JPH0330304B2 - - Google Patents

Info

Publication number
JPH0330304B2
JPH0330304B2 JP56184213A JP18421381A JPH0330304B2 JP H0330304 B2 JPH0330304 B2 JP H0330304B2 JP 56184213 A JP56184213 A JP 56184213A JP 18421381 A JP18421381 A JP 18421381A JP H0330304 B2 JPH0330304 B2 JP H0330304B2
Authority
JP
Japan
Prior art keywords
test
integrated circuit
circuit device
main body
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56184213A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5885544A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP56184213A priority Critical patent/JPS5885544A/ja
Publication of JPS5885544A publication Critical patent/JPS5885544A/ja
Publication of JPH0330304B2 publication Critical patent/JPH0330304B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP56184213A 1981-11-17 1981-11-17 集積回路装置 Granted JPS5885544A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56184213A JPS5885544A (ja) 1981-11-17 1981-11-17 集積回路装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56184213A JPS5885544A (ja) 1981-11-17 1981-11-17 集積回路装置

Publications (2)

Publication Number Publication Date
JPS5885544A JPS5885544A (ja) 1983-05-21
JPH0330304B2 true JPH0330304B2 (enrdf_load_stackoverflow) 1991-04-26

Family

ID=16149339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56184213A Granted JPS5885544A (ja) 1981-11-17 1981-11-17 集積回路装置

Country Status (1)

Country Link
JP (1) JPS5885544A (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5676854A (en) * 1979-11-28 1981-06-24 Nec Corp Integrated circuit device
JPS56140439A (en) * 1980-04-03 1981-11-02 Minatoerekutoronikusu Kk Pattern generator

Also Published As

Publication number Publication date
JPS5885544A (ja) 1983-05-21

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