JPH0450536B2 - - Google Patents

Info

Publication number
JPH0450536B2
JPH0450536B2 JP58014326A JP1432683A JPH0450536B2 JP H0450536 B2 JPH0450536 B2 JP H0450536B2 JP 58014326 A JP58014326 A JP 58014326A JP 1432683 A JP1432683 A JP 1432683A JP H0450536 B2 JPH0450536 B2 JP H0450536B2
Authority
JP
Japan
Prior art keywords
program
measurement
test
integrated circuit
test pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58014326A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59141077A (ja
Inventor
Nobuo Arai
Masao Kishibe
Kazuhiko Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP58014326A priority Critical patent/JPS59141077A/ja
Publication of JPS59141077A publication Critical patent/JPS59141077A/ja
Publication of JPH0450536B2 publication Critical patent/JPH0450536B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58014326A 1983-01-31 1983-01-31 集積回路測定装置 Granted JPS59141077A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58014326A JPS59141077A (ja) 1983-01-31 1983-01-31 集積回路測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58014326A JPS59141077A (ja) 1983-01-31 1983-01-31 集積回路測定装置

Publications (2)

Publication Number Publication Date
JPS59141077A JPS59141077A (ja) 1984-08-13
JPH0450536B2 true JPH0450536B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-08-14

Family

ID=11857944

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58014326A Granted JPS59141077A (ja) 1983-01-31 1983-01-31 集積回路測定装置

Country Status (1)

Country Link
JP (1) JPS59141077A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011125530A1 (ja) * 2010-03-31 2011-10-13 ユニ・チャーム株式会社 吸収性物品

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06105281B2 (ja) * 1985-12-20 1994-12-21 日本電気株式会社 ダイナミツクエ−ジング装置
JPS62247275A (ja) * 1986-03-31 1987-10-28 Ando Electric Co Ltd インサ−キツトエミユレ−タのｃｐｕ識別回路
JPS6326580A (ja) * 1986-07-18 1988-02-04 Nec Ic Microcomput Syst Ltd Ｌｓｉ試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011125530A1 (ja) * 2010-03-31 2011-10-13 ユニ・チャーム株式会社 吸収性物品

Also Published As

Publication number Publication date
JPS59141077A (ja) 1984-08-13

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