JPH0473888B2 - - Google Patents

Info

Publication number
JPH0473888B2
JPH0473888B2 JP62201999A JP20199987A JPH0473888B2 JP H0473888 B2 JPH0473888 B2 JP H0473888B2 JP 62201999 A JP62201999 A JP 62201999A JP 20199987 A JP20199987 A JP 20199987A JP H0473888 B2 JPH0473888 B2 JP H0473888B2
Authority
JP
Japan
Prior art keywords
node
circuit
test
fet
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62201999A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6390206A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS6390206A publication Critical patent/JPS6390206A/ja
Publication of JPH0473888B2 publication Critical patent/JPH0473888B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
JP62201999A 1986-09-30 1987-08-14 ラッチ回路 Granted JPS6390206A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US913434 1986-09-30
US06/913,434 US4768167A (en) 1986-09-30 1986-09-30 High speed CMOS latch with alternate data storage and test functions

Publications (2)

Publication Number Publication Date
JPS6390206A JPS6390206A (ja) 1988-04-21
JPH0473888B2 true JPH0473888B2 (enEXAMPLES) 1992-11-24

Family

ID=25433269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62201999A Granted JPS6390206A (ja) 1986-09-30 1987-08-14 ラッチ回路

Country Status (3)

Country Link
US (1) US4768167A (enEXAMPLES)
EP (1) EP0262556A3 (enEXAMPLES)
JP (1) JPS6390206A (enEXAMPLES)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2659095B2 (ja) * 1987-06-30 1997-09-30 富士通株式会社 ゲートアレイ及びメモリを有する半導体集積回路装置
US20020070782A1 (en) 1999-12-13 2002-06-13 Afghahi Morteza Cyrus High speed flip-flop
WO2001047112A2 (en) * 1999-12-13 2001-06-28 Broadcom Corporation High speed flip-flop
GB0121713D0 (en) * 2001-09-07 2001-10-31 Nokia Corp Accumulator based phase locked loop
US7746137B2 (en) * 2007-08-28 2010-06-29 Qualcomm Incorporated Sequential circuit element including a single clocked transistor
US7724058B2 (en) * 2007-10-31 2010-05-25 Qualcomm Incorporated Latch structure and self-adjusting pulse generator using the latch
US9564881B2 (en) 2015-05-22 2017-02-07 Qualcomm Incorporated Area-efficient metal-programmable pulse latch design
US9979394B2 (en) 2016-02-16 2018-05-22 Qualcomm Incorporated Pulse-generator
US11218137B2 (en) * 2020-04-14 2022-01-04 Globalfoundries U.S. Inc. Low clock load dynamic dual output latch circuit

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3714638A (en) * 1972-03-24 1973-01-30 Rca Corp Circuit for improving operation of semiconductor memory
US3995215A (en) * 1974-06-26 1976-11-30 International Business Machines Corporation Test technique for semiconductor memory array
US3993919A (en) * 1975-06-27 1976-11-23 Ibm Corporation Programmable latch and other circuits for logic arrays
JPS5354952A (en) * 1976-10-28 1978-05-18 Mitsubishi Electric Corp Nonvolatile flip-flop circuit
JPS5926135B2 (ja) * 1977-02-18 1984-06-25 三菱電機株式会社 不揮発性フリツプフロツプ回路
US4149268A (en) * 1977-08-09 1979-04-10 Harris Corporation Dual function memory
DE2745302C2 (de) * 1977-10-07 1982-03-18 Eurosil GmbH, 8000 München Schaltungsanordnung zur Kontrolle der Versorgungsspannung für vorzugsweise integrierte Schaltkreise
US4150441A (en) * 1978-03-20 1979-04-17 Microtechnology Corporation Clocked static memory
JPS5522238A (en) * 1978-07-31 1980-02-16 Fujitsu Ltd Decoder circuit
US4356411A (en) * 1978-12-12 1982-10-26 Tokyo Shibaura Denki Kabushiki Kaisha Flip-flop circuit
US4250406A (en) * 1978-12-21 1981-02-10 Motorola, Inc. Single clock CMOS logic circuit with selected threshold voltages
JPS5622278A (en) * 1979-07-27 1981-03-02 Fujitsu Ltd Decoder selection system
US4253162A (en) * 1979-08-28 1981-02-24 Rca Corporation Blocked source node field-effect circuitry
US4418402A (en) * 1981-05-13 1983-11-29 Rca Corporation Radiation hardened accessible memory
JPS58199491A (ja) * 1982-05-13 1983-11-19 Sony Corp 不揮発性記憶装置
JPS59132492A (ja) * 1982-12-22 1984-07-30 Fujitsu Ltd 半導体記憶装置
JPS59210586A (ja) * 1983-05-13 1984-11-29 Hitachi Micro Comput Eng Ltd 半導体記憶装置
US4684826A (en) * 1984-07-20 1987-08-04 Monolithic Memories, Inc. Programmable asynchronous register initialization circuit
US4669061A (en) * 1984-12-21 1987-05-26 Digital Equipment Corporation Scannable flip-flop
US4685086A (en) * 1985-11-14 1987-08-04 Thomson Components-Mostek Corp. Memory cell leakage detection circuit

Also Published As

Publication number Publication date
EP0262556A2 (en) 1988-04-06
EP0262556A3 (en) 1989-05-24
JPS6390206A (ja) 1988-04-21
US4768167A (en) 1988-08-30

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