JPH0229723Y2 - - Google Patents

Info

Publication number
JPH0229723Y2
JPH0229723Y2 JP1985190475U JP19047585U JPH0229723Y2 JP H0229723 Y2 JPH0229723 Y2 JP H0229723Y2 JP 1985190475 U JP1985190475 U JP 1985190475U JP 19047585 U JP19047585 U JP 19047585U JP H0229723 Y2 JPH0229723 Y2 JP H0229723Y2
Authority
JP
Japan
Prior art keywords
probe card
memory element
probe
card
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1985190475U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6298234U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985190475U priority Critical patent/JPH0229723Y2/ja
Publication of JPS6298234U publication Critical patent/JPS6298234U/ja
Application granted granted Critical
Publication of JPH0229723Y2 publication Critical patent/JPH0229723Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985190475U 1985-12-10 1985-12-10 Expired JPH0229723Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Publications (2)

Publication Number Publication Date
JPS6298234U JPS6298234U (enrdf_load_stackoverflow) 1987-06-23
JPH0229723Y2 true JPH0229723Y2 (enrdf_load_stackoverflow) 1990-08-09

Family

ID=31143729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985190475U Expired JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Country Status (1)

Country Link
JP (1) JPH0229723Y2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2715266B2 (ja) * 1995-02-20 1998-02-18 東京エレクトロン株式会社 プローブ装置
JP5351151B2 (ja) * 2008-05-28 2013-11-27 株式会社アドバンテスト 試験システム
JP5314684B2 (ja) * 2008-06-02 2013-10-16 株式会社アドバンテスト 試験用ウエハ、および、試験システム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593537U (ja) * 1982-06-30 1984-01-11 株式会社東京精密 半導体素子検査装置の測子カ−ド

Also Published As

Publication number Publication date
JPS6298234U (enrdf_load_stackoverflow) 1987-06-23

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