JPS5738498A - Testing system for active matrix substrate - Google Patents

Testing system for active matrix substrate

Info

Publication number
JPS5738498A
JPS5738498A JP11503280A JP11503280A JPS5738498A JP S5738498 A JPS5738498 A JP S5738498A JP 11503280 A JP11503280 A JP 11503280A JP 11503280 A JP11503280 A JP 11503280A JP S5738498 A JPS5738498 A JP S5738498A
Authority
JP
Japan
Prior art keywords
active matrix
matrix substrate
testing system
testing
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11503280A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136118B2 (enrdf_load_stackoverflow
Inventor
Shinji Morozumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suwa Seikosha KK
Original Assignee
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suwa Seikosha KK filed Critical Suwa Seikosha KK
Priority to JP11503280A priority Critical patent/JPS5738498A/ja
Publication of JPS5738498A publication Critical patent/JPS5738498A/ja
Publication of JPH0136118B2 publication Critical patent/JPH0136118B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP11503280A 1980-08-21 1980-08-21 Testing system for active matrix substrate Granted JPS5738498A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Publications (2)

Publication Number Publication Date
JPS5738498A true JPS5738498A (en) 1982-03-03
JPH0136118B2 JPH0136118B2 (enrdf_load_stackoverflow) 1989-07-28

Family

ID=14652517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11503280A Granted JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Country Status (1)

Country Link
JP (1) JPS5738498A (enrdf_load_stackoverflow)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924265A (ja) * 1982-07-31 1984-02-07 Canon Inc 消費電流測定装置
JPS60501307A (ja) * 1983-05-17 1985-08-15 リツエンツイア　パテント−フエルヴアルツングス−ゲゼルシヤフト　ミツト　ベシユレンクテル　ハフツング 手紙のような扁平な郵送物のための分配区間
JPS6267479A (ja) * 1985-09-20 1987-03-27 Sharp Corp ドツト・マトリツクス方式表示装置
JPS63125986A (ja) * 1986-11-14 1988-05-30 松下電器産業株式会社 薄膜トランジスタアレイの検査法
JPS63182696A (ja) * 1987-01-23 1988-07-27 松下電器産業株式会社 液晶表示装置の欠陥検出方法
JPS63272046A (ja) * 1987-04-21 1988-11-09 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 表示装置検査方法および表示装置
JPH01129295A (ja) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd 液晶表示パネル用セグメントドライブｉｃ
JPH01241598A (ja) * 1988-03-23 1989-09-26 Matsushita Electron Corp 画像表示装置の検査方法
JPH0355570U (enrdf_load_stackoverflow) * 1989-10-05 1991-05-29
JPH03142499A (ja) * 1989-10-30 1991-06-18 Matsushita Electron Corp 画像表示装置およびその検査方法
US5506516A (en) * 1991-06-28 1996-04-09 Sharp Kabushiki Kaisha Method of inspecting an active matrix substrate
WO2003019504A1 (fr) * 2001-08-03 2003-03-06 Sony Corporation Procede d'inspection, dispositif a semi-conducteur et affichage
US7271793B2 (en) 1995-02-01 2007-09-18 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54111298A (en) * 1978-02-20 1979-08-31 Matsushita Electric Ind Co Ltd Driving circuit of liquid crystal display device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54111298A (en) * 1978-02-20 1979-08-31 Matsushita Electric Ind Co Ltd Driving circuit of liquid crystal display device

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924265A (ja) * 1982-07-31 1984-02-07 Canon Inc 消費電流測定装置
JPS60501307A (ja) * 1983-05-17 1985-08-15 リツエンツイア　パテント−フエルヴアルツングス−ゲゼルシヤフト　ミツト　ベシユレンクテル　ハフツング 手紙のような扁平な郵送物のための分配区間
JPS6267479A (ja) * 1985-09-20 1987-03-27 Sharp Corp ドツト・マトリツクス方式表示装置
JPS63125986A (ja) * 1986-11-14 1988-05-30 松下電器産業株式会社 薄膜トランジスタアレイの検査法
JPS63182696A (ja) * 1987-01-23 1988-07-27 松下電器産業株式会社 液晶表示装置の欠陥検出方法
JPS63272046A (ja) * 1987-04-21 1988-11-09 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 表示装置検査方法および表示装置
JPH01129295A (ja) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd 液晶表示パネル用セグメントドライブｉｃ
JPH01241598A (ja) * 1988-03-23 1989-09-26 Matsushita Electron Corp 画像表示装置の検査方法
JPH0355570U (enrdf_load_stackoverflow) * 1989-10-05 1991-05-29
JPH03142499A (ja) * 1989-10-30 1991-06-18 Matsushita Electron Corp 画像表示装置およびその検査方法
US5506516A (en) * 1991-06-28 1996-04-09 Sharp Kabushiki Kaisha Method of inspecting an active matrix substrate
US7271793B2 (en) 1995-02-01 2007-09-18 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US7782311B2 (en) 1995-02-01 2010-08-24 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US7932886B2 (en) 1995-02-01 2011-04-26 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection for liquid crystal display devices
US7940244B2 (en) 1995-02-01 2011-05-10 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US8704747B2 (en) 1995-02-01 2014-04-22 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
WO2003019504A1 (fr) * 2001-08-03 2003-03-06 Sony Corporation Procede d'inspection, dispositif a semi-conducteur et affichage
US7009418B2 (en) 2001-08-03 2006-03-07 Sony Corporation Inspecting method, semiconductor device, and display apparatus
US7123044B2 (en) 2001-08-03 2006-10-17 Sony Corporation Testing method, semiconductor device, and display apparatus

Also Published As

Publication number Publication date
JPH0136118B2 (enrdf_load_stackoverflow) 1989-07-28

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