JPS5580357A - Manufacture of insulated gate type field effect transistor - Google Patents

Manufacture of insulated gate type field effect transistor

Info

Publication number
JPS5580357A
JPS5580357A JP15540878A JP15540878A JPS5580357A JP S5580357 A JPS5580357 A JP S5580357A JP 15540878 A JP15540878 A JP 15540878A JP 15540878 A JP15540878 A JP 15540878A JP S5580357 A JPS5580357 A JP S5580357A
Authority
JP
Japan
Prior art keywords
layers
polysilicon
oxidized film
drain
manufacture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15540878A
Other languages
Japanese (ja)
Inventor
Yoshiki Tanigawa
Kunihiko Hirashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP15540878A priority Critical patent/JPS5580357A/en
Publication of JPS5580357A publication Critical patent/JPS5580357A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE: To decrease a parasitic capacitance by a method wherein drain and source layers are provided through a polysilicon electrode according to diffusion, and a gate oxidized film is formed newly between both the layers with polysilicon working as a mask.
CONSTITUTION: Polysilicon layers 3D, 3S are formed on an oxidized film 2 of a p--type silicon substrate through openings. After forming n-type source and drain layers 4D, 4S through polysilicon according to P-diffusion, an oxidized film between the layers 4D, 4S is removed, a gate oxidized film 2G is formed, and a gate electrode 6 is formed selectively. According to this constitution, the drain can be formed in a minimum area necessary for injection with the substrate, and an interval with the gate electrode can be made as narrow as both the two overlap one another through the insulating film, therefore a parasitic capacitance can be decreased, an offset can also be suppressed throughly, thus obtaining FET even in characteristic.
COPYRIGHT: (C)1980,JPO&Japio
JP15540878A 1978-12-13 1978-12-13 Manufacture of insulated gate type field effect transistor Pending JPS5580357A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15540878A JPS5580357A (en) 1978-12-13 1978-12-13 Manufacture of insulated gate type field effect transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15540878A JPS5580357A (en) 1978-12-13 1978-12-13 Manufacture of insulated gate type field effect transistor

Publications (1)

Publication Number Publication Date
JPS5580357A true JPS5580357A (en) 1980-06-17

Family

ID=15605320

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15540878A Pending JPS5580357A (en) 1978-12-13 1978-12-13 Manufacture of insulated gate type field effect transistor

Country Status (1)

Country Link
JP (1) JPS5580357A (en)

Similar Documents

Publication Publication Date Title
JPS5286083A (en) Production of complimentary isolation gate field effect transistor
JPS5284981A (en) Production of insulated gate type semiconductor device
JPS5366181A (en) High dielectric strength mis type transistor
JPS5382179A (en) Field effect transistor
JPS5578574A (en) Manufacture of insulated-gate field-effect transistor
JPS5375877A (en) Vertical type micro mos transistor
JPS5580357A (en) Manufacture of insulated gate type field effect transistor
JPS5248475A (en) Semiconductor device
JPS57166067A (en) Bias generating unit for substrate
JPS572579A (en) Manufacture of junction type field effect transistor
JPS52100877A (en) Field effect transistor of junction type
JPS5552262A (en) Mos semiconductor device
JPS5376770A (en) Production of insulated gate field effect transistor
JPS5317284A (en) Production of semiconductor device
JPS5412566A (en) Production of semiconductor device
JPS54101290A (en) Semiconductor integtated circuit unit and its manufacture
JPS5286086A (en) Field effect transistor
JPS5530873A (en) High withstand field-effect transistor of mis type
JPS538080A (en) Insulated gate type field effect transistor
JPS5591873A (en) Manufacture of semiconductor device
JPS52146186A (en) Semiconductor device
JPS5599778A (en) Insulated-gate type field effect transistor
JPS52123878A (en) Mos type semiconductor device and its production process
JPS5346287A (en) Production of semiconductor integrated circuit
JPS53112679A (en) Manufacture for mis type semiconductor device