JPH11220103A - 半導体記憶装置及びその製造方法 - Google Patents
半導体記憶装置及びその製造方法Info
- Publication number
- JPH11220103A JPH11220103A JP10019578A JP1957898A JPH11220103A JP H11220103 A JPH11220103 A JP H11220103A JP 10019578 A JP10019578 A JP 10019578A JP 1957898 A JP1957898 A JP 1957898A JP H11220103 A JPH11220103 A JP H11220103A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- substrate
- bonding
- capacitor
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10019578A JPH11220103A (ja) | 1998-01-30 | 1998-01-30 | 半導体記憶装置及びその製造方法 |
| US09/143,400 US6242298B1 (en) | 1997-08-29 | 1998-08-28 | Semiconductor memory device having epitaxial planar capacitor and method for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10019578A JPH11220103A (ja) | 1998-01-30 | 1998-01-30 | 半導体記憶装置及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11220103A true JPH11220103A (ja) | 1999-08-10 |
| JPH11220103A5 JPH11220103A5 (enExample) | 2005-07-28 |
Family
ID=12003170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10019578A Pending JPH11220103A (ja) | 1997-08-29 | 1998-01-30 | 半導体記憶装置及びその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH11220103A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006128643A (ja) * | 2004-09-30 | 2006-05-18 | Tdk Corp | 誘電体薄膜、薄膜誘電体素子及びその製造方法 |
| CN113451354A (zh) * | 2020-03-24 | 2021-09-28 | 铠侠股份有限公司 | 存储装置及存储装置的制造方法 |
| JP2022513855A (ja) * | 2018-12-18 | 2022-02-09 | 長江存儲科技有限責任公司 | 転写された相互接続層を有する3次元メモリデバイスおよびそれらを形成するための方法 |
| KR20220088472A (ko) * | 2020-06-26 | 2022-06-27 | 샌디스크 테크놀로지스 엘엘씨 | 접합된 메모리 디바이스 및 그 제조 방법 |
| US11903218B2 (en) | 2020-06-26 | 2024-02-13 | Sandisk Technologies Llc | Bonded memory devices and methods of making the same |
| US12362301B2 (en) | 2020-06-26 | 2025-07-15 | SanDisk Technologies, Inc. | Bonded memory devices and methods of making the same |
-
1998
- 1998-01-30 JP JP10019578A patent/JPH11220103A/ja active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006128643A (ja) * | 2004-09-30 | 2006-05-18 | Tdk Corp | 誘電体薄膜、薄膜誘電体素子及びその製造方法 |
| JP2022513855A (ja) * | 2018-12-18 | 2022-02-09 | 長江存儲科技有限責任公司 | 転写された相互接続層を有する3次元メモリデバイスおよびそれらを形成するための方法 |
| CN113451354A (zh) * | 2020-03-24 | 2021-09-28 | 铠侠股份有限公司 | 存储装置及存储装置的制造方法 |
| CN113451354B (zh) * | 2020-03-24 | 2024-03-19 | 铠侠股份有限公司 | 存储装置及存储装置的制造方法 |
| KR20220088472A (ko) * | 2020-06-26 | 2022-06-27 | 샌디스크 테크놀로지스 엘엘씨 | 접합된 메모리 디바이스 및 그 제조 방법 |
| US11903218B2 (en) | 2020-06-26 | 2024-02-13 | Sandisk Technologies Llc | Bonded memory devices and methods of making the same |
| US12362301B2 (en) | 2020-06-26 | 2025-07-15 | SanDisk Technologies, Inc. | Bonded memory devices and methods of making the same |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6242298B1 (en) | Semiconductor memory device having epitaxial planar capacitor and method for manufacturing the same | |
| US11532705B2 (en) | 3D cross-bar nonvolatile memory | |
| TW529130B (en) | Semiconductor integrated circuit device and process for manufacturing the same | |
| JP4439020B2 (ja) | 半導体記憶装置及びその製造方法 | |
| KR100417743B1 (ko) | 90 나노미터 이하의 두께를 갖는 강유전성 박막을 지닌강유전성 메모리와 그 제조 방법 | |
| US20040089920A1 (en) | Stacked memory cell and process of fabricating same | |
| JP2002353416A (ja) | 半導体記憶装置およびその製造方法 | |
| JP2003110095A (ja) | 集積回路およびその形成方法 | |
| JPH10303396A5 (enExample) | ||
| US7187079B2 (en) | Stacked memory cell having diffusion barriers | |
| CN100376015C (zh) | 制造半导体器件的方法 | |
| JPH08227980A (ja) | 半導体装置及びその製造方法 | |
| JP5140972B2 (ja) | 半導体装置の製造方法 | |
| JPH11220103A (ja) | 半導体記憶装置及びその製造方法 | |
| TW503580B (en) | Non-volatile memory element on a monocrystalline semiconductor substrate and process for fabricating same | |
| JP3212194B2 (ja) | 半導体装置の製造方法 | |
| JPH10242078A (ja) | 酸化物導電体を用いた多層構造電極 | |
| CN113228279A (zh) | 用于形成半导体结构的方法 | |
| JP2004128406A (ja) | 半導体装置およびその製造方法 | |
| US6342337B1 (en) | Ferroelectric memory cell fabrication method | |
| JP4080624B2 (ja) | 半導体装置およびその製造方法 | |
| JP2880039B2 (ja) | 半導体装置の製造方法 | |
| JP3311276B2 (ja) | 半導体記憶装置およびその製造方法 | |
| US20040065913A1 (en) | Memory device | |
| CN113228282A (zh) | 用于增大半导体器件中的多晶硅晶粒尺寸的阶梯式退火工艺 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041220 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041220 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20070607 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070612 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070810 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20070911 |