JPS5533660A - Measurement of crystal orientation or strain in fine region - Google Patents
Measurement of crystal orientation or strain in fine regionInfo
- Publication number
- JPS5533660A JPS5533660A JP10718278A JP10718278A JPS5533660A JP S5533660 A JPS5533660 A JP S5533660A JP 10718278 A JP10718278 A JP 10718278A JP 10718278 A JP10718278 A JP 10718278A JP S5533660 A JPS5533660 A JP S5533660A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron beam
- optical system
- kossel
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10718278A JPS5533660A (en) | 1978-08-31 | 1978-08-31 | Measurement of crystal orientation or strain in fine region |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10718278A JPS5533660A (en) | 1978-08-31 | 1978-08-31 | Measurement of crystal orientation or strain in fine region |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5533660A true JPS5533660A (en) | 1980-03-08 |
JPS631533B2 JPS631533B2 (ja) | 1988-01-13 |
Family
ID=14452538
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10718278A Granted JPS5533660A (en) | 1978-08-31 | 1978-08-31 | Measurement of crystal orientation or strain in fine region |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5533660A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01166453A (ja) * | 1987-12-23 | 1989-06-30 | Kawasaki Steel Corp | コッセル像観察装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4945290A (ja) * | 1972-09-08 | 1974-04-30 | ||
JPS50146267A (ja) * | 1974-05-13 | 1975-11-22 |
-
1978
- 1978-08-31 JP JP10718278A patent/JPS5533660A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4945290A (ja) * | 1972-09-08 | 1974-04-30 | ||
JPS50146267A (ja) * | 1974-05-13 | 1975-11-22 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01166453A (ja) * | 1987-12-23 | 1989-06-30 | Kawasaki Steel Corp | コッセル像観察装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS631533B2 (ja) | 1988-01-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE2335304B2 (de) | Rasterelektronenmikroskop | |
JPH0530279Y2 (ja) | ||
DE3032818A1 (de) | Durchstrahlungsrasterelektronenmikroskop mit automatischer strahlkorrektur | |
JPS55121259A (en) | Elelctron microscope | |
FR2497399B1 (fr) | Dispositif pour detecter la focalisation d'un faisceau d'electrons dans un tube-image et procede pour detecter et ajuster cette focalisation | |
JPS60136315A (ja) | マイクロイオンビ−ム加工方法およびその装置 | |
DE2555781C3 (de) | Elektronenstrahlapparat | |
DE1006983B (de) | Verfahren und Vorrichtung zur uebermikroskopischen Abbildung mittels eines Jonenmikroskops | |
JPS5533660A (en) | Measurement of crystal orientation or strain in fine region | |
DE2702444B2 (de) | Korpuskularstrahloptisches Gerät zur Abbildung einer Maske auf ein Präparat | |
US2418228A (en) | Electronic microanalyzer | |
GB660787A (en) | Improvements in or relating to electronic microscopes | |
GB2002547A (en) | Investigation of astigmatism in electron beam probe instruments | |
US2270112A (en) | Electron optical device | |
JPH10214587A (ja) | 立体観察用走査透過電子顕微鏡及び立体画像形成システム | |
JPS5613650A (en) | Scanning type focusing electron-ray diffractor | |
JPH05325860A (ja) | 走査電子顕微鏡における像撮影方法 | |
JPH0243089Y2 (ja) | ||
JP3064335B2 (ja) | 透過型電子顕微鏡 | |
Lewis | A microbeam back-reflexion X-ray camera | |
JPS60130044A (ja) | 走査電子顕微鏡 | |
Pease | The determination of the area of emission of reflected electrons in a scanning electron microscope | |
JPS589545B2 (ja) | デンシケンビキヨウニオケルタイブツレンズノ ヒテンシユウサホセイホウホウ | |
JPS623542B2 (ja) | ||
JPS5252562A (en) | Electron beam scanning type sample image pick-up device |