JPS5882528A - 半導体集積回路 - Google Patents

半導体集積回路

Info

Publication number
JPS5882528A
JPS5882528A JP56180892A JP18089281A JPS5882528A JP S5882528 A JPS5882528 A JP S5882528A JP 56180892 A JP56180892 A JP 56180892A JP 18089281 A JP18089281 A JP 18089281A JP S5882528 A JPS5882528 A JP S5882528A
Authority
JP
Japan
Prior art keywords
circuit
output
dynamic
test
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56180892A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0464033B2 (enrdf_load_stackoverflow
Inventor
Kiyotaka Ideto
出戸　清隆
Fumihisa Nakamura
中村　文久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp, Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electronics Corp
Priority to JP56180892A priority Critical patent/JPS5882528A/ja
Publication of JPS5882528A publication Critical patent/JPS5882528A/ja
Publication of JPH0464033B2 publication Critical patent/JPH0464033B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP56180892A 1981-11-10 1981-11-10 半導体集積回路 Granted JPS5882528A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56180892A JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56180892A JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS5882528A true JPS5882528A (ja) 1983-05-18
JPH0464033B2 JPH0464033B2 (enrdf_load_stackoverflow) 1992-10-13

Family

ID=16091148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56180892A Granted JPS5882528A (ja) 1981-11-10 1981-11-10 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS5882528A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61126685A (ja) * 1984-11-26 1986-06-14 Hitachi Ltd 半導体集積回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61126685A (ja) * 1984-11-26 1986-06-14 Hitachi Ltd 半導体集積回路

Also Published As

Publication number Publication date
JPH0464033B2 (enrdf_load_stackoverflow) 1992-10-13

Similar Documents

Publication Publication Date Title
JP2513904B2 (ja) テスト容易化回路
JP2579327B2 (ja) 半導体集積回路
JPH0614099B2 (ja) 能動負荷回路網
JPS5882528A (ja) 半導体集積回路
JP2906073B2 (ja) Ｄｃテスト用回路を含むｌｓｉ
US4263545A (en) Method of testing pulse delay time
JP3235132B2 (ja) 半導体集積回路
JP3207639B2 (ja) 半導体集積回路
JPH0716153B2 (ja) 半導体集積回路
JPS60170946A (ja) 半導体集積回路
JP3132635B2 (ja) 半導体集積回路の試験方法
JPH0252461A (ja) 半導体装置
JPH11136117A (ja) 出力回路及びその制御方法
JPH06109815A (ja) 半導体集積回路
JP2589352B2 (ja) 諭理回路のテスト方法
JPH05172896A (ja) 半導体集積回路
JPH0468555A (ja) トリミング回路
JPH04172273A (ja) 半導体集積回路
JPS63135883A (ja) 集積回路の試験回路
JPS60245141A (ja) 半導体集積回路装置
JPH03115873A (ja) 半導体集積回路
JPS606520B2 (ja) 液晶表示装置駆動回路を有した集積回路装置
JPH0727012B2 (ja) 半導体集積回路
JPH03143018A (ja) 半導体集積回路装置
JPH07105471B2 (ja) 半導体集積回路装置のテスト方法