JPH068134A - 平面状物品の研磨装置 - Google Patents
平面状物品の研磨装置Info
- Publication number
- JPH068134A JPH068134A JP9844393A JP9844393A JPH068134A JP H068134 A JPH068134 A JP H068134A JP 9844393 A JP9844393 A JP 9844393A JP 9844393 A JP9844393 A JP 9844393A JP H068134 A JPH068134 A JP H068134A
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- wafer
- slurry
- pad
- polished
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
- B24B1/04—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes subjecting the grinding or polishing tools, the abrading or polishing medium or work to vibration, e.g. grinding with ultrasonic frequency
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Abstract
その交換回数を少なくすることの出来る研磨機を提供す
ること。 【構成】 本発明の平面状物品の研磨装置は、研磨用ス
ラリ15に覆われている回転可能な研磨パッド11の第
1位置に被研磨平面状物品(ウェーハ)12を搭載し、
ウェーハ12を回転させて、ウェーハ12を研磨する
際、研磨用スラリ15を超音波でもって前記ウェーハ1
2に隣接した第2位置で攪拌する攪拌器20を有し、研
磨パッド11面からグリット(廃棄されるべき使用済み
研磨剤)を取り除くことを特徴とする。
Description
って研磨する装置に関し、特に半導体ウェーハの上の堆
積層をスラリによって研磨して平面化する装置に関す
る。
例が米国特許第5055158号に開示されている。こ
の種の研磨機は、研磨用スラリの層によりカバーされた
水平なパッドを有する。ワークピース(一般的には半導
体ウェーハ)がこの回転中のパッドの上に搭載され研磨
される。このウェーハそのものも、通常パッドの回転速
度よりも遅い回転速度で回転している。こうすることに
より、ウェーハの表面を研磨して、均一平面を形成して
いる。この研磨用パッドの素材は、スラリを搭載でき、
研磨作業により生じたグリット(研磨済みで廃棄される
べき粒子等)を除去できる。このような材料は米国特許
第4927432号に開示されている。
々な処理を、例えば、マスキング、ドーピング、エッチ
ング等が行われるが、それらの処理の後のウェーハの表
面は平坦ではない。このような研磨作業においては、半
導体等の被研磨物質の表面に傷や他の欠陥が存在しない
ようにする必要がある。ところが長い使用期間の間、研
磨機の研磨用スラリは品質が劣化し、取り替える必要が
ある。品質の劣化したスラリでもって研磨すると、より
一層半導体の表面に傷がつき、不均一となる。従って、
本発明の目的は、研磨用スラリを寿命を伸ばして、でき
るだけその交換回数を少なくすることの出来る研磨機を
提供することである。
磨装置は、研磨用スラリ15に覆われている回転可能な
研磨パッド11の第1位置に被研磨平面状物品(ウェー
ハ)12を搭載し、ウェーハ12を回転させて、ウェー
ハ12を研磨する際、研磨用スラリ15を超音波でもっ
て前記ウェーハ12に隣接した第2位置で攪拌する攪拌
器20を有し、研磨パッド11面からグリット(廃棄さ
れるべき使用済み研磨剤)を取り除くことを特徴とす
る。
置板10の上に被研磨材であるウェーハ12と攪拌器2
0が搭載されている。攪拌器20が、付属していない一
般的なスラリ研磨機としては、米国アリゾーナ州フェニ
ックス、アトランタアベニュE3502にあるウェステ
ックシステムス社(Westech Systems Inc.)により製
造、販売されているモデル372号がある。
動モータ(図示せず)により回転されるよう搭載され
る。研磨パッド11は、研磨装置板10の上面に搭載さ
れて、研磨装置板10により回転している。これらの研
磨パッド11は、一般的に50から100ミルの厚さ
で、弾力性があり、自己接着能力を有する。このような
パッドは、米国デラウア州ニューアーク、ダイヤモンド
ステート工業団地、ベレビューロード451にあるロー
デル社(Rodel Inc.)から市販されている。ウェーハ1
2は、ホルダ13により保持され、このホルダ13は、
ウェーハ12を研磨パッド11に3〜10ポンド/イン
チ2の圧力でもって押し付けている。モータ14が、ホ
ルダ13とウェーハ12とを回転させている。実際はモ
ータ14は、ホルダ13を様々な位置に動かすのが可能
な装置に搭載され、ウェーハをピックアップし、洗浄
し、研磨したウェーハを次の作業地点に持ち出すことが
できるようにしている。
研磨パッド11を覆い、その厚さは1/2〜1インチの
範囲である。半導体ウェーハ上の堆積層を研磨するのに
使用される一般的な研磨用スラリ15は、水とKOHの
pH8.3〜8.7の溶液でもってシリカ粒子をコロイ
ダル状に懸濁したものである。このような研磨用スラリ
は米国イリノイ州シカゴのナルコケミカルカンパニ(Na
lco Chemical Company)から市販されている。研磨用ス
ラリ15は、研磨装置板10の上の周囲壁16内に配置
されている。必要ならば、研磨用スラリ15は、別個の
貯蔵器(図示せず)から連続的に最循環されてもよい。
5の中に埋没している。攪拌器20は、一般的にトラン
ジューサ21に接続され、このトランジューサ21は、
研磨機のフレームに固定されている。このトランジュー
サ21は、鉛ジルコネートチタネート(PZT)のよう
なピエゾ電子材料で、40KHzの超音波生成機22に
より駆動されている。超音波エネルギーがトランジュー
サ21に加えられると、音響パワーが攪拌器20の近傍
のスラリを介して、液体スラリ溶液に加えられている。
このエネルギーは、トランジューサ21の下の流体層を
介して、研磨パッド11に伝わり、この研磨パッド11
の上に堆積したグリット(廃棄されるべき使用済み研磨
剤)を放出し、研磨パッド11の界面をより均一にす
る。さらに液体層(攪拌器20と研磨パッド11の表面
との間)の厚さが、1/4の波長の整数倍の厚さに設定
されると、パッド表面の作業動作は最大に改良される。
40KHzの音響攪拌器では、これは約1/2インチの
厚さとなる。
リコンの層を平面化する場合には、研磨装置板10と研
磨パッド11は、約15rpmで回転し、ウェーハ12
は、約40rpmで回転している。この研磨用スラリ1
5は、約60℃に加熱される。このような平面化作業は
約5〜8分行われ、ウェーハ12の表面から1μmの層
が除去される。
との利点は、研磨パッド11に埋設されてしまうグリッ
ト、または使用済みスラリを除去し、長期間研磨作業を
均一に行うことができる点にある。
場所を示したスラリ研磨機の部分断面側面図である。
Claims (2)
- 【請求項1】 研磨用スラリ(15)に覆われている回
転可能な研磨パッド(11)の第1位置に被研磨平面状
物品(12 以下、ウェーハと称する)を搭載し、ウェ
ーハ(12)を回転させて、ウェーハ(12)を研磨す
る装置において、 研磨用スラリ(15)を超音波でもって前記ウェーハ
(12)に隣接した第2位置で攪拌する攪拌器(20)
を有し、 研磨パッド(11)面からグリット(廃棄されるべき使
用済み研磨剤)を取り除くことを特徴とする平面状物品
の研磨装置。 - 【請求項2】 前記攪拌器(20)は、超音波エネルギ
ーを前記トランジューサ(21)を介して、超音波生成
機(22)により供給されることを特徴とする請求項1
の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US862044 | 1992-04-02 | ||
US07/862,044 US5245796A (en) | 1992-04-02 | 1992-04-02 | Slurry polisher using ultrasonic agitation |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH068134A true JPH068134A (ja) | 1994-01-18 |
JP2981079B2 JP2981079B2 (ja) | 1999-11-22 |
Family
ID=25337489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9844393A Expired - Lifetime JP2981079B2 (ja) | 1992-04-02 | 1993-04-02 | 平面状物品の研磨装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US5245796A (ja) |
EP (1) | EP0566258B1 (ja) |
JP (1) | JP2981079B2 (ja) |
KR (1) | KR930022483A (ja) |
DE (1) | DE69303109T2 (ja) |
ES (1) | ES2088228T3 (ja) |
HK (1) | HK180296A (ja) |
TW (1) | TW197531B (ja) |
Families Citing this family (97)
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JPS63185556A (ja) * | 1987-01-28 | 1988-08-01 | Toshiba Corp | 研磨装置 |
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-
1992
- 1992-04-02 US US07/862,044 patent/US5245796A/en not_active Expired - Lifetime
- 1992-05-13 TW TW081103708A patent/TW197531B/zh not_active IP Right Cessation
-
1993
- 1993-03-25 ES ES93302281T patent/ES2088228T3/es not_active Expired - Lifetime
- 1993-03-25 DE DE69303109T patent/DE69303109T2/de not_active Expired - Fee Related
- 1993-03-25 EP EP93302281A patent/EP0566258B1/en not_active Expired - Lifetime
- 1993-03-30 KR KR1019930005069A patent/KR930022483A/ko not_active Application Discontinuation
- 1993-04-02 JP JP9844393A patent/JP2981079B2/ja not_active Expired - Lifetime
-
1996
- 1996-09-26 HK HK180296A patent/HK180296A/xx not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0621029A (ja) * | 1992-02-14 | 1994-01-28 | Lsi Logic Corp | 半導体ウェハの化学的−機械的研磨装置およびそれを用いた方法 |
Also Published As
Publication number | Publication date |
---|---|
DE69303109T2 (de) | 1996-10-10 |
DE69303109D1 (de) | 1996-07-18 |
ES2088228T3 (es) | 1996-08-01 |
KR930022483A (ko) | 1993-11-24 |
TW197531B (ja) | 1993-01-01 |
US5245796A (en) | 1993-09-21 |
HK180296A (en) | 1996-10-04 |
EP0566258B1 (en) | 1996-06-12 |
JP2981079B2 (ja) | 1999-11-22 |
EP0566258A1 (en) | 1993-10-20 |
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