JPH0562997B2 - - Google Patents
Info
- Publication number
- JPH0562997B2 JPH0562997B2 JP26646485A JP26646485A JPH0562997B2 JP H0562997 B2 JPH0562997 B2 JP H0562997B2 JP 26646485 A JP26646485 A JP 26646485A JP 26646485 A JP26646485 A JP 26646485A JP H0562997 B2 JPH0562997 B2 JP H0562997B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- circuit
- microprocessor
- test
- bus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26646485A JPS62125399A (ja) | 1985-11-26 | 1985-11-26 | 音声処理装置のデータ変換部チェック装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26646485A JPS62125399A (ja) | 1985-11-26 | 1985-11-26 | 音声処理装置のデータ変換部チェック装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62125399A JPS62125399A (ja) | 1987-06-06 |
JPH0562997B2 true JPH0562997B2 (enrdf_load_stackoverflow) | 1993-09-09 |
Family
ID=17431292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26646485A Granted JPS62125399A (ja) | 1985-11-26 | 1985-11-26 | 音声処理装置のデータ変換部チェック装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62125399A (enrdf_load_stackoverflow) |
-
1985
- 1985-11-26 JP JP26646485A patent/JPS62125399A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS62125399A (ja) | 1987-06-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6134639A (ja) | 電子回路試験装置 | |
US4926425A (en) | System for testing digital circuits | |
US4183459A (en) | Tester for microprocessor-based systems | |
JPS648560A (en) | Apparatus for testing and/or monitoring digital video-tape recorder | |
JPH0562997B2 (enrdf_load_stackoverflow) | ||
EP1291662B1 (en) | Debugging system for semiconductor integrated circuit | |
US6738940B1 (en) | Integrated circuit including a test signal generator | |
EP0032895A1 (en) | Testor for microprocessor-based systems | |
JPS6078362A (ja) | 自動試験装置の機能チエツク方式 | |
JPH11344542A (ja) | デバイス検査方法およびデバイス検査装置 | |
JPH10275835A (ja) | ウエハ検査装置 | |
JPH02201546A (ja) | 論理カード拡張機構 | |
JPH0330304B2 (enrdf_load_stackoverflow) | ||
JPS61170847A (ja) | 周辺装置自動試験装置 | |
JPS5877674A (ja) | 試験パタ−ン発生装置 | |
JPH0520115A (ja) | 情報処理装置の擬似障害試験方式 | |
JPH0530778U (ja) | 故障lsi検出システム | |
JPH03195979A (ja) | 電子回路の検査方法 | |
JPS63187444A (ja) | 磁気テ−プ装置の試験装置 | |
JPH0643244A (ja) | 宇宙線計測装置 | |
JPH03116943A (ja) | 検査機能を有する半導体集積回路 | |
JPH10300824A (ja) | 半導体集積回路のテスト装置 | |
JPH01207637A (ja) | 信号周波数分析検査方法 | |
JPH095400A (ja) | 電子機器 | |
JPH0498555A (ja) | バス・インターフェース検査を行う電子機器 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |