JPS55154444A - Automatic defect detector - Google Patents

Automatic defect detector

Info

Publication number
JPS55154444A
JPS55154444A JP4450780A JP4450780A JPS55154444A JP S55154444 A JPS55154444 A JP S55154444A JP 4450780 A JP4450780 A JP 4450780A JP 4450780 A JP4450780 A JP 4450780A JP S55154444 A JPS55154444 A JP S55154444A
Authority
JP
Japan
Prior art keywords
defect detector
automatic defect
automatic
detector
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4450780A
Other languages
English (en)
Inventor
Ruisu Niiheizeru Geerii
Aaru Fuubaa Buratsudorii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Armco Inc
Original Assignee
Armco Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Armco Inc filed Critical Armco Inc
Publication of JPS55154444A publication Critical patent/JPS55154444A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP4450780A 1979-04-05 1980-04-04 Automatic defect detector Pending JPS55154444A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/027,320 US4223346A (en) 1979-04-05 1979-04-05 Automatic defect detecting inspection apparatus

Publications (1)

Publication Number Publication Date
JPS55154444A true JPS55154444A (en) 1980-12-02

Family

ID=21837010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4450780A Pending JPS55154444A (en) 1979-04-05 1980-04-04 Automatic defect detector

Country Status (6)

Country Link
US (1) US4223346A (ja)
JP (1) JPS55154444A (ja)
DE (1) DE3013244A1 (ja)
FR (1) FR2453407A1 (ja)
GB (1) GB2051349A (ja)
SE (1) SE8002507L (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277040A (ja) * 1985-05-31 1986-12-08 Nippon Hoso Kyokai <Nhk> テ−プ状記録体の検査装置

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US4319270A (en) * 1979-01-12 1982-03-09 Kobe Steel, Ltd. Surface inspection system for hot radiant material
DE2901970C2 (de) * 1979-01-19 1981-08-20 H.F. & Ph.F. Reemtsma Gmbh & Co, 2000 Hamburg Verfahren und Vorrichtung zum Aussortieren von Fremdkörpern aus auf einem sich bewegenden Förderband o.ä. befindlichen Gut
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance
DE3027775A1 (de) * 1980-07-23 1982-02-04 Eckehardt Dipl.-Chem. 8550 Forchheim Strich Verfahren zur optischen ueberpruefung schnell bewegter homogener materialbahnen auf fehlerstellen
DE3028942A1 (de) 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche
JPS6333160Y2 (ja) * 1980-09-27 1988-09-05
FR2500630A1 (fr) * 1981-02-25 1982-08-27 Leser Jacques Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede
JPS57161640A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for surface
JPS58173456A (ja) * 1982-04-05 1983-10-12 Showa Electric Wire & Cable Co Ltd 異物自動検査装置
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
US4468551A (en) * 1982-07-30 1984-08-28 Armco Inc. Laser treatment of electrical steel and optical scanning assembly therefor
IL66788A (en) * 1982-09-14 1985-02-28 Optrotech Ltd Optical scanning apparatus using a wave guide
FR2548077B1 (fr) * 1983-06-30 1987-03-06 Gerber Scient Inc Appareil pour aider un operateur a resoudre les problemes poses par les defauts des etoffes
US4585343A (en) * 1983-11-04 1986-04-29 Libbey-Owens-Ford Company Apparatus and method for inspecting glass
AT379684B (de) * 1984-01-11 1986-02-10 Voest Alpine Ag Verfarhen zur oberflaechenpruefung von stahlstraengen sowie einrichtung zur durchfuehrung des verfahrens
US4561104A (en) * 1984-01-16 1985-12-24 Honeywell Inc. Automated inspection of hot steel slabs
EP0233389A1 (en) * 1986-02-12 1987-08-26 Josef W. Repsch A method of measuring the weight per unit area, density and thickness of a moving sheet
US4633504A (en) * 1984-06-28 1986-12-30 Kla Instruments Corporation Automatic photomask inspection system having image enhancement means
US4877323A (en) * 1984-11-23 1989-10-31 Stillwagon W C Method and apparatus for inspecting a high speed web
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system
DE3709500A1 (de) * 1985-09-24 1988-10-06 Sick Optik Elektronik Erwin Optische bahnueberwachungseinrichtung mit zeilenkameras mit gerichteter beleuchtung
DE3534019A1 (de) * 1985-09-24 1987-04-02 Sick Optik Elektronik Erwin Optische bahnueberwachungsvorrichtung
FR2591341B1 (fr) * 1985-12-10 1988-02-19 Saint Gobain Vitrage Technique de detection de defauts optiques sur ligne de production de verre
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
DE3805248A1 (de) * 1988-02-19 1989-08-31 Dietrich Luederitz Elektronische folienbeobachtungseinrichtung
US4922337B1 (en) * 1988-04-26 1994-05-03 Picker Int Inc Time delay and integration of images using a frame transfer ccd sensor
USRE36047E (en) * 1988-09-26 1999-01-19 Picker International, Inc. Multi-mode TDI/raster-scan television camera system
US5083867A (en) * 1988-11-28 1992-01-28 Allegheny Ludlum Corporation Slab surface contour monitor
US4972091A (en) * 1989-05-16 1990-11-20 Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee Method and apparatus for detecting the presence of flaws in a moving sheet of material
US5058982A (en) * 1989-06-21 1991-10-22 Orbot Systems Ltd. Illumination system and inspection apparatus including same
US5066865A (en) * 1989-09-01 1991-11-19 Measurex Corporation Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation
US5046112A (en) * 1989-11-28 1991-09-03 Aluminum Company Of America Suppression of machine marks on image of workpiece surface
WO1991014173A2 (en) * 1990-03-13 1991-09-19 E.I. Du Pont De Nemours And Company Web inspection system
US5120976A (en) * 1990-07-25 1992-06-09 The Boeing Company Strip lay-up verification system with width and centerline skew determination
US5132791A (en) * 1990-09-25 1992-07-21 Ball Corporation Optical sheet inspection system
JPH0581408A (ja) * 1991-09-19 1993-04-02 Hiyuutec:Kk 欠点画像表示方法
NO914574L (no) * 1991-11-22 1993-05-24 Elkem Technology Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne
DE4209773C2 (de) * 1992-03-26 1994-09-08 Groz & Soehne Theodor Vorrichtung zum Ermitteln von Strukturfehlern in textilen Flächengebilden
US5668887A (en) * 1992-05-29 1997-09-16 Eastman Kodak Company Coating density analyzer and method using non-synchronous TDI camera
US5488480A (en) * 1994-02-16 1996-01-30 Cmd Corporation Apparatus and method for detecting a heat seal in a moving plastic film
US5861078A (en) * 1993-08-12 1999-01-19 Cmd Corporation Method and apparatus for detecting a seal on a plastic bag
DE19545005A1 (de) * 1995-12-02 1997-06-05 Abb Patent Gmbh Verfahren zur Überwachung der Beschichtung einer Platte aus einem Metall mit hoher Leitfähigkeit mit einem Material mit geringerer Leitfähigkeit und Vorrichtung zur Durchführung des Verfahrens
GB9614073D0 (en) * 1996-07-04 1996-09-04 Surface Inspection Ltd Visual inspection apparatus
US5899959A (en) * 1996-10-25 1999-05-04 International Paper Company Measurement of visual characteristics of paper
CN1314997A (zh) * 1998-06-16 2001-09-26 奥宝科技有限公司 检查基本平坦平面的发光器
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
US6345129B1 (en) * 1999-02-03 2002-02-05 Oren Aharon Wide-field scanning tv
IL131284A (en) 1999-08-05 2003-05-29 Orbotech Ltd Illumination for inspecting surfaces of articles
AU2001288641A1 (en) * 2000-09-01 2002-03-13 Mark M. Abbott Optical system for imaging distortions in moving reflective sheets
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7324681B2 (en) 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US6950546B2 (en) * 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7289656B2 (en) * 2003-12-02 2007-10-30 The Boeing Company Systems and methods for determining inconsistency characteristics of a composite structure
US8934702B2 (en) * 2003-12-02 2015-01-13 The Boeing Company System and method for determining cumulative tow gap width
US8068659B2 (en) * 2003-12-02 2011-11-29 The Boeing Company Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure
US11680867B2 (en) 2004-06-14 2023-06-20 Wanda Papadimitriou Stress engineering assessment of risers and riser strings
US11710489B2 (en) 2004-06-14 2023-07-25 Wanda Papadimitriou Autonomous material evaluation system and method
ITFI20050048A1 (it) * 2005-03-22 2006-09-23 Mapastone S R L Apparecchiatura per eseguire una scansione ad alta risoluzione di una lastra in materiale lapideo
US7369240B1 (en) 2006-07-20 2008-05-06 Litesentry Corporation Apparatus and methods for real-time adaptive inspection for glass production
US7551274B1 (en) 2007-02-28 2009-06-23 Lite Sentry Corporation Defect detection lighting system and methods for large glass sheets
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법
JP6173727B2 (ja) * 2013-03-11 2017-08-02 新日鐵住金株式会社 金属材料の撮像装置
US9613412B1 (en) 2015-12-21 2017-04-04 Cambria Company Llc Stone slab manufacturing methods and systems
US10467352B2 (en) 2017-04-03 2019-11-05 Cambria Company Llc Stone slab production methods and systems

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CA684601A (en) * 1964-04-21 Sick Erwin Photoelectric scanning device
US2803755A (en) * 1954-12-16 1957-08-20 Gen Electric Automatic inspection gage
US3096443A (en) * 1960-06-20 1963-07-02 Jones & Laughlin Steel Corp Electronic surface inspection system
NL282725A (ja) * 1961-09-05
DE2100046B2 (de) * 1971-01-02 1974-03-21 Dr.-Ing. Rudolf Hell Gmbh, 2300 Kiel Anordnung zur laufenden Ermittlung von Oberflächenfehlern bahnförmiger Materialien
US3803353A (en) * 1972-09-08 1974-04-09 Eastman Kodak Co Optical-to-electrical signal transducer method and apparatus
US3877821A (en) * 1973-07-23 1975-04-15 Inex Inc Apparatus for detecting flaws using an array of photo sensitive devices
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2433683C3 (de) * 1974-07-12 1979-02-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn auf Fehlstellen
DE2704983C3 (de) * 1977-02-07 1980-01-17 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zum Erkennen von Fehlern in der Oberfläche oder den Abmessungen eines Objektes sowie zum Erkennen der Lage des Objektes mit Hilfe einer Fotodiodenzeile

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277040A (ja) * 1985-05-31 1986-12-08 Nippon Hoso Kyokai <Nhk> テ−プ状記録体の検査装置

Also Published As

Publication number Publication date
SE8002507L (sv) 1980-10-06
DE3013244A1 (de) 1980-10-09
FR2453407A1 (fr) 1980-10-31
GB2051349A (en) 1981-01-14
US4223346A (en) 1980-09-16

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