JP7763244B2 - Cmp処理のための基板ハンドリングシステム及び方法 - Google Patents

Cmp処理のための基板ハンドリングシステム及び方法

Info

Publication number
JP7763244B2
JP7763244B2 JP2023512062A JP2023512062A JP7763244B2 JP 7763244 B2 JP7763244 B2 JP 7763244B2 JP 2023512062 A JP2023512062 A JP 2023512062A JP 2023512062 A JP2023512062 A JP 2023512062A JP 7763244 B2 JP7763244 B2 JP 7763244B2
Authority
JP
Japan
Prior art keywords
substrate
end effector
axis
polishing
station
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023512062A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023540884A5 (enExample
JP2023540884A (ja
Inventor
ジョンフン オー,
マノジュ エー. ガジェンドラ,
ジョン アンソニー ガルシア,
ナラシンガイア, チェタン クマール マイラッパナハリ
サンジャイ バヌラオ チャヴァン,
ガガン ドバル,
マノジュ バラクマール,
ジェイミー スチュアート レイトン,
ヴァン エイチ. グエン,
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of JP2023540884A publication Critical patent/JP2023540884A/ja
Publication of JP2023540884A5 publication Critical patent/JP2023540884A5/ja
Application granted granted Critical
Publication of JP7763244B2 publication Critical patent/JP7763244B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/0076Other grinding machines or devices grinding machines comprising two or more grinding tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B24B37/102Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being able to rotate freely due to a frictional contact with the lapping tool
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B24B37/105Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B57/00Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
    • B24B57/02Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00Manipulators not otherwise provided for
    • B25J11/0095Manipulators transporting wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00Gripping heads and other end effectors
    • B25J15/06Gripping heads and other end effectors with vacuum or magnetic holding means
    • B25J15/0616Gripping heads and other end effectors with vacuum or magnetic holding means with vacuum
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/123Preparing bulk and homogeneous wafers by grinding or lapping
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/124Preparing bulk and homogeneous wafers by processing the backside of the wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/126Preparing bulk and homogeneous wafers by chemical etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/005Feeding or manipulating devices specially adapted to grinding machines
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B51/00Arrangements for automatic control of a series of individual steps in grinding a workpiece
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/129Preparing bulk and homogeneous wafers by polishing

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Robotics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
JP2023512062A 2020-09-08 2021-08-19 Cmp処理のための基板ハンドリングシステム及び方法 Active JP7763244B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202063075607P 2020-09-08 2020-09-08
US63/075,607 2020-09-08
PCT/US2021/046605 WO2022072079A2 (en) 2020-09-08 2021-08-19 Substrate handling systems and methods for cmp processing

Publications (3)

Publication Number Publication Date
JP2023540884A JP2023540884A (ja) 2023-09-27
JP2023540884A5 JP2023540884A5 (enExample) 2024-06-17
JP7763244B2 true JP7763244B2 (ja) 2025-10-31

Family

ID=80469432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023512062A Active JP7763244B2 (ja) 2020-09-08 2021-08-19 Cmp処理のための基板ハンドリングシステム及び方法

Country Status (7)

Country Link
US (1) US12454036B2 (enExample)
EP (1) EP4210903A4 (enExample)
JP (1) JP7763244B2 (enExample)
KR (1) KR102759345B1 (enExample)
CN (1) CN116234661A (enExample)
TW (2) TWI875625B (enExample)
WO (1) WO2022072079A2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114649245B (zh) * 2022-05-19 2022-09-09 西安奕斯伟材料科技有限公司 一种用于承载和清洁硅片的装置
US12539577B2 (en) * 2022-10-03 2026-02-03 Applied Materials, Inc. System and method for detecting a membrane failure in a chemical mechanical polishing system
WO2024091617A1 (en) * 2022-10-27 2024-05-02 Berkshire Grey Operating Company, Inc. Systems and methods for automated packaging and processing with object placement pose control

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001127139A (ja) 1999-09-16 2001-05-11 Applied Materials Inc 半導体処理装置用多面ロボットブレード
JP2005508074A (ja) 2001-03-14 2005-03-24 アプライド マテリアルズ インコーポレイテッド 電解ケミカルメカニカルポリッシングを用いる基板平坦化
JP2007158170A (ja) 2005-12-07 2007-06-21 Ishikawajima Harima Heavy Ind Co Ltd 搬送ロボット
JP2008078673A (ja) 1995-10-27 2008-04-03 Applied Materials Inc 研磨装置および研磨方法
US20080157455A1 (en) 2006-12-29 2008-07-03 Applied Materials, Inc. Compliant substrate holding assembly
JP2009123806A (ja) 2007-11-13 2009-06-04 Denso Corp 炭化珪素半導体装置の製造方法
JP2009123753A (ja) 2007-11-12 2009-06-04 Hoya Corp 半導体素子ならびに半導体素子製造法

Family Cites Families (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0319215A (ja) * 1989-06-16 1991-01-28 Shioya Seisakusho:Kk 貼付装置
US7097544B1 (en) * 1995-10-27 2006-08-29 Applied Materials Inc. Chemical mechanical polishing system having multiple polishing stations and providing relative linear polishing motion
JP3894514B2 (ja) 1997-04-04 2007-03-22 株式会社ディスコ 研磨装置
JP3271658B2 (ja) * 1998-03-23 2002-04-02 信越半導体株式会社 半導体シリコン単結晶ウェーハのラップ又は研磨方法
US6406359B1 (en) 1999-06-01 2002-06-18 Applied Materials, Inc. Apparatus for transferring semiconductor substrates using an input module
US6361422B1 (en) 1999-06-15 2002-03-26 Applied Materials, Inc. Method and apparatus for transferring semiconductor substrates using an input module
US6679755B1 (en) 1999-12-09 2004-01-20 Applied Materials Inc. Chemical mechanical planarization system
WO2001064391A2 (en) 2000-02-29 2001-09-07 Applied Materials, Inc. Planarization system with a wafer transfer corridor and multiple polishing modules
US6572730B1 (en) 2000-03-31 2003-06-03 Applied Materials, Inc. System and method for chemical mechanical planarization
US6413145B1 (en) 2000-04-05 2002-07-02 Applied Materials, Inc. System for polishing and cleaning substrates
US6413356B1 (en) 2000-05-02 2002-07-02 Applied Materials, Inc. Substrate loader for a semiconductor processing system
US6435941B1 (en) 2000-05-12 2002-08-20 Appllied Materials, Inc. Apparatus and method for chemical mechanical planarization
US7048607B1 (en) 2000-05-31 2006-05-23 Applied Materials System and method for chemical mechanical planarization
US6645550B1 (en) 2000-06-22 2003-11-11 Applied Materials, Inc. Method of treating a substrate
US7097534B1 (en) 2000-07-10 2006-08-29 Applied Materials, Inc. Closed-loop control of a chemical mechanical polisher
US6561884B1 (en) 2000-08-29 2003-05-13 Applied Materials, Inc. Web lift system for chemical mechanical planarization
US6613200B2 (en) 2001-01-26 2003-09-02 Applied Materials, Inc. Electro-chemical plating with reduced thickness and integration with chemical mechanical polisher into a single platform
US6817923B2 (en) 2001-05-24 2004-11-16 Applied Materials, Inc. Chemical mechanical processing system with mobile load cup
US6677239B2 (en) 2001-08-24 2004-01-13 Applied Materials Inc. Methods and compositions for chemical mechanical polishing
US6811466B1 (en) 2001-12-28 2004-11-02 Applied Materials, Inc. System and method for in-line metal profile measurement
US6939198B1 (en) 2001-12-28 2005-09-06 Applied Materials, Inc. Polishing system with in-line and in-situ metrology
US20030224678A1 (en) 2002-05-31 2003-12-04 Applied Materials, Inc. Web pad design for chemical mechanical polishing
US7265382B2 (en) 2002-11-12 2007-09-04 Applied Materials, Inc. Method and apparatus employing integrated metrology for improved dielectric etch efficiency
US20050092620A1 (en) 2003-10-01 2005-05-05 Applied Materials, Inc. Methods and apparatus for polishing a substrate
US7390744B2 (en) 2004-01-29 2008-06-24 Applied Materials, Inc. Method and composition for polishing a substrate
US7433759B2 (en) 2004-07-22 2008-10-07 Applied Materials, Inc. Apparatus and methods for positioning wafers
US7314808B2 (en) * 2004-12-23 2008-01-01 Applied Materials, Inc. Method for sequencing substrates
CN101147233A (zh) 2005-05-12 2008-03-19 应用材料股份有限公司 用于在清洁模块中垂直转移半导体基材的方法及设备
US7198548B1 (en) 2005-09-30 2007-04-03 Applied Materials, Inc. Polishing apparatus and method with direct load platen
US20070151866A1 (en) 2006-01-05 2007-07-05 Applied Materials, Inc. Substrate polishing with surface pretreatment
US7175505B1 (en) * 2006-01-09 2007-02-13 Applied Materials, Inc. Method for adjusting substrate processing times in a substrate polishing system
US7840375B2 (en) 2007-04-02 2010-11-23 Applied Materials, Inc. Methods and apparatus for generating a library of spectra
KR101413762B1 (ko) * 2007-08-22 2014-07-01 위순임 기판 처리 시스템
US20090061743A1 (en) * 2007-08-29 2009-03-05 Stephen Jew Method of soft pad preparation to reduce removal rate ramp-up effect and to stabilize defect rate
US20090061739A1 (en) * 2007-09-05 2009-03-05 Jeong In-Kwon Polishing apparatus and method for polishing semiconductor wafers using load-unload stations
US8322963B2 (en) 2008-04-18 2012-12-04 Applied Materials, Inc. End effector for a cluster tool
WO2009131945A2 (en) 2008-04-25 2009-10-29 Applied Materials, Inc. High throughput chemical mechanical polishing system
US20100041316A1 (en) 2008-08-14 2010-02-18 Yulin Wang Method for an improved chemical mechanical polishing system
WO2011133386A2 (en) 2010-04-20 2011-10-27 Applied Materials, Inc. Closed-loop control for improved polishing pad profiles
US8851816B2 (en) 2011-04-07 2014-10-07 Microtronic, Inc. Apparatus, system, and methods for weighing and positioning wafers
US20120322345A1 (en) 2011-06-17 2012-12-20 Applied Materials, Inc. Apparatus for chemical mechanical polishing
US20130115862A1 (en) 2011-11-09 2013-05-09 Applied Materials, Inc. Chemical mechanical polishing platform architecture
DE102012013022A1 (de) * 2012-06-29 2014-04-24 Liebherr-Verzahntechnik Gmbh Vorrichtung zur automatisierten Handhabung von Werkstücken
US9711381B2 (en) 2013-01-31 2017-07-18 Applied Materials, Inc. Methods and apparatus for post-chemical mechanical planarization substrate cleaning
WO2014149340A1 (en) 2013-03-15 2014-09-25 Applied Materials, Inc. Substrate position aligner
US10755960B2 (en) * 2014-11-04 2020-08-25 Brooks Automation, Inc. Wafer aligner
US9536764B2 (en) * 2015-01-27 2017-01-03 Lam Research Corporation End effector for wafer transfer system and method of transferring wafers
JP6276317B2 (ja) * 2016-03-31 2018-02-07 平田機工株式会社 ハンドユニットおよび移載方法
TW201812893A (zh) 2016-08-26 2018-04-01 美商應用材料股份有限公司 具有以機器人存取卡匣的化學機械研磨工具
US10651067B2 (en) * 2017-01-26 2020-05-12 Brooks Automation, Inc. Method and apparatus for substrate transport apparatus position compensation
CN211332378U (zh) * 2020-06-16 2020-08-25 苏州市意可机电有限公司 具有机械手臂的自动上下料设备

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078673A (ja) 1995-10-27 2008-04-03 Applied Materials Inc 研磨装置および研磨方法
JP2001127139A (ja) 1999-09-16 2001-05-11 Applied Materials Inc 半導体処理装置用多面ロボットブレード
JP2005508074A (ja) 2001-03-14 2005-03-24 アプライド マテリアルズ インコーポレイテッド 電解ケミカルメカニカルポリッシングを用いる基板平坦化
JP2007158170A (ja) 2005-12-07 2007-06-21 Ishikawajima Harima Heavy Ind Co Ltd 搬送ロボット
US20080157455A1 (en) 2006-12-29 2008-07-03 Applied Materials, Inc. Compliant substrate holding assembly
JP2009123753A (ja) 2007-11-12 2009-06-04 Hoya Corp 半導体素子ならびに半導体素子製造法
JP2009123806A (ja) 2007-11-13 2009-06-04 Denso Corp 炭化珪素半導体装置の製造方法

Also Published As

Publication number Publication date
TWI875625B (zh) 2025-03-01
US12454036B2 (en) 2025-10-28
JP2023540884A (ja) 2023-09-27
CN116234661A (zh) 2023-06-06
EP4210903A2 (en) 2023-07-19
TWI849331B (zh) 2024-07-21
TW202224849A (zh) 2022-07-01
KR102759345B1 (ko) 2025-01-22
WO2022072079A2 (en) 2022-04-07
TW202442373A (zh) 2024-11-01
US20220072682A1 (en) 2022-03-10
KR20230061535A (ko) 2023-05-08
EP4210903A4 (en) 2024-10-16
WO2022072079A3 (en) 2022-07-14

Similar Documents

Publication Publication Date Title
TWI790319B (zh) 基板處理系統及基板處理方法
JP7763244B2 (ja) Cmp処理のための基板ハンドリングシステム及び方法
US6180020B1 (en) Polishing method and apparatus
CN105580115B (zh) 装配有枢纽臂的化学机械抛光机
EP1261020A1 (en) Wafer manufacturing method, polishing apparatus, and wafer
JP2010064196A (ja) 基板研磨装置および基板研磨方法
CN211681559U (zh) 晶圆的研磨装置
JP2019021859A (ja) 基板処理システム
CN101811273A (zh) 工件加工方法和工件加工装置
JP2009285738A (ja) 半導体基板の平坦化装置および平坦化方法
KR102629528B1 (ko) 세정 장치, 세정 방법 및 컴퓨터 기억 매체
US6478977B1 (en) Polishing method and apparatus
KR20070077979A (ko) 화학적 기계적 연마 장치 및 이를 이용한 웨이퍼의 연마방법
JP2008036744A (ja) 研磨装置
JP5689367B2 (ja) 基板搬送方法および基板搬送機
JP7690056B2 (ja) 基板処理方法及び基板処理システム
US7048607B1 (en) System and method for chemical mechanical planarization
JP2007301697A (ja) 研磨方法
JP2025120540A (ja) 研磨装置、及びSiCウェーハの研磨方法
KR100253341B1 (ko) 반도체 웨이퍼의 후면연마법 및 그 장치
TW201829126A (zh) 研磨裝置
JPH11195690A (ja) ウエーハ移載装置
KR20250062739A (ko) 기판 세정 장치
TW202234503A (zh) 工件輸送機構
JP2024103999A (ja) 加工装置及び搬送方法

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230417

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240531

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240607

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240702

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20241002

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20250128

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20250425

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20250627

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20250722

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20250930

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20251021

R150 Certificate of patent or registration of utility model

Ref document number: 7763244

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150