JPH0225448B2 - - Google Patents
Info
- Publication number
- JPH0225448B2 JPH0225448B2 JP57179739A JP17973982A JPH0225448B2 JP H0225448 B2 JPH0225448 B2 JP H0225448B2 JP 57179739 A JP57179739 A JP 57179739A JP 17973982 A JP17973982 A JP 17973982A JP H0225448 B2 JPH0225448 B2 JP H0225448B2
- Authority
- JP
- Japan
- Prior art keywords
- particle size
- light intensity
- intensity distribution
- scattered light
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 18
- 239000013307 optical fiber Substances 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 238000007493 shaping process Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57179739A JPS5970944A (ja) | 1982-10-15 | 1982-10-15 | 粒径測定装置 |
US06/541,023 US4595291A (en) | 1982-10-15 | 1983-10-12 | Particle diameter measuring device |
DE8383306227T DE3381178D1 (de) | 1982-10-15 | 1983-10-14 | Teilchendurchmesser-messvorrichtung. |
EP83306227A EP0106684B1 (de) | 1982-10-15 | 1983-10-14 | Teilchendurchmesser-Messvorrichtung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57179739A JPS5970944A (ja) | 1982-10-15 | 1982-10-15 | 粒径測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5970944A JPS5970944A (ja) | 1984-04-21 |
JPH0225448B2 true JPH0225448B2 (de) | 1990-06-04 |
Family
ID=16071014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57179739A Granted JPS5970944A (ja) | 1982-10-15 | 1982-10-15 | 粒径測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5970944A (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015007649A (ja) * | 2009-07-10 | 2015-01-15 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6117940A (ja) * | 1984-07-05 | 1986-01-25 | Nippon Paint Co Ltd | 高濃度懸濁液中等の粒子の分散状態測定方法及び装置 |
JPS6171336A (ja) * | 1984-09-14 | 1986-04-12 | Nippon Paint Co Ltd | 粒度測定装置 |
JPS61234339A (ja) * | 1985-04-10 | 1986-10-18 | Fuji Electric Co Ltd | 液体用微粒子検出装置 |
JPS6255545A (ja) * | 1985-09-05 | 1987-03-11 | Toshiba Corp | 粒径測定装置 |
JPH0264435A (ja) * | 1988-08-31 | 1990-03-05 | Y D K:Kk | 粒度測定装置 |
JPH081482Y2 (ja) * | 1990-11-17 | 1996-01-17 | 株式会社堀場製作所 | 粒度分布測定装置 |
CN104596991B (zh) * | 2014-12-25 | 2017-10-31 | 北京农业智能装备技术研究中心 | 一种水体浑浊度检测装置 |
-
1982
- 1982-10-15 JP JP57179739A patent/JPS5970944A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015007649A (ja) * | 2009-07-10 | 2015-01-15 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
US10113962B2 (en) | 2009-07-10 | 2018-10-30 | Hitachi High-Technologies Corporation | Automatic analyzer |
Also Published As
Publication number | Publication date |
---|---|
JPS5970944A (ja) | 1984-04-21 |
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