JP7414146B2 - ガスクロマトグラフ質量分析装置 - Google Patents

ガスクロマトグラフ質量分析装置 Download PDF

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Publication number
JP7414146B2
JP7414146B2 JP2022536141A JP2022536141A JP7414146B2 JP 7414146 B2 JP7414146 B2 JP 7414146B2 JP 2022536141 A JP2022536141 A JP 2022536141A JP 2022536141 A JP2022536141 A JP 2022536141A JP 7414146 B2 JP7414146 B2 JP 7414146B2
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Prior art keywords
filament
ion source
source box
section
gas chromatograph
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Japanese (ja)
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JPWO2022014119A1 (https=
JPWO2022014119A5 (https=
Inventor
茂捻 原田
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Shimadzu Corp
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Shimadzu Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7206Mass spectrometers interfaced to gas chromatograph
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426Methods for controlling ions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N2030/022Column chromatography characterised by the kind of separation mechanism
    • G01N2030/025Gas chromatography

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2022536141A 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置 Active JP7414146B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020120450 2020-07-14
JP2020120450 2020-07-14
PCT/JP2021/016773 WO2022014119A1 (ja) 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置

Publications (3)

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JPWO2022014119A1 JPWO2022014119A1 (https=) 2022-01-20
JPWO2022014119A5 JPWO2022014119A5 (https=) 2023-04-13
JP7414146B2 true JP7414146B2 (ja) 2024-01-16

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JP2022536141A Active JP7414146B2 (ja) 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置

Country Status (4)

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US (1) US20230243787A1 (https=)
JP (1) JP7414146B2 (https=)
CN (1) CN115836220B (https=)
WO (1) WO2022014119A1 (https=)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001357816A (ja) 2000-06-13 2001-12-26 Shimadzu Corp 質量分析計
JP2002329475A (ja) 2001-05-01 2002-11-15 Shimadzu Corp ガスクロマトグラフ質量分析装置
WO2007102224A1 (ja) 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
WO2016092696A1 (ja) 2014-12-12 2016-06-16 株式会社島津製作所 質量分析装置
WO2017086393A1 (ja) 2015-11-17 2017-05-26 アトナープ株式会社 分析装置及びその制御方法
JP2018032481A (ja) 2016-08-23 2018-03-01 株式会社島津製作所 質量分析装置及び質量分析装置用ソフトウエア
US10497548B1 (en) 2019-05-01 2019-12-03 Aviv Amirav Method and apparatus for electron ionization liquid chromatography mass spectrometry

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5327638B2 (https=) * 1974-11-11 1978-08-09
JPS5697865A (en) * 1980-01-07 1981-08-06 Hitachi Ltd Ionization detector
US5218203A (en) * 1991-03-22 1993-06-08 Georgia Tech Research Corporation Ion source and sample introduction method and apparatus using two stage ionization for producing sample gas ions
JP4123135B2 (ja) * 2003-11-11 2008-07-23 株式会社島津製作所 熱イオン化検出器
JP2010251718A (ja) * 2009-03-27 2010-11-04 Canon Anelva Corp 加熱装置の温度制御方法及び記憶媒体
US10262848B2 (en) * 2015-01-21 2019-04-16 Shimadzu Corporation Mass spectrometer
JP6432404B2 (ja) * 2015-03-18 2018-12-05 株式会社島津製作所 液化二酸化炭素送液ポンプとそれを備えた超臨界流体クロマトグラフ
CN108233759B (zh) * 2017-12-29 2020-03-03 北京市北分仪器技术有限责任公司 一种具有温度补偿系统的质谱仪射频电源
JP6843817B2 (ja) * 2018-11-21 2021-03-17 日本電子株式会社 質量分析装置、ガスクロマトグラフ質量分析装置及び焼き出し電流制御装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001357816A (ja) 2000-06-13 2001-12-26 Shimadzu Corp 質量分析計
JP2002329475A (ja) 2001-05-01 2002-11-15 Shimadzu Corp ガスクロマトグラフ質量分析装置
WO2007102224A1 (ja) 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
WO2016092696A1 (ja) 2014-12-12 2016-06-16 株式会社島津製作所 質量分析装置
WO2017086393A1 (ja) 2015-11-17 2017-05-26 アトナープ株式会社 分析装置及びその制御方法
JP2018032481A (ja) 2016-08-23 2018-03-01 株式会社島津製作所 質量分析装置及び質量分析装置用ソフトウエア
US10497548B1 (en) 2019-05-01 2019-12-03 Aviv Amirav Method and apparatus for electron ionization liquid chromatography mass spectrometry

Also Published As

Publication number Publication date
WO2022014119A1 (ja) 2022-01-20
CN115836220A (zh) 2023-03-21
US20230243787A1 (en) 2023-08-03
JPWO2022014119A1 (https=) 2022-01-20
CN115836220B (zh) 2025-01-17

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