JPS5599778A - Insulated-gate type field effect transistor - Google Patents
Insulated-gate type field effect transistorInfo
- Publication number
- JPS5599778A JPS5599778A JP736679A JP736679A JPS5599778A JP S5599778 A JPS5599778 A JP S5599778A JP 736679 A JP736679 A JP 736679A JP 736679 A JP736679 A JP 736679A JP S5599778 A JPS5599778 A JP S5599778A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- film
- molybdenum
- insulated
- field effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To obtain high speed characteristics and make the device compact by directly connecting a gate electrode made of a molybdenum layer and the specified source-drain region by means of a polycrystalline silicon layer. CONSTITUTION:By using the conventional molybdenum gate MOS-FET process, molybdenum layer 24 and oxide film 23 are formed. Subsequently, polycrystalline silicon layer 25 is formed on the entire surface. Then, an n-type impurity is diffused through layer 25, and using oxide films 22 and 23 as masks, n-type source and drain regions 26a and 26b are formed. Next, silicon nitride film 27 is formed, and by oxidizing by using film 27 as a mask, oxidized part 28 is formed. Subsequently, film 27 is removed. Next, an insulating oxide film which insulates metal wiring layer 31 and layer 25 is formed. Then, by selectively removing film 29, a contact hole is formed, and then metal wiring layer 31 is formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP736679A JPS5599778A (en) | 1979-01-24 | 1979-01-24 | Insulated-gate type field effect transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP736679A JPS5599778A (en) | 1979-01-24 | 1979-01-24 | Insulated-gate type field effect transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5599778A true JPS5599778A (en) | 1980-07-30 |
Family
ID=11663962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP736679A Pending JPS5599778A (en) | 1979-01-24 | 1979-01-24 | Insulated-gate type field effect transistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5599778A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61270822A (en) * | 1985-05-25 | 1986-12-01 | Sony Corp | Manufacture of semiconductor device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5296873A (en) * | 1976-06-26 | 1977-08-15 | Tdk Corp | Mos type field effect transistor and its manufacture |
-
1979
- 1979-01-24 JP JP736679A patent/JPS5599778A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5296873A (en) * | 1976-06-26 | 1977-08-15 | Tdk Corp | Mos type field effect transistor and its manufacture |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61270822A (en) * | 1985-05-25 | 1986-12-01 | Sony Corp | Manufacture of semiconductor device |
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