JPS55107908A - Automatic tester for surface of flat circular piece - Google Patents

Automatic tester for surface of flat circular piece

Info

Publication number
JPS55107908A
JPS55107908A JP1462579A JP1462579A JPS55107908A JP S55107908 A JPS55107908 A JP S55107908A JP 1462579 A JP1462579 A JP 1462579A JP 1462579 A JP1462579 A JP 1462579A JP S55107908 A JPS55107908 A JP S55107908A
Authority
JP
Japan
Prior art keywords
pieces
flat circular
piece
circular piece
obverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1462579A
Other languages
Japanese (ja)
Inventor
Tomohisa Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP1462579A priority Critical patent/JPS55107908A/en
Publication of JPS55107908A publication Critical patent/JPS55107908A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To provide an automatic tester for the surface of a flat circular piece, by optically scanning the flaw, discoloration, bend, etc. of both the obverse and reverse sides of the flat circular piece and automatically sorting defective pieces on the basis of prescribed standards.
CONSTITUTION: Flat circular pieces 22 thrown into a hopper 3a are moved in a row on a conveyor 20 to a position setting rotary mechanism 4 in which the pieces are rotated and scanned. Light irradiated upon the surface of the piece 22 is reflected and introduced into a photoelectric scanner 30 so that the intensity of the reflected light corresponding to the flaw, discoloration, bend, etc. of the surface of the flat circular piece 22 is changed into an electric signal. This signal is supplied to an identification controller and compared with a prescribed reference signal level. Defective pieces are discharged by a removing mechanism 6 and stacked in a box 17. Proper pieces are inverted at 23 by an obverse-reverse inversion mechanism 7. The reverse side of the piece is automatically examined by all the same operation as the obverse side. The pieces finally regarded as proper are stacked in another box 19.
COPYRIGHT: (C)1980,JPO&Japio
JP1462579A 1979-02-09 1979-02-09 Automatic tester for surface of flat circular piece Pending JPS55107908A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1462579A JPS55107908A (en) 1979-02-09 1979-02-09 Automatic tester for surface of flat circular piece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1462579A JPS55107908A (en) 1979-02-09 1979-02-09 Automatic tester for surface of flat circular piece

Publications (1)

Publication Number Publication Date
JPS55107908A true JPS55107908A (en) 1980-08-19

Family

ID=11866379

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1462579A Pending JPS55107908A (en) 1979-02-09 1979-02-09 Automatic tester for surface of flat circular piece

Country Status (1)

Country Link
JP (1) JPS55107908A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288721A (en) * 1993-04-01 1994-10-18 Masahide Matsuda Automatic inspection device
JPH08136463A (en) * 1994-11-10 1996-05-31 Taiyo Yuden Co Ltd Appearance inspection device
JPH08240538A (en) * 1995-03-01 1996-09-17 Mitsubishi Cable Ind Ltd O ring inspection device
CN102935430A (en) * 2011-08-15 2013-02-20 东莞市锐祥智能卡科技有限公司 Smart card automatic sorting equipment
JP2020190537A (en) * 2019-05-24 2020-11-26 株式会社寺岡精工 Inspection device and inspection system
JP2021081221A (en) * 2019-11-14 2021-05-27 ソフトバンク株式会社 Visual inspection device for article

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288721A (en) * 1993-04-01 1994-10-18 Masahide Matsuda Automatic inspection device
JPH08136463A (en) * 1994-11-10 1996-05-31 Taiyo Yuden Co Ltd Appearance inspection device
JPH08240538A (en) * 1995-03-01 1996-09-17 Mitsubishi Cable Ind Ltd O ring inspection device
CN102935430A (en) * 2011-08-15 2013-02-20 东莞市锐祥智能卡科技有限公司 Smart card automatic sorting equipment
JP2020190537A (en) * 2019-05-24 2020-11-26 株式会社寺岡精工 Inspection device and inspection system
JP2021081221A (en) * 2019-11-14 2021-05-27 ソフトバンク株式会社 Visual inspection device for article

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