JPH0136118B2 - - Google Patents
Info
- Publication number
- JPH0136118B2 JPH0136118B2 JP55115032A JP11503280A JPH0136118B2 JP H0136118 B2 JPH0136118 B2 JP H0136118B2 JP 55115032 A JP55115032 A JP 55115032A JP 11503280 A JP11503280 A JP 11503280A JP H0136118 B2 JPH0136118 B2 JP H0136118B2
- Authority
- JP
- Japan
- Prior art keywords
- signal line
- display device
- common signal
- row
- common
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Liquid Crystal (AREA)
- Tests Of Electronic Circuits (AREA)
- Liquid Crystal Display Device Control (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11503280A JPS5738498A (en) | 1980-08-21 | 1980-08-21 | Testing system for active matrix substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11503280A JPS5738498A (en) | 1980-08-21 | 1980-08-21 | Testing system for active matrix substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5738498A JPS5738498A (en) | 1982-03-03 |
JPH0136118B2 true JPH0136118B2 (enrdf_load_stackoverflow) | 1989-07-28 |
Family
ID=14652517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11503280A Granted JPS5738498A (en) | 1980-08-21 | 1980-08-21 | Testing system for active matrix substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5738498A (enrdf_load_stackoverflow) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0711542B2 (ja) * | 1982-07-31 | 1995-02-08 | キヤノン株式会社 | 消費電力測定装置 |
DE3317865A1 (de) * | 1983-05-17 | 1984-11-22 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verteilfachstrecke fuer flache sendungen wie briefe |
JPH0697380B2 (ja) * | 1985-09-20 | 1994-11-30 | シャープ株式会社 | ドツト・マトリツクス方式表示装置 |
JPS63125986A (ja) * | 1986-11-14 | 1988-05-30 | 松下電器産業株式会社 | 薄膜トランジスタアレイの検査法 |
JPH0792647B2 (ja) * | 1987-01-23 | 1995-10-09 | 松下電器産業株式会社 | 液晶表示装置の欠陥検出方法 |
NL8700933A (nl) * | 1987-04-21 | 1988-11-16 | Philips Nv | Testmethode voor lcd-elementen. |
JP2558755B2 (ja) * | 1987-11-13 | 1996-11-27 | 松下電器産業株式会社 | 液晶表示パネル用セグメントドライブic |
JPH01241598A (ja) * | 1988-03-23 | 1989-09-26 | Matsushita Electron Corp | 画像表示装置の検査方法 |
JPH0355570U (enrdf_load_stackoverflow) * | 1989-10-05 | 1991-05-29 | ||
JP2728748B2 (ja) * | 1989-10-30 | 1998-03-18 | 松下電子工業株式会社 | 画像表示装置およびその検査方法 |
JP2792634B2 (ja) * | 1991-06-28 | 1998-09-03 | シャープ株式会社 | アクティブマトリクス基板の検査方法 |
EP1603110A3 (en) | 1995-02-01 | 2006-01-04 | Seiko Epson Corporation | Active matrix substrate and liquid crystal display device including it |
JP3707404B2 (ja) | 2001-08-03 | 2005-10-19 | ソニー株式会社 | 検査方法、半導体装置、及び表示装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54111298A (en) * | 1978-02-20 | 1979-08-31 | Matsushita Electric Ind Co Ltd | Driving circuit of liquid crystal display device |
-
1980
- 1980-08-21 JP JP11503280A patent/JPS5738498A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5738498A (en) | 1982-03-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2758103B2 (ja) | アクティブマトリクス基板及びその製造方法 | |
US7212025B2 (en) | Testing method for array substrate | |
KR0163938B1 (ko) | 박막 트랜지스터형 액정표시장치의 구동회로 | |
US5377030A (en) | Method for testing active matrix liquid crystal by measuring voltage due to charge in a supplemental capacitor | |
US4928095A (en) | Active matrix-addressed picture display device | |
US7009418B2 (en) | Inspecting method, semiconductor device, and display apparatus | |
EP0491436B1 (en) | Matrix display device with write-in facility | |
KR930001650B1 (ko) | 매트릭스타입 디스플레이장치의 구동회로 | |
JP3465911B2 (ja) | 電子式マトリックスアレイ装置 | |
US6204836B1 (en) | Display device having defect inspection circuit | |
JPH01137293A (ja) | デイスプレーのクロストーク減少方法と装置 | |
CN100456484C (zh) | 光学传感器及其读取方法、和矩阵型光学传感器电路 | |
JPH0136118B2 (enrdf_load_stackoverflow) | ||
JPH09508219A (ja) | 液晶ディスプレイを駆動する為の電子システム | |
US3388292A (en) | Insulated gate field-effect transistor means for information gating and driving of solid state display panels | |
JPH055866A (ja) | アクテイブマトリクス基板の検査方法 | |
US4803480A (en) | Liquid crystal display apparatus | |
US4834505A (en) | Matrix addressable displays | |
US4622590A (en) | Method of driving a display device | |
US7227523B2 (en) | Liquid crystal display device and inspecting method thereof | |
JPH0643490A (ja) | アクティブマトリックス基板の製造方法および検査方法と液晶表示装置の製造方法 | |
JP2728748B2 (ja) | 画像表示装置およびその検査方法 | |
WO1997021209A1 (en) | Multiplexer circuit | |
JP2002116423A (ja) | 液晶表示装置とその検査方法 | |
JPH04251818A (ja) | 液晶表示装置 |