JPH1165094A - 収納ケース、露光装置及びデバイス製造装置 - Google Patents
収納ケース、露光装置及びデバイス製造装置Info
- Publication number
- JPH1165094A JPH1165094A JP24027697A JP24027697A JPH1165094A JP H1165094 A JPH1165094 A JP H1165094A JP 24027697 A JP24027697 A JP 24027697A JP 24027697 A JP24027697 A JP 24027697A JP H1165094 A JPH1165094 A JP H1165094A
- Authority
- JP
- Japan
- Prior art keywords
- storage case
- original plate
- inert gas
- reticle
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24027697A JPH1165094A (ja) | 1997-08-22 | 1997-08-22 | 収納ケース、露光装置及びデバイス製造装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24027697A JPH1165094A (ja) | 1997-08-22 | 1997-08-22 | 収納ケース、露光装置及びデバイス製造装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1165094A true JPH1165094A (ja) | 1999-03-05 |
| JPH1165094A5 JPH1165094A5 (enExample) | 2006-06-15 |
Family
ID=17057091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24027697A Pending JPH1165094A (ja) | 1997-08-22 | 1997-08-22 | 収納ケース、露光装置及びデバイス製造装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1165094A (enExample) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002069379A1 (en) * | 2001-02-26 | 2002-09-06 | Nikon Corporation | X-ray reflective mask, method of protecting the reflective mask, x-ray exposure device, and method of manufacturing semiconductor device |
| JP2003203859A (ja) * | 2001-12-18 | 2003-07-18 | Jenoptik Laser Optik Systeme Gmbh | 少なくとも1つの光学要素を保管し搬送するための装置 |
| WO2003079419A1 (en) * | 2002-03-15 | 2003-09-25 | Nikon Corporation | Mask storage device, exposure device, and device manufacturing method |
| JP2005311360A (ja) * | 2004-04-21 | 2005-11-04 | Alcatel | 熱泳動効果によって保護される搬送ポッド |
| JP2005311361A (ja) * | 2004-04-21 | 2005-11-04 | Alcatel | 制御雰囲気下で基板を輸送するための装置 |
| JP2006165579A (ja) * | 2004-12-09 | 2006-06-22 | Asml Netherlands Bv | リソグラフィ装置およびデバイス製造方法 |
| JP2007500869A (ja) * | 2003-08-01 | 2007-01-18 | カール・ツァイス・エスエムティー・アーゲー | 少なくとも1つのシステム絞りを備えた光学結像装置 |
| JP2011221538A (ja) * | 2010-04-13 | 2011-11-04 | Nikon Corp | マスクケース、マスクユニット、露光装置、基板処理装置及びデバイス製造方法 |
| CN104008987A (zh) * | 2007-11-15 | 2014-08-27 | 株式会社尼康 | 掩模盒、搬送装置、曝光装置、掩模搬送方法及器件制造方法 |
| WO2022252290A1 (zh) * | 2021-06-01 | 2022-12-08 | 长鑫存储技术有限公司 | 光罩保护盒及光罩传送设备 |
| WO2023000470A1 (zh) * | 2021-07-19 | 2023-01-26 | 长鑫存储技术有限公司 | 光罩盒及半导体设备 |
| US12125726B2 (en) | 2021-07-19 | 2024-10-22 | Changxin Memory Technologies, Inc. | Mask pod and semiconductor device |
-
1997
- 1997-08-22 JP JP24027697A patent/JPH1165094A/ja active Pending
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002069379A1 (en) * | 2001-02-26 | 2002-09-06 | Nikon Corporation | X-ray reflective mask, method of protecting the reflective mask, x-ray exposure device, and method of manufacturing semiconductor device |
| JP2003203859A (ja) * | 2001-12-18 | 2003-07-18 | Jenoptik Laser Optik Systeme Gmbh | 少なくとも1つの光学要素を保管し搬送するための装置 |
| WO2003079419A1 (en) * | 2002-03-15 | 2003-09-25 | Nikon Corporation | Mask storage device, exposure device, and device manufacturing method |
| JP2007500869A (ja) * | 2003-08-01 | 2007-01-18 | カール・ツァイス・エスエムティー・アーゲー | 少なくとも1つのシステム絞りを備えた光学結像装置 |
| JP2005311360A (ja) * | 2004-04-21 | 2005-11-04 | Alcatel | 熱泳動効果によって保護される搬送ポッド |
| JP2005311361A (ja) * | 2004-04-21 | 2005-11-04 | Alcatel | 制御雰囲気下で基板を輸送するための装置 |
| JP2006165579A (ja) * | 2004-12-09 | 2006-06-22 | Asml Netherlands Bv | リソグラフィ装置およびデバイス製造方法 |
| CN104008987A (zh) * | 2007-11-15 | 2014-08-27 | 株式会社尼康 | 掩模盒、搬送装置、曝光装置、掩模搬送方法及器件制造方法 |
| JP2011221538A (ja) * | 2010-04-13 | 2011-11-04 | Nikon Corp | マスクケース、マスクユニット、露光装置、基板処理装置及びデバイス製造方法 |
| JP2015143873A (ja) * | 2010-04-13 | 2015-08-06 | 株式会社ニコン | マスクケース、露光装置、基板処理装置及びデバイス製造方法 |
| WO2022252290A1 (zh) * | 2021-06-01 | 2022-12-08 | 长鑫存储技术有限公司 | 光罩保护盒及光罩传送设备 |
| WO2023000470A1 (zh) * | 2021-07-19 | 2023-01-26 | 长鑫存储技术有限公司 | 光罩盒及半导体设备 |
| US12125726B2 (en) | 2021-07-19 | 2024-10-22 | Changxin Memory Technologies, Inc. | Mask pod and semiconductor device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20040819 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060428 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20060823 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20060905 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20061101 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20070213 |