JPS56108242A - Master slice semiconductor device - Google Patents

Master slice semiconductor device

Info

Publication number
JPS56108242A
JPS56108242A JP1028180A JP1028180A JPS56108242A JP S56108242 A JPS56108242 A JP S56108242A JP 1028180 A JP1028180 A JP 1028180A JP 1028180 A JP1028180 A JP 1028180A JP S56108242 A JPS56108242 A JP S56108242A
Authority
JP
Japan
Prior art keywords
wiring
polycrystalline
master slice
layer
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1028180A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0120537B2 (enExample
Inventor
Soichi Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP1028180A priority Critical patent/JPS56108242A/ja
Publication of JPS56108242A publication Critical patent/JPS56108242A/ja
Publication of JPH0120537B2 publication Critical patent/JPH0120537B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
    • H10W20/43—Layouts of interconnections

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
JP1028180A 1980-01-31 1980-01-31 Master slice semiconductor device Granted JPS56108242A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1028180A JPS56108242A (en) 1980-01-31 1980-01-31 Master slice semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1028180A JPS56108242A (en) 1980-01-31 1980-01-31 Master slice semiconductor device

Publications (2)

Publication Number Publication Date
JPS56108242A true JPS56108242A (en) 1981-08-27
JPH0120537B2 JPH0120537B2 (enExample) 1989-04-17

Family

ID=11745921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1028180A Granted JPS56108242A (en) 1980-01-31 1980-01-31 Master slice semiconductor device

Country Status (1)

Country Link
JP (1) JPS56108242A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5874052A (ja) * 1981-10-29 1983-05-04 Nec Corp マスタ−スライス半導体集積回路装置
JPS58139445A (ja) * 1982-02-15 1983-08-18 Nec Corp 半導体集積回路装置
JPH06112447A (ja) * 1992-11-13 1994-04-22 Seiko Epson Corp 半導体装置
US8407539B2 (en) 2009-03-03 2013-03-26 Renesas Electronics Corporation Semiconductor device test circuit, semiconductor device, and its manufacturing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5024597A (enExample) * 1973-03-14 1975-03-15
JPS5120268A (en) * 1974-08-08 1976-02-18 Takashi Ishikawa Taika * tainetsusei goseijushi
JPS5493344A (en) * 1977-12-30 1979-07-24 Fujitsu Ltd Semiconductor integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5024597A (enExample) * 1973-03-14 1975-03-15
JPS5120268A (en) * 1974-08-08 1976-02-18 Takashi Ishikawa Taika * tainetsusei goseijushi
JPS5493344A (en) * 1977-12-30 1979-07-24 Fujitsu Ltd Semiconductor integrated circuit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5874052A (ja) * 1981-10-29 1983-05-04 Nec Corp マスタ−スライス半導体集積回路装置
JPS58139445A (ja) * 1982-02-15 1983-08-18 Nec Corp 半導体集積回路装置
JPH06112447A (ja) * 1992-11-13 1994-04-22 Seiko Epson Corp 半導体装置
US8407539B2 (en) 2009-03-03 2013-03-26 Renesas Electronics Corporation Semiconductor device test circuit, semiconductor device, and its manufacturing method

Also Published As

Publication number Publication date
JPH0120537B2 (enExample) 1989-04-17

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