JP7843949B2 - 半導体装置、電力変換装置、及び、半導体装置の製造方法 - Google Patents

半導体装置、電力変換装置、及び、半導体装置の製造方法

Info

Publication number
JP7843949B2
JP7843949B2 JP2025568898A JP2025568898A JP7843949B2 JP 7843949 B2 JP7843949 B2 JP 7843949B2 JP 2025568898 A JP2025568898 A JP 2025568898A JP 2025568898 A JP2025568898 A JP 2025568898A JP 7843949 B2 JP7843949 B2 JP 7843949B2
Authority
JP
Japan
Prior art keywords
trench
semiconductor device
insulating film
electrode
interlayer insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2025568898A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2025225054A5 (https=
JPWO2025225054A1 (https=
Inventor
貴亮 富永
彬文 飯島
亘平 足立
裕 福井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of JPWO2025225054A1 publication Critical patent/JPWO2025225054A1/ja
Publication of JPWO2025225054A5 publication Critical patent/JPWO2025225054A5/ja
Application granted granted Critical
Publication of JP7843949B2 publication Critical patent/JP7843949B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/64Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66Vertical DMOS [VDMOS] FETs

Landscapes

  • Electrodes Of Semiconductors (AREA)
JP2025568898A 2024-04-23 2024-10-23 半導体装置、電力変換装置、及び、半導体装置の製造方法 Active JP7843949B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPPCT/JP2024/015801 2024-04-23
PCT/JP2024/015801 WO2025224813A1 (ja) 2024-04-23 2024-04-23 半導体装置及び半導体装置の製造方法
PCT/JP2024/037769 WO2025225054A1 (ja) 2024-04-23 2024-10-23 半導体装置、電力変換装置、及び、半導体装置の製造方法

Publications (3)

Publication Number Publication Date
JPWO2025225054A1 JPWO2025225054A1 (https=) 2025-10-30
JPWO2025225054A5 JPWO2025225054A5 (https=) 2026-04-01
JP7843949B2 true JP7843949B2 (ja) 2026-04-10

Family

ID=97489632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025568898A Active JP7843949B2 (ja) 2024-04-23 2024-10-23 半導体装置、電力変換装置、及び、半導体装置の製造方法

Country Status (2)

Country Link
JP (1) JP7843949B2 (https=)
WO (2) WO2025224813A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006100494A (ja) 2004-09-29 2006-04-13 Nec Electronics Corp 縦型mosfet
JP2019161200A (ja) 2017-05-17 2019-09-19 ローム株式会社 半導体装置
WO2022024810A1 (ja) 2020-07-31 2022-02-03 ローム株式会社 SiC半導体装置
WO2022163082A1 (ja) 2021-02-01 2022-08-04 ローム株式会社 SiC半導体装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008085278A (ja) * 2006-09-29 2008-04-10 Ricoh Co Ltd 半導体装置及びその製造方法
JP5812029B2 (ja) * 2012-06-13 2015-11-11 株式会社デンソー 炭化珪素半導体装置およびその製造方法
US9825166B2 (en) * 2013-01-23 2017-11-21 Hitachi, Ltd. Silicon carbide semiconductor device and method for producing same
US9178015B2 (en) * 2014-01-10 2015-11-03 Vishay General Semiconductor Llc Trench MOS device having a termination structure with multiple field-relaxation trenches for high voltage applications
JP6185504B2 (ja) * 2015-03-24 2017-08-23 京セラ株式会社 半導体装置
JP6409681B2 (ja) * 2015-05-29 2018-10-24 株式会社デンソー 半導体装置およびその製造方法
CN107683530B (zh) * 2015-06-09 2020-08-18 三菱电机株式会社 电力用半导体装置
JP7382558B2 (ja) * 2019-12-25 2023-11-17 株式会社ノベルクリスタルテクノロジー トレンチ型mosfet
WO2021261102A1 (ja) * 2020-06-26 2021-12-30 ローム株式会社 電子部品
JP7471199B2 (ja) * 2020-11-12 2024-04-19 三菱電機株式会社 炭化珪素半導体装置、電力変換装置、および炭化珪素半導体装置の製造方法
JP7647239B2 (ja) * 2021-03-30 2025-03-18 富士電機株式会社 半導体装置
JP7586034B2 (ja) * 2021-09-03 2024-11-19 株式会社デンソー 半導体装置
WO2023080091A1 (ja) * 2021-11-05 2023-05-11 ローム株式会社 半導体装置の製造方法
JP7757235B2 (ja) * 2022-05-13 2025-10-21 株式会社デンソー 半導体装置とその製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006100494A (ja) 2004-09-29 2006-04-13 Nec Electronics Corp 縦型mosfet
JP2019161200A (ja) 2017-05-17 2019-09-19 ローム株式会社 半導体装置
WO2022024810A1 (ja) 2020-07-31 2022-02-03 ローム株式会社 SiC半導体装置
WO2022163082A1 (ja) 2021-02-01 2022-08-04 ローム株式会社 SiC半導体装置

Also Published As

Publication number Publication date
WO2025224813A1 (ja) 2025-10-30
JPWO2025225054A1 (https=) 2025-10-30
WO2025225054A1 (ja) 2025-10-30

Similar Documents

Publication Publication Date Title
US11984492B2 (en) Silicon carbide semiconductor device, power converter, and method of manufacturing silicon carbide semiconductor device
JP6753951B2 (ja) 半導体装置および電力変換装置
US11158704B2 (en) Semiconductor device and power conversion device
US11282948B2 (en) Wide band gap semiconductor device and power conversion apparatus
JPWO2018155566A1 (ja) 炭化珪素半導体装置および電力変換装置
JPWO2021014570A1 (ja) 炭化珪素半導体装置、電力変換装置および炭化珪素半導体装置の製造方法
JP7094439B2 (ja) 炭化珪素半導体装置および電力変換装置
US12610594B2 (en) Semiconductor device and power conversion apparatus
US11239350B2 (en) Semiconductor device, method of manufacturing semiconductor device, power conversion device
US12310076B2 (en) Silicon carbide semiconductor device, power conversion apparatus, and method for manufacturing silicon carbide semiconductor device
JP7062143B1 (ja) 半導体装置及び電力変換装置
JP7625086B2 (ja) 炭化珪素半導体装置および電力変換装置
US20240234570A1 (en) Semiconductor device, power conversion apparatus, and method of manufacturing semiconductor device
JP7843949B2 (ja) 半導体装置、電力変換装置、及び、半導体装置の製造方法
JP7679761B2 (ja) 半導体装置及び電力変換装置
JP7529139B2 (ja) 炭化珪素半導体装置とその製造方法、および、電力変換装置
CN116137935B (zh) 碳化硅半导体装置以及电力变换装置
WO2026003909A1 (ja) 半導体装置、電力変換装置及び半導体装置の製造方法
JP2019110226A (ja) SiC半導体装置、電力変換装置およびSiC半導体装置の製造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20251125

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20251125

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20251125

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20260120

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20260219

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20260303

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20260331

R150 Certificate of patent or registration of utility model

Ref document number: 7843949

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150