JPH0434736U - - Google Patents

Info

Publication number
JPH0434736U
JPH0434736U JP7638090U JP7638090U JPH0434736U JP H0434736 U JPH0434736 U JP H0434736U JP 7638090 U JP7638090 U JP 7638090U JP 7638090 U JP7638090 U JP 7638090U JP H0434736 U JPH0434736 U JP H0434736U
Authority
JP
Japan
Prior art keywords
impurity region
mos transistor
semiconductor device
vertical
vertical mos
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7638090U
Other languages
English (en)
Japanese (ja)
Other versions
JP2530722Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990076380U priority Critical patent/JP2530722Y2/ja
Publication of JPH0434736U publication Critical patent/JPH0434736U/ja
Application granted granted Critical
Publication of JP2530722Y2 publication Critical patent/JP2530722Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1990076380U 1990-07-18 1990-07-18 半導体装置 Expired - Lifetime JP2530722Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990076380U JP2530722Y2 (ja) 1990-07-18 1990-07-18 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990076380U JP2530722Y2 (ja) 1990-07-18 1990-07-18 半導体装置

Publications (2)

Publication Number Publication Date
JPH0434736U true JPH0434736U (OSRAM) 1992-03-23
JP2530722Y2 JP2530722Y2 (ja) 1997-03-26

Family

ID=31617798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990076380U Expired - Lifetime JP2530722Y2 (ja) 1990-07-18 1990-07-18 半導体装置

Country Status (1)

Country Link
JP (1) JP2530722Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107045995A (zh) * 2016-02-09 2017-08-15 富士电机株式会社 评价方法以及半导体装置的制造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4998982A (OSRAM) * 1972-12-29 1974-09-19
JPS59194444A (ja) * 1983-04-19 1984-11-05 Toshiba Corp モニタ−用半導体装置およびモニタ−方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4998982A (OSRAM) * 1972-12-29 1974-09-19
JPS59194444A (ja) * 1983-04-19 1984-11-05 Toshiba Corp モニタ−用半導体装置およびモニタ−方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107045995A (zh) * 2016-02-09 2017-08-15 富士电机株式会社 评价方法以及半导体装置的制造方法
US10553505B2 (en) 2016-02-09 2020-02-04 Fuji Electric Co., Ltd. Assessment method, and semiconductor device manufacturing method
CN107045995B (zh) * 2016-02-09 2023-02-17 富士电机株式会社 评价方法以及半导体装置的制造方法

Also Published As

Publication number Publication date
JP2530722Y2 (ja) 1997-03-26

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