JPH0440864B2 - - Google Patents

Info

Publication number
JPH0440864B2
JPH0440864B2 JP1182146A JP18214689A JPH0440864B2 JP H0440864 B2 JPH0440864 B2 JP H0440864B2 JP 1182146 A JP1182146 A JP 1182146A JP 18214689 A JP18214689 A JP 18214689A JP H0440864 B2 JPH0440864 B2 JP H0440864B2
Authority
JP
Japan
Prior art keywords
substrate
circuit
semiconductor
potential
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1182146A
Other languages
English (en)
Japanese (ja)
Other versions
JPH02110389A (ja
Inventor
Norihisa Tsuge
Tomio Nakano
Masao Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1182146A priority Critical patent/JPH02110389A/ja
Publication of JPH02110389A publication Critical patent/JPH02110389A/ja
Publication of JPH0440864B2 publication Critical patent/JPH0440864B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1182146A 1989-07-14 1989-07-14 半導体装置の試験方法 Granted JPH02110389A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1182146A JPH02110389A (ja) 1989-07-14 1989-07-14 半導体装置の試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1182146A JPH02110389A (ja) 1989-07-14 1989-07-14 半導体装置の試験方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP56071045A Division JPS57186351A (en) 1981-05-12 1981-05-12 Semiconductor device

Publications (2)

Publication Number Publication Date
JPH02110389A JPH02110389A (ja) 1990-04-23
JPH0440864B2 true JPH0440864B2 (enrdf_load_stackoverflow) 1992-07-06

Family

ID=16113165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1182146A Granted JPH02110389A (ja) 1989-07-14 1989-07-14 半導体装置の試験方法

Country Status (1)

Country Link
JP (1) JPH02110389A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH02110389A (ja) 1990-04-23

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