JPH0570101B2 - - Google Patents
Info
- Publication number
- JPH0570101B2 JPH0570101B2 JP59012694A JP1269484A JPH0570101B2 JP H0570101 B2 JPH0570101 B2 JP H0570101B2 JP 59012694 A JP59012694 A JP 59012694A JP 1269484 A JP1269484 A JP 1269484A JP H0570101 B2 JPH0570101 B2 JP H0570101B2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- optical system
- television camera
- image
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Closed-Circuit Television Systems (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59012694A JPS60157037A (ja) | 1984-01-26 | 1984-01-26 | 物体の表面検査装置 |
US06/687,478 US4984886A (en) | 1984-01-26 | 1984-12-28 | Surface inspection apparatus for objects |
DE19853500332 DE3500332A1 (de) | 1984-01-26 | 1985-01-08 | Oberflaechenpruefapparat fuer einen gegenstand |
AU37507/85A AU581868B2 (en) | 1984-01-26 | 1985-01-08 | Surface inspection apparatus for objects |
FR8500682A FR2558959B1 (fr) | 1984-01-26 | 1985-01-18 | Appareil de controle de surfaces d'objets |
GB08501904A GB2153552B (en) | 1984-01-26 | 1985-01-25 | Object inspection apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59012694A JPS60157037A (ja) | 1984-01-26 | 1984-01-26 | 物体の表面検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60157037A JPS60157037A (ja) | 1985-08-17 |
JPH0570101B2 true JPH0570101B2 (en, 2012) | 1993-10-04 |
Family
ID=11812482
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59012694A Granted JPS60157037A (ja) | 1984-01-26 | 1984-01-26 | 物体の表面検査装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US4984886A (en, 2012) |
JP (1) | JPS60157037A (en, 2012) |
AU (1) | AU581868B2 (en, 2012) |
DE (1) | DE3500332A1 (en, 2012) |
FR (1) | FR2558959B1 (en, 2012) |
GB (1) | GB2153552B (en, 2012) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5247153A (en) * | 1989-10-05 | 1993-09-21 | Lsi Logic Corporation | Method and apparatus for in-situ deformation of a surface, especially a non-planar optical surface |
US5727236A (en) * | 1994-06-30 | 1998-03-10 | Frazier; James A. | Wide angle, deep field, close focusing optical system |
AT405986B (de) * | 1997-07-18 | 2000-01-25 | Rehm Dieter Mag | Tiefenschärfelinsensystem |
CA2270451A1 (en) | 1998-06-17 | 1999-12-17 | Wolfgang Weigel | Supplementary optical system for a camera |
DE102005014415B3 (de) * | 2005-03-24 | 2007-03-22 | Isra Vision Systems Ag | Vorrichtung und Verfahren zur Untersuchung einer gewölbten Oberfläche |
SG165408A1 (en) * | 2005-09-21 | 2010-10-28 | Novartis Ag | Optical inspection system |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB593514A (en) * | 1944-10-17 | 1947-10-20 | John Henry Jeffree | Improvements in or relating to lens systems for wide-aperture anastigmatic objectives |
GB316698A (en) * | 1928-05-11 | 1929-08-08 | Benjamin Ellan Luboshez | Improvements in x-ray photographic apparatus |
GB335696A (en) * | 1929-03-05 | 1930-10-02 | Howard Dwight Beach | Improvements in or relating to method of and apparatus for producing photographic images |
GB358665A (en, 2012) * | 1929-09-06 | 1931-10-15 | Carl Zeiss | |
GB364617A (en) * | 1930-08-23 | 1931-12-23 | Gramophone Co Ltd | Improvements in or relating to photographic cameras and picture projecting and viewing apparatus |
GB561597A (en) * | 1942-12-08 | 1944-05-25 | Gunther Loeck | Improvements in or relating to optical systems |
GB608892A (en) * | 1945-03-07 | 1948-09-22 | Stephen Evdokimovich Garutso | Improvements in or relating to optical lens assemblies |
GB791312A (en) * | 1953-03-26 | 1958-02-26 | Theodore Hendrik Nakken | Photographic objectives |
GB1266916A (en, 2012) * | 1968-04-25 | 1972-03-15 | ||
US3677621A (en) * | 1969-11-24 | 1972-07-18 | Vickers Ltd | Optical field flattening devices |
US3770969A (en) * | 1972-03-09 | 1973-11-06 | Owens Illinois Inc | Inspecting the bottom wall of hollow open-ended containers |
GB1333185A (en) * | 1972-05-26 | 1973-10-10 | Rank Organisation Ltd | Optical objective |
GB1455171A (en) * | 1973-01-16 | 1976-11-10 | Olympus Optical Co | Microscope systems and objectives therefor |
AU457116B2 (en) * | 1973-03-09 | 1975-01-16 | Barry-Heimiller Company | Container flaw inspection apparatus |
DE2443515A1 (de) * | 1973-09-17 | 1975-09-11 | Hitachi Ltd | Elektronenstrahlroehren-bildprojektor |
US3902792A (en) * | 1974-01-02 | 1975-09-02 | Polaroid Corp | Landscape lens |
US3932042A (en) * | 1974-05-20 | 1976-01-13 | Barry-Wehmiller Company | Container inspection apparatus and method of inspection |
GB1520837A (en) * | 1976-06-01 | 1978-08-09 | Rank Organisation Ltd | Optical objectives |
US4191462A (en) * | 1978-04-24 | 1980-03-04 | Polaroid Corporation | Fixed focus exposure control apparatus with reverse spherical aberration corrective characteristic |
JPS555603U (en, 2012) * | 1978-06-24 | 1980-01-14 | ||
JPS55132937A (en) * | 1979-04-04 | 1980-10-16 | Sumitomo Electric Ind Ltd | Defect detector |
GB2049217B (en) * | 1979-05-16 | 1983-03-16 | Pilkington Perkin Elmer Ltd | Transfer lenses |
JPS56117154A (en) * | 1980-02-21 | 1981-09-14 | Hajime Sangyo Kk | Inspecting apparatus of flaw |
DE3021072A1 (de) * | 1980-06-04 | 1981-12-10 | Fuji Electric Co., Ltd., Kawasaki, Kanagawa | Verfahren und vorrichtung zur automatischen pruefung von produkten |
SE423755B (sv) * | 1980-07-30 | 1982-05-24 | Optik Innovation Ab Oiab | Projektionsoptik |
DE3109270A1 (de) * | 1981-03-11 | 1982-09-30 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur flascheninspektion |
DE3111194C2 (de) * | 1981-03-21 | 1984-01-05 | Fa. Hermann Heye, 3063 Obernkirchen | Verfahren und Vorrichtung zur Feststellung von Fehlern von Glasgegenständen |
JPS5887522A (ja) * | 1981-11-20 | 1983-05-25 | Hitachi Ltd | ビデオカメラ光学系 |
-
1984
- 1984-01-26 JP JP59012694A patent/JPS60157037A/ja active Granted
- 1984-12-28 US US06/687,478 patent/US4984886A/en not_active Expired - Fee Related
-
1985
- 1985-01-08 AU AU37507/85A patent/AU581868B2/en not_active Ceased
- 1985-01-08 DE DE19853500332 patent/DE3500332A1/de active Granted
- 1985-01-18 FR FR8500682A patent/FR2558959B1/fr not_active Expired
- 1985-01-25 GB GB08501904A patent/GB2153552B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2558959A1 (fr) | 1985-08-02 |
GB2153552B (en) | 1987-08-26 |
US4984886A (en) | 1991-01-15 |
JPS60157037A (ja) | 1985-08-17 |
AU3750785A (en) | 1985-08-01 |
DE3500332C2 (en, 2012) | 1993-02-04 |
AU581868B2 (en) | 1989-03-09 |
DE3500332A1 (de) | 1985-08-01 |
FR2558959B1 (fr) | 1988-05-27 |
GB8501904D0 (en) | 1985-02-27 |
GB2153552A (en) | 1985-08-21 |
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