS57107045A (en) 1980-12-25 1980-12-25 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57107045A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029493A (en) * 1989-08-30 1991-07-09 Toyota Jidosha Kabushiki Kaisha Hydraulic control device in automatic transmission in vehicle equipped with electronic throttle opening control device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029493A (en) * 1989-08-30 1991-07-09 Toyota Jidosha Kabushiki Kaisha Hydraulic control device in automatic transmission in vehicle equipped with electronic throttle opening control device

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