JPWO2022014119A1 - - Google Patents

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Publication number
JPWO2022014119A1
JPWO2022014119A1 JP2022536141A JP2022536141A JPWO2022014119A1 JP WO2022014119 A1 JPWO2022014119 A1 JP WO2022014119A1 JP 2022536141 A JP2022536141 A JP 2022536141A JP 2022536141 A JP2022536141 A JP 2022536141A JP WO2022014119 A1 JPWO2022014119 A1 JP WO2022014119A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022536141A
Other languages
Japanese (ja)
Other versions
JPWO2022014119A5 (https=
JP7414146B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022014119A1 publication Critical patent/JPWO2022014119A1/ja
Publication of JPWO2022014119A5 publication Critical patent/JPWO2022014119A5/ja
Application granted granted Critical
Publication of JP7414146B2 publication Critical patent/JP7414146B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N2030/022—Column chromatography characterised by the kind of separation mechanism
    • G01N2030/025—Gas chromatography

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2022536141A 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置 Active JP7414146B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020120450 2020-07-14
JP2020120450 2020-07-14
PCT/JP2021/016773 WO2022014119A1 (ja) 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2022014119A1 true JPWO2022014119A1 (https=) 2022-01-20
JPWO2022014119A5 JPWO2022014119A5 (https=) 2023-04-13
JP7414146B2 JP7414146B2 (ja) 2024-01-16

Family

ID=79554736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022536141A Active JP7414146B2 (ja) 2020-07-14 2021-04-27 ガスクロマトグラフ質量分析装置

Country Status (4)

Country Link
US (1) US20230243787A1 (https=)
JP (1) JP7414146B2 (https=)
CN (1) CN115836220B (https=)
WO (1) WO2022014119A1 (https=)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5163683A (https=) * 1974-11-11 1976-06-02 Hitachi Ltd
JP2001357816A (ja) * 2000-06-13 2001-12-26 Shimadzu Corp 質量分析計
JP2002329475A (ja) * 2001-05-01 2002-11-15 Shimadzu Corp ガスクロマトグラフ質量分析装置
WO2007102224A1 (ja) * 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
WO2016092696A1 (ja) * 2014-12-12 2016-06-16 株式会社島津製作所 質量分析装置
WO2017086393A1 (ja) * 2015-11-17 2017-05-26 アトナープ株式会社 分析装置及びその制御方法
JP2018032481A (ja) * 2016-08-23 2018-03-01 株式会社島津製作所 質量分析装置及び質量分析装置用ソフトウエア
US10497548B1 (en) * 2019-05-01 2019-12-03 Aviv Amirav Method and apparatus for electron ionization liquid chromatography mass spectrometry

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5697865A (en) * 1980-01-07 1981-08-06 Hitachi Ltd Ionization detector
US5218203A (en) * 1991-03-22 1993-06-08 Georgia Tech Research Corporation Ion source and sample introduction method and apparatus using two stage ionization for producing sample gas ions
JP4123135B2 (ja) * 2003-11-11 2008-07-23 株式会社島津製作所 熱イオン化検出器
JP2010251718A (ja) * 2009-03-27 2010-11-04 Canon Anelva Corp 加熱装置の温度制御方法及び記憶媒体
US10262848B2 (en) * 2015-01-21 2019-04-16 Shimadzu Corporation Mass spectrometer
JP6432404B2 (ja) * 2015-03-18 2018-12-05 株式会社島津製作所 液化二酸化炭素送液ポンプとそれを備えた超臨界流体クロマトグラフ
CN108233759B (zh) * 2017-12-29 2020-03-03 北京市北分仪器技术有限责任公司 一种具有温度补偿系统的质谱仪射频电源
JP6843817B2 (ja) * 2018-11-21 2021-03-17 日本電子株式会社 質量分析装置、ガスクロマトグラフ質量分析装置及び焼き出し電流制御装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5163683A (https=) * 1974-11-11 1976-06-02 Hitachi Ltd
JP2001357816A (ja) * 2000-06-13 2001-12-26 Shimadzu Corp 質量分析計
JP2002329475A (ja) * 2001-05-01 2002-11-15 Shimadzu Corp ガスクロマトグラフ質量分析装置
WO2007102224A1 (ja) * 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
WO2016092696A1 (ja) * 2014-12-12 2016-06-16 株式会社島津製作所 質量分析装置
WO2017086393A1 (ja) * 2015-11-17 2017-05-26 アトナープ株式会社 分析装置及びその制御方法
JP2018032481A (ja) * 2016-08-23 2018-03-01 株式会社島津製作所 質量分析装置及び質量分析装置用ソフトウエア
US10497548B1 (en) * 2019-05-01 2019-12-03 Aviv Amirav Method and apparatus for electron ionization liquid chromatography mass spectrometry

Also Published As

Publication number Publication date
WO2022014119A1 (ja) 2022-01-20
CN115836220A (zh) 2023-03-21
US20230243787A1 (en) 2023-08-03
CN115836220B (zh) 2025-01-17
JP7414146B2 (ja) 2024-01-16

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