JPH0244397B2 - - Google Patents
Info
- Publication number
- JPH0244397B2 JPH0244397B2 JP57167385A JP16738582A JPH0244397B2 JP H0244397 B2 JPH0244397 B2 JP H0244397B2 JP 57167385 A JP57167385 A JP 57167385A JP 16738582 A JP16738582 A JP 16738582A JP H0244397 B2 JPH0244397 B2 JP H0244397B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- feeding path
- hole
- chips
- rotor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000926 separation method Methods 0.000 claims description 4
- 230000002950 deficient Effects 0.000 description 12
- 239000003990 capacitor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Testing Relating To Insulation (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Branching, Merging, And Special Transfer Between Conveyors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57167385A JPS5956173A (ja) | 1982-09-25 | 1982-09-25 | チツプの極性等検測装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57167385A JPS5956173A (ja) | 1982-09-25 | 1982-09-25 | チツプの極性等検測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5956173A JPS5956173A (ja) | 1984-03-31 |
| JPH0244397B2 true JPH0244397B2 (cg-RX-API-DMAC10.html) | 1990-10-03 |
Family
ID=15848721
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57167385A Granted JPS5956173A (ja) | 1982-09-25 | 1982-09-25 | チツプの極性等検測装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5956173A (cg-RX-API-DMAC10.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2969391B2 (ja) * | 1991-05-24 | 1999-11-02 | 株式会社新川 | ボンド点極性設定装置 |
| US5853079A (en) * | 1994-11-24 | 1998-12-29 | Tdk Corporation | Chip feed apparatus and chip feed casing therefor |
| JP6815169B2 (ja) * | 2016-11-07 | 2021-01-20 | Juki株式会社 | 極性判別装置、実装装置、極性判別方法 |
-
1982
- 1982-09-25 JP JP57167385A patent/JPS5956173A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5956173A (ja) | 1984-03-31 |