JPH0212029B2 - - Google Patents
Info
- Publication number
- JPH0212029B2 JPH0212029B2 JP56089240A JP8924081A JPH0212029B2 JP H0212029 B2 JPH0212029 B2 JP H0212029B2 JP 56089240 A JP56089240 A JP 56089240A JP 8924081 A JP8924081 A JP 8924081A JP H0212029 B2 JPH0212029 B2 JP H0212029B2
- Authority
- JP
- Japan
- Prior art keywords
- insulating film
- region
- electrode
- source
- semiconductor substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56089240A JPS57204161A (en) | 1981-06-09 | 1981-06-09 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56089240A JPS57204161A (en) | 1981-06-09 | 1981-06-09 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57204161A JPS57204161A (en) | 1982-12-14 |
JPH0212029B2 true JPH0212029B2 (enrdf_load_stackoverflow) | 1990-03-16 |
Family
ID=13965214
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56089240A Granted JPS57204161A (en) | 1981-06-09 | 1981-06-09 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57204161A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2508782B2 (ja) * | 1988-01-27 | 1996-06-19 | 日本電気株式会社 | Cmos型半導体装置の製造方法 |
US5759869A (en) * | 1991-12-31 | 1998-06-02 | Sgs-Thomson Microelectronics, Inc. | Method to imporve metal step coverage by contact reflow |
-
1981
- 1981-06-09 JP JP56089240A patent/JPS57204161A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS57204161A (en) | 1982-12-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5928992B2 (ja) | Mosトランジスタおよびその製造方法 | |
KR910006700B1 (ko) | Mos형 반도체장치의 제조방법 | |
JP3000739B2 (ja) | 縦型mos電界効果トランジスタおよびその製造方法 | |
JPH0212029B2 (enrdf_load_stackoverflow) | ||
JPH11220122A (ja) | 半導体装置の製造方法 | |
JP2000223699A (ja) | 半導体装置の製造方法 | |
JPH03163833A (ja) | 半導体装置およびその製造方法 | |
US5192705A (en) | Method for manufacturing semiconductor stacked CMOS devices | |
JPH06196689A (ja) | 絶縁ゲート電界効果半導体装置およびその製造方法 | |
JPS6156448A (ja) | 相補型半導体装置の製造方法 | |
JP2623711B2 (ja) | 半導体装置 | |
JP3521921B2 (ja) | 半導体装置の製造方法 | |
EP0528290B1 (en) | Semiconductor device and manufacturing method thereof | |
JPS61251163A (ja) | Bi−MIS集積回路の製造方法 | |
JPH03257873A (ja) | 不揮発性半導体記憶装置及びその製造方法 | |
JPS62245657A (ja) | 半導体装置の製造方法 | |
JP2830076B2 (ja) | 半導体装置の製造方法 | |
JPS60788B2 (ja) | シリコンゲ−トmis半導体装置の製法 | |
JPS61251164A (ja) | Bi−MIS集積回路の製造方法 | |
JPH1070269A (ja) | Misトランジスタの製造方法 | |
JPS616867A (ja) | 半導体装置の製造方法 | |
JPH0457097B2 (enrdf_load_stackoverflow) | ||
JPH0290671A (ja) | 半導体集積回路の製造方法 | |
JPS62108574A (ja) | Mosトランジスタ装置 | |
JPH04145666A (ja) | 電気的に消去書込み可能な不揮発性半導体記憶装置 |