JPH0519831B2 - - Google Patents
Info
- Publication number
- JPH0519831B2 JPH0519831B2 JP10992883A JP10992883A JPH0519831B2 JP H0519831 B2 JPH0519831 B2 JP H0519831B2 JP 10992883 A JP10992883 A JP 10992883A JP 10992883 A JP10992883 A JP 10992883A JP H0519831 B2 JPH0519831 B2 JP H0519831B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- region
- insulating film
- main electrode
- tft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000010408 film Substances 0.000 claims description 47
- 239000010409 thin film Substances 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 20
- 239000004065 semiconductor Substances 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 7
- 239000011810 insulating material Substances 0.000 claims description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 239000011521 glass Substances 0.000 description 6
- 238000000137 annealing Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 229910021332 silicide Inorganic materials 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000007737 ion beam deposition Methods 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78642—Vertical transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10992883A JPS601868A (ja) | 1983-06-17 | 1983-06-17 | 薄膜トランジスタ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10992883A JPS601868A (ja) | 1983-06-17 | 1983-06-17 | 薄膜トランジスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS601868A JPS601868A (ja) | 1985-01-08 |
JPH0519831B2 true JPH0519831B2 (ko) | 1993-03-17 |
Family
ID=14522661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10992883A Granted JPS601868A (ja) | 1983-06-17 | 1983-06-17 | 薄膜トランジスタ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS601868A (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6089958A (ja) * | 1983-10-24 | 1985-05-20 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JPH07120803B2 (ja) * | 1985-08-12 | 1995-12-20 | 日本電信電話株式会社 | 絶縁ゲ−ト型薄膜トランジスタ及びその製法 |
KR950001159B1 (ko) * | 1991-12-27 | 1995-02-11 | 삼성전자 주식회사 | 반도체 메모리장치의 박막트랜지스터 및 그 제조방법 |
KR102551998B1 (ko) | 2018-11-20 | 2023-07-06 | 엘지디스플레이 주식회사 | 수직 구조 트랜지스터 및 전자장치 |
-
1983
- 1983-06-17 JP JP10992883A patent/JPS601868A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS601868A (ja) | 1985-01-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100260063B1 (ko) | 절연 게이트 박막 트랜지스터 제조 방법 | |
JPH0519830B2 (ko) | ||
US4601097A (en) | Method of producing thin-film transistor array | |
US4958205A (en) | Thin film transistor array and method of manufacturing the same | |
US6858867B2 (en) | Channel-etch thin film transistor | |
KR100223158B1 (ko) | 액티브매트릭스기판 및 그 제조방법 | |
JPH02275672A (ja) | 薄膜トランジスター | |
JPH1126768A (ja) | 液晶表示装置用薄膜トランジスタ | |
JP3005918B2 (ja) | アクティブマトリクスパネル | |
JP2546982B2 (ja) | 薄膜トランジスタ | |
JPH0519831B2 (ko) | ||
KR100345361B1 (ko) | 박막트랜지스터및이것을구비한액정표시장치와tft어레이기판의제조방법 | |
JPS61191072A (ja) | 薄膜トランジスタとその製造方法 | |
JP2001044442A (ja) | 薄膜トランジスタパネル | |
JP3340782B2 (ja) | 薄膜半導体素子 | |
JPH0384963A (ja) | 薄膜トランジスタ | |
JPH04326769A (ja) | 薄膜トランジスタ及びその製造方法 | |
KR100205867B1 (ko) | 액티브매트릭스기판의 제조방법 및 그 방법에 의해제조되는액티브매트릭스기판 | |
JP2934717B2 (ja) | マトリクス回路駆動装置およびその製造方法 | |
JPH05183165A (ja) | 薄膜トランジスタ | |
JPH09129890A (ja) | 多結晶半導体tft、その製造方法、及びtft基板 | |
JPS60161672A (ja) | 薄膜トランジスタとその製造方法 | |
JP2000029068A (ja) | 液晶表示装置 | |
JPH06132536A (ja) | 薄膜トランジスタ | |
KR100193650B1 (ko) | 액정 표시 소자의 박막 트랜지스터 제조방법 |