JPS6298234U - - Google Patents

Info

Publication number
JPS6298234U
JPS6298234U JP19047585U JP19047585U JPS6298234U JP S6298234 U JPS6298234 U JP S6298234U JP 19047585 U JP19047585 U JP 19047585U JP 19047585 U JP19047585 U JP 19047585U JP S6298234 U JPS6298234 U JP S6298234U
Authority
JP
Japan
Prior art keywords
probe card
memory element
card
wafer
advance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19047585U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0229723Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985190475U priority Critical patent/JPH0229723Y2/ja
Publication of JPS6298234U publication Critical patent/JPS6298234U/ja
Application granted granted Critical
Publication of JPH0229723Y2 publication Critical patent/JPH0229723Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985190475U 1985-12-10 1985-12-10 Expired JPH0229723Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Publications (2)

Publication Number Publication Date
JPS6298234U true JPS6298234U (enrdf_load_stackoverflow) 1987-06-23
JPH0229723Y2 JPH0229723Y2 (enrdf_load_stackoverflow) 1990-08-09

Family

ID=31143729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985190475U Expired JPH0229723Y2 (enrdf_load_stackoverflow) 1985-12-10 1985-12-10

Country Status (1)

Country Link
JP (1) JPH0229723Y2 (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07221143A (ja) * 1995-02-20 1995-08-18 Tokyo Electron Ltd プローブ装置
WO2009144791A1 (ja) * 2008-05-28 2009-12-03 株式会社アドバンテスト 試験システムおよび書込用ウエハ
WO2009147722A1 (ja) * 2008-06-02 2009-12-10 株式会社アドバンテスト 試験用ウエハ、試験システム、および、半導体ウエハ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593537U (ja) * 1982-06-30 1984-01-11 株式会社東京精密 半導体素子検査装置の測子カ−ド

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593537U (ja) * 1982-06-30 1984-01-11 株式会社東京精密 半導体素子検査装置の測子カ−ド

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07221143A (ja) * 1995-02-20 1995-08-18 Tokyo Electron Ltd プローブ装置
WO2009144791A1 (ja) * 2008-05-28 2009-12-03 株式会社アドバンテスト 試験システムおよび書込用ウエハ
JP5351151B2 (ja) * 2008-05-28 2013-11-27 株式会社アドバンテスト 試験システム
US8624620B2 (en) 2008-05-28 2014-01-07 Advantest Corporation Test system and write wafer
WO2009147722A1 (ja) * 2008-06-02 2009-12-10 株式会社アドバンテスト 試験用ウエハ、試験システム、および、半導体ウエハ
JP5314684B2 (ja) * 2008-06-02 2013-10-16 株式会社アドバンテスト 試験用ウエハ、および、試験システム

Also Published As

Publication number Publication date
JPH0229723Y2 (enrdf_load_stackoverflow) 1990-08-09

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