JPS541624B2 - - Google Patents

Info

Publication number
JPS541624B2
JPS541624B2 JP11740975A JP11740975A JPS541624B2 JP S541624 B2 JPS541624 B2 JP S541624B2 JP 11740975 A JP11740975 A JP 11740975A JP 11740975 A JP11740975 A JP 11740975A JP S541624 B2 JPS541624 B2 JP S541624B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11740975A
Other versions
JPS5242075A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP50117409A priority Critical patent/JPS5242075A/ja
Priority to US05/727,772 priority patent/US4096822A/en
Publication of JPS5242075A publication Critical patent/JPS5242075A/ja
Publication of JPS541624B2 publication Critical patent/JPS541624B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/06Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
    • C30B31/16Feed and outlet means for the gases; Modifying the flow of the gases
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45578Elongated nozzles, tubes with holes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
JP50117409A 1975-09-29 1975-09-29 Device for controlling gas atmosphere in semiconductor producing equip ment Granted JPS5242075A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP50117409A JPS5242075A (en) 1975-09-29 1975-09-29 Device for controlling gas atmosphere in semiconductor producing equip ment
US05/727,772 US4096822A (en) 1975-09-29 1976-09-29 Gaseous atmosphere control apparatus for a semiconductor manufacturing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50117409A JPS5242075A (en) 1975-09-29 1975-09-29 Device for controlling gas atmosphere in semiconductor producing equip ment

Publications (2)

Publication Number Publication Date
JPS5242075A JPS5242075A (en) 1977-04-01
JPS541624B2 true JPS541624B2 (ja) 1979-01-26

Family

ID=14710922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50117409A Granted JPS5242075A (en) 1975-09-29 1975-09-29 Device for controlling gas atmosphere in semiconductor producing equip ment

Country Status (2)

Country Link
US (1) US4096822A (ja)
JP (1) JPS5242075A (ja)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4950982A (ja) * 1972-09-14 1974-05-17
JPS5942970B2 (ja) * 1979-03-29 1984-10-18 テルサ−ムコ株式会社 半導体熱処理用反応管
JPS5944771B2 (ja) * 1979-03-29 1984-11-01 テルサ−ムコ株式会社 半導体熱処理炉
FR2463819A1 (fr) * 1979-08-21 1981-02-27 Thomson Csf Reacteur de depot chimique en phase vapeur fonctionnant sous basse pression
US4263872A (en) * 1980-01-31 1981-04-28 Rca Corporation Radiation heated reactor for chemical vapor deposition on substrates
US4401689A (en) * 1980-01-31 1983-08-30 Rca Corporation Radiation heated reactor process for chemical vapor deposition on substrates
US4819579A (en) * 1981-01-14 1989-04-11 Northern Telecom Limited Coating of semiconductor wafers and apparatus therefor
EP0181624B1 (en) * 1981-01-14 1989-12-06 Nortel Networks Corporation Coating of semiconductor wafers and apparatus therefor
JPS5885523A (ja) * 1981-11-17 1983-05-21 Nec Home Electronics Ltd 半導体製造装置
US4696833A (en) * 1982-08-27 1987-09-29 Hewlett-Packard Company Method for applying a uniform coating to integrated circuit wafers by means of chemical deposition
AU549376B2 (en) * 1983-02-25 1986-01-23 Toyota Jidosha Kabushiki Kaisha Plasma treatment
JPH0817159B2 (ja) * 1985-08-15 1996-02-21 キヤノン株式会社 堆積膜の形成方法
FR2587731B1 (fr) * 1985-09-23 1988-01-08 Centre Nat Rech Scient Procede et dispositif de depot chimique de couches minces uniformes sur de nombreux substrats plans a partir d'une phase gazeuse
US4837048A (en) * 1985-10-24 1989-06-06 Canon Kabushiki Kaisha Method for forming a deposited film
JPH0645890B2 (ja) * 1985-12-18 1994-06-15 キヤノン株式会社 堆積膜形成法
JPS62142778A (ja) * 1985-12-18 1987-06-26 Canon Inc 堆積膜形成法
US5160543A (en) * 1985-12-20 1992-11-03 Canon Kabushiki Kaisha Device for forming a deposited film
JPH0746729B2 (ja) * 1985-12-26 1995-05-17 キヤノン株式会社 薄膜トランジスタの製造方法
US4834023A (en) * 1986-12-19 1989-05-30 Canon Kabushiki Kaisha Apparatus for forming deposited film
US5221556A (en) * 1987-06-24 1993-06-22 Epsilon Technology, Inc. Gas injectors for reaction chambers in CVD systems
JP2781814B2 (ja) * 1987-11-20 1998-07-30 東京エレクトロン株式会社 縦形気相成長装置
US5279670A (en) * 1990-03-31 1994-01-18 Tokyo Electron Sagami Limited Vertical type diffusion apparatus
JP2859164B2 (ja) * 1995-05-24 1999-02-17 九州日本電気株式会社 半導体装置の製造装置
JP3373990B2 (ja) * 1995-10-30 2003-02-04 東京エレクトロン株式会社 成膜装置及びその方法
JP3554297B2 (ja) * 2001-07-26 2004-08-18 株式会社エフティーエル 半導体基板熱処理装置及び半導体素子の製造方法
US6808741B1 (en) * 2001-10-26 2004-10-26 Seagate Technology Llc In-line, pass-by method for vapor lubrication
KR100829327B1 (ko) * 2002-04-05 2008-05-13 가부시키가이샤 히다치 고쿠사이 덴키 기판 처리 장치 및 반응 용기
US20030047536A1 (en) * 2002-10-02 2003-03-13 Johnson Wayne L. Method and apparatus for distributing gas within high density plasma process chamber to ensure uniform plasma
JP2005082880A (ja) * 2003-09-11 2005-03-31 Shoka Kagi Kofun Yugenkoshi 有機el発光装置の成膜設備
US20060185589A1 (en) * 2005-02-23 2006-08-24 Raanan Zehavi Silicon gas injector and method of making
JP4951501B2 (ja) * 2005-03-01 2012-06-13 株式会社日立国際電気 基板処理装置および半導体デバイスの製造方法
WO2007111348A1 (ja) * 2006-03-28 2007-10-04 Hitachi Kokusai Electric Inc. 基板処理装置
JP5568212B2 (ja) * 2007-09-19 2014-08-06 株式会社日立国際電気 基板処理装置、そのコーティング方法、基板処理方法及び半導体デバイスの製造方法
CN101813236B (zh) * 2009-12-01 2013-01-23 东莞宏威数码机械有限公司 气体输送装置及输送方法
JP5912230B2 (ja) * 2010-06-25 2016-04-27 光洋サーモシステム株式会社 連続拡散処理装置
JP5912229B2 (ja) * 2010-06-25 2016-04-27 光洋サーモシステム株式会社 連続拡散処理装置
JP5243519B2 (ja) * 2010-12-22 2013-07-24 東京エレクトロン株式会社 成膜装置
US9512519B2 (en) 2012-12-03 2016-12-06 Taiwan Semiconductor Manufacturing Company, Ltd. Atomic layer deposition apparatus and method
KR102215965B1 (ko) * 2014-04-11 2021-02-18 주성엔지니어링(주) 가스 분사 장치 및 이를 포함하는 기판 처리 장치
JP6320903B2 (ja) * 2014-11-19 2018-05-09 東京エレクトロン株式会社 ノズル及びこれを用いた基板処理装置
JP5953401B2 (ja) * 2015-05-20 2016-07-20 光洋サーモシステム株式会社 連続拡散処理装置
JP6010183B2 (ja) * 2015-05-20 2016-10-19 光洋サーモシステム株式会社 連続拡散処理装置
JP6010182B2 (ja) * 2015-05-20 2016-10-19 光洋サーモシステム株式会社 連続拡散処理装置
US20170207078A1 (en) * 2016-01-15 2017-07-20 Taiwan Semiconductor Manufacturing Co., Ltd. Atomic layer deposition apparatus and semiconductor process
KR20210043810A (ko) * 2019-10-14 2021-04-22 삼성전자주식회사 반도체 제조 장비
WO2021225934A1 (en) * 2020-05-06 2021-11-11 Applied Materials, Inc. Gas distribution assembly

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944674A (ja) * 1972-08-31 1974-04-26
JPS50118669A (ja) * 1974-03-01 1975-09-17

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1289833B (de) * 1964-12-29 1969-02-27 Siemens Ag Verfahren zum epitaktischen Abscheiden einer Halbleiterschicht
US3602192A (en) * 1969-05-19 1971-08-31 Ibm Semiconductor wafer processing
NL7003431A (ja) * 1970-03-11 1971-09-14
US3678893A (en) * 1970-05-01 1972-07-25 Stewart Warner Corp Improved device for supporting semiconductor wafers
FR2227640B1 (ja) * 1973-04-27 1977-12-30 Radiotechnique Compelec
US4018183A (en) * 1973-11-15 1977-04-19 U.S. Philips Corporation Apparatus for treating a plurality of semiconductor slices to a reacting gas current
US4018184A (en) * 1975-07-28 1977-04-19 Mitsubishi Denki Kabushiki Kaisha Apparatus for treatment of semiconductor wafer
JPS5245874A (en) * 1975-10-09 1977-04-11 Nippon Denso Co Ltd Transfer device of semiconductor substrate holding device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944674A (ja) * 1972-08-31 1974-04-26
JPS50118669A (ja) * 1974-03-01 1975-09-17

Also Published As

Publication number Publication date
JPS5242075A (en) 1977-04-01
US4096822A (en) 1978-06-27

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