JPH0476492B2 - - Google Patents
Info
- Publication number
- JPH0476492B2 JPH0476492B2 JP60036321A JP3632185A JPH0476492B2 JP H0476492 B2 JPH0476492 B2 JP H0476492B2 JP 60036321 A JP60036321 A JP 60036321A JP 3632185 A JP3632185 A JP 3632185A JP H0476492 B2 JPH0476492 B2 JP H0476492B2
- Authority
- JP
- Japan
- Prior art keywords
- processing chamber
- processing
- gas
- inert gas
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H10P50/00—
Landscapes
- Drying Of Semiconductors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60036321A JPS61196538A (ja) | 1985-02-27 | 1985-02-27 | 真空処理方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60036321A JPS61196538A (ja) | 1985-02-27 | 1985-02-27 | 真空処理方法及び装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61196538A JPS61196538A (ja) | 1986-08-30 |
| JPH0476492B2 true JPH0476492B2 (show.php) | 1992-12-03 |
Family
ID=12466569
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60036321A Granted JPS61196538A (ja) | 1985-02-27 | 1985-02-27 | 真空処理方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61196538A (show.php) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS648039U (show.php) * | 1987-06-29 | 1989-01-17 | ||
| JPH0246726A (ja) * | 1988-08-09 | 1990-02-16 | Nec Corp | 真空装置の真空度改善方法 |
| JPH0370130A (ja) * | 1989-08-09 | 1991-03-26 | Tokyo Electron Ltd | エッチング方法 |
| JP2634019B2 (ja) * | 1992-06-16 | 1997-07-23 | アプライド マテリアルズ インコーポレイテッド | 半導体デバイス処理における微粒子汚染の低減 |
| US5622595A (en) * | 1992-06-16 | 1997-04-22 | Applied Materials, Inc | Reducing particulate contamination during semiconductor device processing |
| US5902494A (en) * | 1996-02-09 | 1999-05-11 | Applied Materials, Inc. | Method and apparatus for reducing particle generation by limiting DC bias spike |
| US6465043B1 (en) * | 1996-02-09 | 2002-10-15 | Applied Materials, Inc. | Method and apparatus for reducing particle contamination in a substrate processing chamber |
| US6121163A (en) | 1996-02-09 | 2000-09-19 | Applied Materials, Inc. | Method and apparatus for improving the film quality of plasma enhanced CVD films at the interface |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4226897A (en) * | 1977-12-05 | 1980-10-07 | Plasma Physics Corporation | Method of forming semiconducting materials and barriers |
| JPS5524424A (en) * | 1978-08-09 | 1980-02-21 | Kokusai Electric Co Ltd | Forming device of pressure-reduced epitaxial layer |
| EP0032788B2 (en) * | 1980-01-16 | 1989-12-06 | National Research Development Corporation | Method for depositing coatings in a glow discharge |
| JPS6042831A (ja) * | 1983-08-19 | 1985-03-07 | Toshiba Corp | 半導体製造装置 |
| JPS60234324A (ja) * | 1984-05-07 | 1985-11-21 | Nec Corp | ドライエツチング装置 |
-
1985
- 1985-02-27 JP JP60036321A patent/JPS61196538A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61196538A (ja) | 1986-08-30 |
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