JPH0440669B2 - - Google Patents

Info

Publication number
JPH0440669B2
JPH0440669B2 JP58250329A JP25032983A JPH0440669B2 JP H0440669 B2 JPH0440669 B2 JP H0440669B2 JP 58250329 A JP58250329 A JP 58250329A JP 25032983 A JP25032983 A JP 25032983A JP H0440669 B2 JPH0440669 B2 JP H0440669B2
Authority
JP
Japan
Prior art keywords
probe
inspection
section
connector
metal tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58250329A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60140160A (ja
Inventor
Shinichi Ozawa
Masayuki Mizutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Wiring Systems Ltd
Original Assignee
Sumitomo Wiring Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Wiring Systems Ltd filed Critical Sumitomo Wiring Systems Ltd
Priority to JP58250329A priority Critical patent/JPS60140160A/ja
Priority to US06/685,917 priority patent/US4658212A/en
Publication of JPS60140160A publication Critical patent/JPS60140160A/ja
Publication of JPH0440669B2 publication Critical patent/JPH0440669B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP58250329A 1983-12-27 1983-12-27 コネクタの端子検査器 Granted JPS60140160A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58250329A JPS60140160A (ja) 1983-12-27 1983-12-27 コネクタの端子検査器
US06/685,917 US4658212A (en) 1983-12-27 1984-12-26 Connector terminal examination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58250329A JPS60140160A (ja) 1983-12-27 1983-12-27 コネクタの端子検査器

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP5101186A Division JPH0727000B2 (ja) 1993-04-27 1993-04-27 コネクタの端子検査器

Publications (2)

Publication Number Publication Date
JPS60140160A JPS60140160A (ja) 1985-07-25
JPH0440669B2 true JPH0440669B2 (en:Method) 1992-07-03

Family

ID=17206287

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58250329A Granted JPS60140160A (ja) 1983-12-27 1983-12-27 コネクタの端子検査器

Country Status (2)

Country Link
US (1) US4658212A (en:Method)
JP (1) JPS60140160A (en:Method)

Families Citing this family (54)

* Cited by examiner, † Cited by third party
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US4801876A (en) * 1986-04-18 1989-01-31 Sagami Tsushin Kogyo Kabushiki Kaisha Printed wiring board tester
US4709733A (en) * 1986-07-24 1987-12-01 Rca Corporation Electron tube pin-sensing and straightening device
EP0294696A3 (de) * 1987-06-10 1989-04-26 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Federkontaktstift
JPH0620314Y2 (ja) * 1987-08-10 1994-05-25 住友電装株式会社 端子挿入検査器
CA1310693C (en) * 1988-01-27 1992-11-24 Manfred Prokopp Electrical connecting apparatus for an electrical or electronic testing unit
US5065106A (en) * 1988-06-13 1991-11-12 Ta Instruments, Inc. Apparatus and method for analyzing dielectric properties using a single surface electrode and force monitoring and adjusting
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
US5004977A (en) * 1988-10-24 1991-04-02 Nhk Spring Co., Ltd. Contact probe
US5084673A (en) * 1989-06-15 1992-01-28 Nhk Spring Co., Ltd. Electric contact probe
US5003255A (en) * 1989-06-15 1991-03-26 Nhk Spring Co., Ltd. Electric contact probe
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
US5030906A (en) * 1990-01-18 1991-07-09 Seagate Technology, Inc. Electrical connecting apparatus
US5031074A (en) * 1990-06-11 1991-07-09 Gonen Ravid Circuit board guide and interfitting device to eliminate floating cables
WO1993006495A1 (en) * 1991-09-23 1993-04-01 David John Kentish Socket tester gauge
US5233290A (en) * 1991-11-05 1993-08-03 Everett Charles Technologies, Inc. Switch probe
JP2588018Y2 (ja) * 1991-11-19 1999-01-06 株式会社白山製作所 端子板コネクタ
JP2567016Y2 (ja) * 1991-11-19 1998-03-30 株式会社白山製作所 端子板コネクタ
US5225773A (en) * 1992-02-26 1993-07-06 Interconnect Devices, Inc. Switch probe
JP2871332B2 (ja) * 1992-09-03 1999-03-17 住友電装株式会社 コネクタ検査装置
JP3042816B2 (ja) * 1992-12-18 2000-05-22 矢崎総業株式会社 給電コネクタ
JP2575406Y2 (ja) * 1993-08-24 1998-06-25 住友電装株式会社 コネクタ検査装置
JP2586317Y2 (ja) * 1993-08-30 1998-12-02 矢崎総業株式会社 端子検査具
AU6885994A (en) * 1993-09-21 1995-04-06 Cooper Industries, Inc. Quick release electrical connector
US5410115A (en) * 1993-10-22 1995-04-25 Yazaki Corporation Rod-type switch
JPH07130441A (ja) * 1993-11-04 1995-05-19 Sumitomo Wiring Syst Ltd コネクタ検査装置
JP2797945B2 (ja) * 1993-12-07 1998-09-17 住友電装株式会社 コネクタ検査装置
JP3038109B2 (ja) * 1994-02-04 2000-05-08 矢崎総業株式会社 嵌合フード部を有するコネクタの端子検出具
JP3000122B2 (ja) * 1994-03-09 2000-01-17 矢崎総業株式会社 コネクタ挿入検査治具
US5614820A (en) * 1994-03-10 1997-03-25 Sumitomo Wiring Systems, Ltd. Connector examination device for determining a connection in a connector
JP3038113B2 (ja) * 1994-05-09 2000-05-08 矢崎総業株式会社 コネクタの端子検出具
JP2940401B2 (ja) * 1994-06-10 1999-08-25 住友電装株式会社 コネクタ検査装置
JP3204360B2 (ja) * 1995-02-17 2001-09-04 矢崎総業株式会社 防水コネクタの防水性検査方法及び防水性検査装置
JP3048116B2 (ja) * 1995-04-13 2000-06-05 矢崎総業株式会社 コネクタ端子検査器
US5823808A (en) * 1996-08-20 1998-10-20 Chrysler Corporation Cam lever operated connector
US5879176A (en) * 1997-02-10 1999-03-09 Applied Materials, Inc. Interlocked connector
US6081124A (en) * 1997-03-31 2000-06-27 Sumitomo Wiring Systems, Ltd. Testing unit for connector testing
US6062906A (en) * 1998-08-31 2000-05-16 Sumitomo Wiring Systems, Ltd. Electrical connector and retaining member therefor
EP1073164B1 (en) * 1999-07-28 2003-05-14 Sumitomo Wiring Systems, Ltd. A probe, a wire insertion detection jig, a wire mount control apparatus and a wire mount control method
US7004043B2 (en) * 2000-04-04 2006-02-28 Videolarm, Inc. Elevated support pole with automatic electrical connection and disconnection
US6523394B2 (en) * 2001-04-18 2003-02-25 The United States Of America As Represented By The Secretary Of The Navy Leak test fixture
DE10337090A1 (de) * 2003-08-12 2005-03-17 Siemens Ag Elektrische Prufspitze sowie Verfahren und Vorrichtung zum Durchführen von Entladungstests mit einer solchen Prüfspitze
US7059880B2 (en) * 2003-10-08 2006-06-13 R & R Home Networking Coupling device for coaxial cable and communication applications
US7912501B2 (en) 2007-01-05 2011-03-22 Apple Inc. Audio I/O headset plug and plug detection circuitry
JP4999079B2 (ja) * 2007-04-10 2012-08-15 サンユー工業株式会社 プローブ
US7789697B2 (en) * 2007-06-11 2010-09-07 Apple Inc. Plug detection mechanisms
US8099857B2 (en) * 2008-02-09 2012-01-24 Cirris Systems Corporation Apparatus for electrical pin installation and retention confirmation
US8403302B2 (en) * 2008-09-04 2013-03-26 Videolarm, Inc. Elevated support system
JP6114615B2 (ja) * 2013-04-05 2017-04-12 モレックス エルエルシー コネクタ嵌合装置、及び電子機器の検査方法
CN104374960A (zh) * 2014-11-27 2015-02-25 惠州住成电装有限公司 一种线束通电测试夹具
US9466909B1 (en) * 2015-10-08 2016-10-11 Htc Corporation Connector
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP6901914B2 (ja) * 2017-06-26 2021-07-14 日本発條株式会社 給電装置及び車両用シート
JP2022550414A (ja) * 2019-09-30 2022-12-01 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 電気測定システムに接触するモジュール型２端子におけるインピーダンス変化の減少
DE102021119095A1 (de) * 2021-07-23 2023-01-26 Innoperform GmbH Sicherheits-Kontaktiervorrichtung oder Set zum Erkennen von Kabeln von Solarzellen und zum Messen von Gleich- und Wechselspannungen und Strömen an weiteren spannungsführenden Kabeln

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1610563A (en) * 1926-04-19 1926-12-14 Robert L Mcilvaine Apparatus for ascertaining moisture
US2515004A (en) * 1947-12-12 1950-07-11 Kelley Koett Mfg Co Electrical testing device
DE821676C (de) * 1949-05-15 1951-11-19 Theo Benning Spannungspruefer
JPS565488Y2 (en:Method) * 1976-07-28 1981-02-05
JPS558221U (en:Method) * 1978-07-03 1980-01-19
US4232262A (en) * 1978-10-12 1980-11-04 Emo George C Connector contact terminal contamination probe
US4225819A (en) * 1978-10-12 1980-09-30 Bell Telephone Laboratories, Incorporated Circuit board contact contamination probe

Also Published As

Publication number Publication date
JPS60140160A (ja) 1985-07-25
US4658212A (en) 1987-04-14

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term