JPH0514857B2 - - Google Patents
Info
- Publication number
- JPH0514857B2 JPH0514857B2 JP60140147A JP14014785A JPH0514857B2 JP H0514857 B2 JPH0514857 B2 JP H0514857B2 JP 60140147 A JP60140147 A JP 60140147A JP 14014785 A JP14014785 A JP 14014785A JP H0514857 B2 JPH0514857 B2 JP H0514857B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- foreign matter
- polarized
- inspected
- elliptical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14014785A JPS6211138A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14014785A JPS6211138A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6211138A JPS6211138A (ja) | 1987-01-20 |
JPH0514857B2 true JPH0514857B2 (enrdf_load_stackoverflow) | 1993-02-26 |
Family
ID=15261963
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14014785A Granted JPS6211138A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6211138A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5547969B2 (ja) * | 2010-01-04 | 2014-07-16 | 日置電機株式会社 | 測光装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5594145A (en) * | 1979-01-12 | 1980-07-17 | Hitachi Ltd | Method of and device for inspecting surface of article |
JPS5599049A (en) * | 1979-01-24 | 1980-07-28 | Toshiba Corp | Defect detector |
JPS57163852A (en) * | 1981-03-31 | 1982-10-08 | Matsushita Electric Works Ltd | Detector for sample surface defect |
-
1985
- 1985-06-28 JP JP14014785A patent/JPS6211138A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6211138A (ja) | 1987-01-20 |
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