JP7414146B2 - ガスクロマトグラフ質量分析装置 - Google Patents
ガスクロマトグラフ質量分析装置 Download PDFInfo
- Publication number
- JP7414146B2 JP7414146B2 JP2022536141A JP2022536141A JP7414146B2 JP 7414146 B2 JP7414146 B2 JP 7414146B2 JP 2022536141 A JP2022536141 A JP 2022536141A JP 2022536141 A JP2022536141 A JP 2022536141A JP 7414146 B2 JP7414146 B2 JP 7414146B2
- Authority
- JP
- Japan
- Prior art keywords
- filament
- ion source
- source box
- section
- gas chromatograph
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7206—Mass spectrometers interfaced to gas chromatograph
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N2030/022—Column chromatography characterised by the kind of separation mechanism
- G01N2030/025—Gas chromatography
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020120450 | 2020-07-14 | ||
| JP2020120450 | 2020-07-14 | ||
| PCT/JP2021/016773 WO2022014119A1 (ja) | 2020-07-14 | 2021-04-27 | ガスクロマトグラフ質量分析装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022014119A1 JPWO2022014119A1 (https=) | 2022-01-20 |
| JPWO2022014119A5 JPWO2022014119A5 (https=) | 2023-04-13 |
| JP7414146B2 true JP7414146B2 (ja) | 2024-01-16 |
Family
ID=79554736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022536141A Active JP7414146B2 (ja) | 2020-07-14 | 2021-04-27 | ガスクロマトグラフ質量分析装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230243787A1 (https=) |
| JP (1) | JP7414146B2 (https=) |
| CN (1) | CN115836220B (https=) |
| WO (1) | WO2022014119A1 (https=) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001357816A (ja) | 2000-06-13 | 2001-12-26 | Shimadzu Corp | 質量分析計 |
| JP2002329475A (ja) | 2001-05-01 | 2002-11-15 | Shimadzu Corp | ガスクロマトグラフ質量分析装置 |
| WO2007102224A1 (ja) | 2006-03-09 | 2007-09-13 | Shimadzu Corporation | 質量分析装置 |
| WO2016092696A1 (ja) | 2014-12-12 | 2016-06-16 | 株式会社島津製作所 | 質量分析装置 |
| WO2017086393A1 (ja) | 2015-11-17 | 2017-05-26 | アトナープ株式会社 | 分析装置及びその制御方法 |
| JP2018032481A (ja) | 2016-08-23 | 2018-03-01 | 株式会社島津製作所 | 質量分析装置及び質量分析装置用ソフトウエア |
| US10497548B1 (en) | 2019-05-01 | 2019-12-03 | Aviv Amirav | Method and apparatus for electron ionization liquid chromatography mass spectrometry |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5327638B2 (https=) * | 1974-11-11 | 1978-08-09 | ||
| JPS5697865A (en) * | 1980-01-07 | 1981-08-06 | Hitachi Ltd | Ionization detector |
| US5218203A (en) * | 1991-03-22 | 1993-06-08 | Georgia Tech Research Corporation | Ion source and sample introduction method and apparatus using two stage ionization for producing sample gas ions |
| JP4123135B2 (ja) * | 2003-11-11 | 2008-07-23 | 株式会社島津製作所 | 熱イオン化検出器 |
| JP2010251718A (ja) * | 2009-03-27 | 2010-11-04 | Canon Anelva Corp | 加熱装置の温度制御方法及び記憶媒体 |
| US10262848B2 (en) * | 2015-01-21 | 2019-04-16 | Shimadzu Corporation | Mass spectrometer |
| JP6432404B2 (ja) * | 2015-03-18 | 2018-12-05 | 株式会社島津製作所 | 液化二酸化炭素送液ポンプとそれを備えた超臨界流体クロマトグラフ |
| CN108233759B (zh) * | 2017-12-29 | 2020-03-03 | 北京市北分仪器技术有限责任公司 | 一种具有温度补偿系统的质谱仪射频电源 |
| JP6843817B2 (ja) * | 2018-11-21 | 2021-03-17 | 日本電子株式会社 | 質量分析装置、ガスクロマトグラフ質量分析装置及び焼き出し電流制御装置 |
-
2021
- 2021-04-27 US US18/015,887 patent/US20230243787A1/en active Pending
- 2021-04-27 CN CN202180049657.5A patent/CN115836220B/zh active Active
- 2021-04-27 WO PCT/JP2021/016773 patent/WO2022014119A1/ja not_active Ceased
- 2021-04-27 JP JP2022536141A patent/JP7414146B2/ja active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001357816A (ja) | 2000-06-13 | 2001-12-26 | Shimadzu Corp | 質量分析計 |
| JP2002329475A (ja) | 2001-05-01 | 2002-11-15 | Shimadzu Corp | ガスクロマトグラフ質量分析装置 |
| WO2007102224A1 (ja) | 2006-03-09 | 2007-09-13 | Shimadzu Corporation | 質量分析装置 |
| WO2016092696A1 (ja) | 2014-12-12 | 2016-06-16 | 株式会社島津製作所 | 質量分析装置 |
| WO2017086393A1 (ja) | 2015-11-17 | 2017-05-26 | アトナープ株式会社 | 分析装置及びその制御方法 |
| JP2018032481A (ja) | 2016-08-23 | 2018-03-01 | 株式会社島津製作所 | 質量分析装置及び質量分析装置用ソフトウエア |
| US10497548B1 (en) | 2019-05-01 | 2019-12-03 | Aviv Amirav | Method and apparatus for electron ionization liquid chromatography mass spectrometry |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022014119A1 (ja) | 2022-01-20 |
| CN115836220A (zh) | 2023-03-21 |
| US20230243787A1 (en) | 2023-08-03 |
| JPWO2022014119A1 (https=) | 2022-01-20 |
| CN115836220B (zh) | 2025-01-17 |
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