JPS56137628A - Pattern forming - Google Patents
Pattern formingInfo
- Publication number
- JPS56137628A JPS56137628A JP4089580A JP4089580A JPS56137628A JP S56137628 A JPS56137628 A JP S56137628A JP 4089580 A JP4089580 A JP 4089580A JP 4089580 A JP4089580 A JP 4089580A JP S56137628 A JPS56137628 A JP S56137628A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- mask
- space
- constitution
- patterns
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Bipolar Transistors (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4089580A JPS56137628A (en) | 1980-03-28 | 1980-03-28 | Pattern forming |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4089580A JPS56137628A (en) | 1980-03-28 | 1980-03-28 | Pattern forming |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56137628A true JPS56137628A (en) | 1981-10-27 |
JPS6310890B2 JPS6310890B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-03-10 |
Family
ID=12593240
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4089580A Granted JPS56137628A (en) | 1980-03-28 | 1980-03-28 | Pattern forming |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56137628A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005252165A (ja) * | 2004-03-08 | 2005-09-15 | Semiconductor Leading Edge Technologies Inc | パターン形成方法 |
-
1980
- 1980-03-28 JP JP4089580A patent/JPS56137628A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005252165A (ja) * | 2004-03-08 | 2005-09-15 | Semiconductor Leading Edge Technologies Inc | パターン形成方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6310890B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-03-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5534490A (en) | Alignment device | |
JPS51120180A (en) | Pattern printing device | |
JPS56137628A (en) | Pattern forming | |
JPS57106128A (en) | Forming method for pattern | |
JPS56137627A (en) | Pattern forming | |
JPS5431282A (en) | Pattern formation method | |
JPS51126073A (en) | Pattern printing equpment made available by photo-etching method | |
JPS52144973A (en) | Positioning method of semiconductor wafers | |
JPS5722240A (en) | Photomask for proximity exposure | |
JPS5556629A (en) | Pattern forming method | |
JPS51148370A (en) | Electron ray exposure method | |
JPS5251870A (en) | Electron bean exposure method | |
JPS51139267A (en) | Photo-mask | |
JPS52143772A (en) | Alignment method of masks using special reference marks | |
JPS5691424A (en) | Mask accuracy measuring pattern | |
JPS5619051A (en) | Production of photo mask | |
JPS53117384A (en) | Photoetching mask | |
JPS5388728A (en) | Method of forming pattern | |
JPS5612644A (en) | Manufacture of photomask | |
JPS5741637A (en) | Microstep tablet | |
JPS57132008A (en) | Measuring method for pattern size | |
JPS56160040A (en) | Printing device | |
JPS5359370A (en) | Positioning method | |
JPS51124380A (en) | Photo mask | |
JPS56137630A (en) | Pattern forming |