JPS54162945A - Programable delay circuit - Google Patents
Programable delay circuitInfo
- Publication number
- JPS54162945A JPS54162945A JP7253378A JP7253378A JPS54162945A JP S54162945 A JPS54162945 A JP S54162945A JP 7253378 A JP7253378 A JP 7253378A JP 7253378 A JP7253378 A JP 7253378A JP S54162945 A JPS54162945 A JP S54162945A
- Authority
- JP
- Japan
- Prior art keywords
- delay time
- output
- line
- tap
- register
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/30—Time-delay networks
- H03H7/32—Time-delay networks with lumped inductance and capacitance
- H03H7/325—Adjustable networks
Abstract
PURPOSE:To secure the accurate the linear characteristics for the relation between the delay time control signal and the delay time by providing the multiplication gate to select the delay time and the delay line with the tap containing several units of output taps. CONSTITUTION:The impedance matching is given to the terminal of delay line 12, and clock input 1 advances line 12 with no reflection to be supplied to multiplication gate 14 from each tap 16. Then the gate input selected by the output of register 10 is delivered in the form of delayed clock output 2. For example, if the output of register 10 is 000, the pulse of delay time 0 is selected from the extreme left tap of line 12. And in the case of register output of 111, the pulse of the maximum delay time is selected from the extreme right tap. When the delay time between taps of line 12 is made identical to each other, an optional integer-fold delay time can be selected freely by delay time control signal 11. Thus, the accurate linear characteristics can be obtained for the relation between signal 11 and the delay time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7253378A JPS54162945A (en) | 1978-06-14 | 1978-06-14 | Programable delay circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7253378A JPS54162945A (en) | 1978-06-14 | 1978-06-14 | Programable delay circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54162945A true JPS54162945A (en) | 1979-12-25 |
Family
ID=13492071
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7253378A Pending JPS54162945A (en) | 1978-06-14 | 1978-06-14 | Programable delay circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54162945A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6168505U (en) * | 1984-10-09 | 1986-05-10 | ||
US4675562A (en) * | 1983-08-01 | 1987-06-23 | Fairchild Semiconductor Corporation | Method and apparatus for dynamically controlling the timing of signals in automatic test systems |
JPS63211809A (en) * | 1988-02-10 | 1988-09-02 | Elmec Corp | Electromagnetic variable delay line |
JPS648833U (en) * | 1987-02-20 | 1989-01-18 | ||
US4820944A (en) * | 1983-08-01 | 1989-04-11 | Schlumberger Systems & Services, Inc. | Method and apparatus for dynamically controlling the timing of signals in automatic test systems |
JPH01194602A (en) * | 1988-01-29 | 1989-08-04 | Yokogawa Medical Syst Ltd | Variable delay line circuit |
US5389843A (en) * | 1992-08-28 | 1995-02-14 | Tektronix, Inc. | Simplified structure for programmable delays |
-
1978
- 1978-06-14 JP JP7253378A patent/JPS54162945A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4675562A (en) * | 1983-08-01 | 1987-06-23 | Fairchild Semiconductor Corporation | Method and apparatus for dynamically controlling the timing of signals in automatic test systems |
US4820944A (en) * | 1983-08-01 | 1989-04-11 | Schlumberger Systems & Services, Inc. | Method and apparatus for dynamically controlling the timing of signals in automatic test systems |
JPS6168505U (en) * | 1984-10-09 | 1986-05-10 | ||
JPS648833U (en) * | 1987-02-20 | 1989-01-18 | ||
JPH01194602A (en) * | 1988-01-29 | 1989-08-04 | Yokogawa Medical Syst Ltd | Variable delay line circuit |
JPS63211809A (en) * | 1988-02-10 | 1988-09-02 | Elmec Corp | Electromagnetic variable delay line |
US5389843A (en) * | 1992-08-28 | 1995-02-14 | Tektronix, Inc. | Simplified structure for programmable delays |
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