JPS55129731A - Automatic detector for deficient tablet - Google Patents
Automatic detector for deficient tabletInfo
- Publication number
- JPS55129731A JPS55129731A JP3731179A JP3731179A JPS55129731A JP S55129731 A JPS55129731 A JP S55129731A JP 3731179 A JP3731179 A JP 3731179A JP 3731179 A JP3731179 A JP 3731179A JP S55129731 A JPS55129731 A JP S55129731A
- Authority
- JP
- Japan
- Prior art keywords
- tablet
- inspection
- fed
- inspection position
- linear array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9508—Capsules; Tablets
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To enable to detect deficient shape such as broken, cracked and deformed tablets with good precision, by using the CCD linear array which scans orthogonally toward the moving direction of tablets. CONSTITUTION:The tablet T fed to the first hold drum 2 from the production process via the supply guide 1 is held at negative pressure at the circumference of the drum 2, and surface inspection is made by using the illumination lamp 4 located on the first inspection position 3, lens 5, and CCD linear array 6. The tablet judged as good quality is fed to the reception position 9 and held at the second tablet hold drum 10 with negative pressure, and inspection of back side is made at the second inspection position 11. The similar allocation as the first inspection position such as CCD linear array 14d is made even in the second inspection position 11, and the video signal outputted from the linear arrays 6, 14 is fed to the control processing circuits 7, 15 for the discrimination of propriety.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3731179A JPS55129731A (en) | 1979-03-29 | 1979-03-29 | Automatic detector for deficient tablet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3731179A JPS55129731A (en) | 1979-03-29 | 1979-03-29 | Automatic detector for deficient tablet |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55129731A true JPS55129731A (en) | 1980-10-07 |
JPS6252256B2 JPS6252256B2 (en) | 1987-11-04 |
Family
ID=12494141
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3731179A Granted JPS55129731A (en) | 1979-03-29 | 1979-03-29 | Automatic detector for deficient tablet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55129731A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57137857A (en) * | 1981-02-20 | 1982-08-25 | Satake Eng Co Ltd | Cracked grain detecting device |
JPS5863838A (en) * | 1981-10-14 | 1983-04-15 | Fuji Electric Co Ltd | Detecting circuit for defect |
JP2011117866A (en) * | 2009-12-04 | 2011-06-16 | Isao Sato | Visual inspection apparatus |
-
1979
- 1979-03-29 JP JP3731179A patent/JPS55129731A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57137857A (en) * | 1981-02-20 | 1982-08-25 | Satake Eng Co Ltd | Cracked grain detecting device |
JPH0228814B2 (en) * | 1981-02-20 | 1990-06-26 | Satake Eng Co Ltd | |
JPS5863838A (en) * | 1981-10-14 | 1983-04-15 | Fuji Electric Co Ltd | Detecting circuit for defect |
JPS6355650B2 (en) * | 1981-10-14 | 1988-11-04 | Fuji Electric Co Ltd | |
JP2011117866A (en) * | 2009-12-04 | 2011-06-16 | Isao Sato | Visual inspection apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPS6252256B2 (en) | 1987-11-04 |
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