JPS55129731A - Automatic detector for deficient tablet - Google Patents

Automatic detector for deficient tablet

Info

Publication number
JPS55129731A
JPS55129731A JP3731179A JP3731179A JPS55129731A JP S55129731 A JPS55129731 A JP S55129731A JP 3731179 A JP3731179 A JP 3731179A JP 3731179 A JP3731179 A JP 3731179A JP S55129731 A JPS55129731 A JP S55129731A
Authority
JP
Japan
Prior art keywords
tablet
inspection
fed
inspection position
linear array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3731179A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6252256B2 (enrdf_load_stackoverflow
Inventor
Kan Oteru
Tomoichi Katou
Shuji Hashimoto
Yutaka Watanabe
Toshio Tanaka
Yuichi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP3731179A priority Critical patent/JPS55129731A/ja
Publication of JPS55129731A publication Critical patent/JPS55129731A/ja
Publication of JPS6252256B2 publication Critical patent/JPS6252256B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508—Capsules; Tablets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP3731179A 1979-03-29 1979-03-29 Automatic detector for deficient tablet Granted JPS55129731A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3731179A JPS55129731A (en) 1979-03-29 1979-03-29 Automatic detector for deficient tablet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3731179A JPS55129731A (en) 1979-03-29 1979-03-29 Automatic detector for deficient tablet

Publications (2)

Publication Number Publication Date
JPS55129731A true JPS55129731A (en) 1980-10-07
JPS6252256B2 JPS6252256B2 (enrdf_load_stackoverflow) 1987-11-04

Family

ID=12494141

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3731179A Granted JPS55129731A (en) 1979-03-29 1979-03-29 Automatic detector for deficient tablet

Country Status (1)

Country Link
JP (1) JPS55129731A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57137857A (en) * 1981-02-20 1982-08-25 Satake Eng Co Ltd Cracked grain detecting device
JPS5863838A (ja) * 1981-10-14 1983-04-15 Fuji Electric Co Ltd 欠陥検出回路
JP2011117866A (ja) * 2009-12-04 2011-06-16 Isao Sato 外観検査装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57137857A (en) * 1981-02-20 1982-08-25 Satake Eng Co Ltd Cracked grain detecting device
JPS5863838A (ja) * 1981-10-14 1983-04-15 Fuji Electric Co Ltd 欠陥検出回路
JP2011117866A (ja) * 2009-12-04 2011-06-16 Isao Sato 外観検査装置

Also Published As

Publication number Publication date
JPS6252256B2 (enrdf_load_stackoverflow) 1987-11-04

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