JPH059942B2 - - Google Patents

Info

Publication number
JPH059942B2
JPH059942B2 JP58182757A JP18275783A JPH059942B2 JP H059942 B2 JPH059942 B2 JP H059942B2 JP 58182757 A JP58182757 A JP 58182757A JP 18275783 A JP18275783 A JP 18275783A JP H059942 B2 JPH059942 B2 JP H059942B2
Authority
JP
Japan
Prior art keywords
oxide film
thickness
film
field oxide
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58182757A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6074640A (ja
Inventor
Hiroshi Iwasaki
Minoru Taguchi
Hiroshi Nakayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58182757A priority Critical patent/JPS6074640A/ja
Publication of JPS6074640A publication Critical patent/JPS6074640A/ja
Publication of JPH059942B2 publication Critical patent/JPH059942B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76205Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO in a region being recessed from the surface, e.g. in a recess, groove, tub or trench region
    • H01L21/7621Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO in a region being recessed from the surface, e.g. in a recess, groove, tub or trench region the recessed region having a shape other than rectangular, e.g. rounded or oblique shape

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Local Oxidation Of Silicon (AREA)
  • Bipolar Transistors (AREA)
  • Element Separation (AREA)
JP58182757A 1983-09-30 1983-09-30 半導体装置の製造方法 Granted JPS6074640A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58182757A JPS6074640A (ja) 1983-09-30 1983-09-30 半導体装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58182757A JPS6074640A (ja) 1983-09-30 1983-09-30 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPS6074640A JPS6074640A (ja) 1985-04-26
JPH059942B2 true JPH059942B2 (OSRAM) 1993-02-08

Family

ID=16123898

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58182757A Granted JPS6074640A (ja) 1983-09-30 1983-09-30 半導体装置の製造方法

Country Status (1)

Country Link
JP (1) JPS6074640A (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6610581B1 (en) 1999-06-01 2003-08-26 Sanyo Electric Co., Ltd. Method of forming isolation film in semiconductor device
JP4657614B2 (ja) * 2004-03-09 2011-03-23 Okiセミコンダクタ株式会社 半導体装置及び半導体装置の製造方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6040702B2 (ja) * 1976-10-07 1985-09-12 日本電気株式会社 半導体集積回路装置の製造方法

Also Published As

Publication number Publication date
JPS6074640A (ja) 1985-04-26

Similar Documents

Publication Publication Date Title
EP0415537B1 (en) Method for manufacturing a wiring contact portion of a semiconductor device
JP2746225B2 (ja) 半導体装置及びその製造方法
JP2629644B2 (ja) 半導体装置の製造方法
JPH09283440A (ja) 選択エピタキシャル膜の形成方法
US4057824A (en) P+ Silicon integrated circuit interconnection lines
KR100288815B1 (ko) 반도체기판의제조방법
JPH04286154A (ja) 電界効果トランジスタ及びバイポーラトランジスタ構造の製造方法、集積回路製造方法、半導体デバイス製造方法、及び半導体構造の製造方法
JP2705344B2 (ja) 半導体装置及びその製造方法
JPH0666320B2 (ja) バイポーラトランジスタを製造する方法
JPH059942B2 (OSRAM)
JPS59189677A (ja) 半導体装置の製造方法
JPH0465528B2 (OSRAM)
JP3145694B2 (ja) 半導体装置
JP2940492B2 (ja) 半導体装置およびその製造方法
JP3303833B2 (ja) 半導体装置及びその製造方法
JP2518378B2 (ja) 半導体装置の製造方法
JPS639964A (ja) 半導体記憶素子製造法
JPS6140057A (ja) 半導体装置及びその製造方法
JP3297091B2 (ja) 半導体装置
JP4213298B2 (ja) 半導体装置の製造方法
Bashir et al. Doping of polycrystalline silicon films using an arsenic spin‐on‐glass source and surface smoothness
JPS60137072A (ja) 接合型電界効果トランジスタの製造方法
JPS6059730A (ja) 半導体装置の製造方法
JPH10256267A (ja) 半導体集積回路装置
JPH02246374A (ja) 半導体記憶装置およびその製造方法