JPH0464033B2 - - Google Patents

Info

Publication number
JPH0464033B2
JPH0464033B2 JP56180892A JP18089281A JPH0464033B2 JP H0464033 B2 JPH0464033 B2 JP H0464033B2 JP 56180892 A JP56180892 A JP 56180892A JP 18089281 A JP18089281 A JP 18089281A JP H0464033 B2 JPH0464033 B2 JP H0464033B2
Authority
JP
Japan
Prior art keywords
circuit
output
static
dynamic
test mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56180892A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5882528A (ja
Inventor
Kyotaka Ideto
Fumihisa Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP56180892A priority Critical patent/JPS5882528A/ja
Publication of JPS5882528A publication Critical patent/JPS5882528A/ja
Publication of JPH0464033B2 publication Critical patent/JPH0464033B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56180892A 1981-11-10 1981-11-10 半導体集積回路 Granted JPS5882528A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56180892A JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56180892A JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS5882528A JPS5882528A (ja) 1983-05-18
JPH0464033B2 true JPH0464033B2 (enrdf_load_stackoverflow) 1992-10-13

Family

ID=16091148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56180892A Granted JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS5882528A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0636319B2 (ja) * 1984-11-26 1994-05-11 株式会社日立製作所 半導体集積回路

Also Published As

Publication number Publication date
JPS5882528A (ja) 1983-05-18

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