JP7201595B2 - スパッタリングターゲット、酸化物半導体膜の成膜方法、およびバッキングプレート - Google Patents
スパッタリングターゲット、酸化物半導体膜の成膜方法、およびバッキングプレート Download PDFInfo
- Publication number
- JP7201595B2 JP7201595B2 JP2019534557A JP2019534557A JP7201595B2 JP 7201595 B2 JP7201595 B2 JP 7201595B2 JP 2019534557 A JP2019534557 A JP 2019534557A JP 2019534557 A JP2019534557 A JP 2019534557A JP 7201595 B2 JP7201595 B2 JP 7201595B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- sputtering target
- sintered body
- oxide sintered
- less
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005477 sputtering target Methods 0.000 title claims description 206
- 239000004065 semiconductor Substances 0.000 title claims description 29
- 238000000034 method Methods 0.000 title claims description 26
- 239000011701 zinc Substances 0.000 claims description 37
- 125000006850 spacer group Chemical group 0.000 claims description 29
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 22
- 230000010355 oscillation Effects 0.000 claims description 14
- 150000001875 compounds Chemical class 0.000 claims description 11
- 238000005452 bending Methods 0.000 claims description 8
- 229910052596 spinel Inorganic materials 0.000 claims description 6
- 239000011029 spinel Substances 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 5
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 4
- 229910052725 zinc Inorganic materials 0.000 claims description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 3
- 239000010408 film Substances 0.000 description 58
- 230000015572 biosynthetic process Effects 0.000 description 26
- 230000008646 thermal stress Effects 0.000 description 23
- 230000003628 erosive effect Effects 0.000 description 22
- 238000012360 testing method Methods 0.000 description 19
- 238000004544 sputter deposition Methods 0.000 description 17
- 238000005336 cracking Methods 0.000 description 12
- 238000004904 shortening Methods 0.000 description 9
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 230000002159 abnormal effect Effects 0.000 description 6
- 239000013078 crystal Substances 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 239000002994 raw material Substances 0.000 description 6
- 238000009826 distribution Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 238000002441 X-ray diffraction Methods 0.000 description 4
- 238000005219 brazing Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 230000000704 physical effect Effects 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 229910007541 Zn O Inorganic materials 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910003107 Zn2SnO4 Inorganic materials 0.000 description 1
- 229910007604 Zn—Sn—O Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 230000036470 plasma concentration Effects 0.000 description 1
- 238000013001 point bending Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3423—Shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3435—Target holders (includes backing plates and endblocks)
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3284—Zinc oxides, zincates, cadmium oxides, cadmiates, mercury oxides, mercurates or oxide forming salts thereof
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3286—Gallium oxides, gallates, indium oxides, indates, thallium oxides, thallates or oxide forming salts thereof, e.g. zinc gallate
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3293—Tin oxides, stannates or oxide forming salts thereof, e.g. indium tin oxide [ITO]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Ceramic Engineering (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Structural Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017149399 | 2017-08-01 | ||
JP2017149399 | 2017-08-01 | ||
PCT/JP2018/028843 WO2019026955A1 (ja) | 2017-08-01 | 2018-08-01 | スパッタリングターゲット、酸化物半導体膜の成膜方法、およびバッキングプレート |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2019026955A1 JPWO2019026955A1 (ja) | 2020-09-10 |
JP7201595B2 true JP7201595B2 (ja) | 2023-01-10 |
Family
ID=65233974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019534557A Active JP7201595B2 (ja) | 2017-08-01 | 2018-08-01 | スパッタリングターゲット、酸化物半導体膜の成膜方法、およびバッキングプレート |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7201595B2 (ko) |
KR (1) | KR102535445B1 (ko) |
CN (1) | CN110892089B (ko) |
TW (1) | TWI803501B (ko) |
WO (1) | WO2019026955A1 (ko) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002173766A (ja) | 2000-12-01 | 2002-06-21 | Toshiba Corp | スパッタリングターゲットおよびそれを具備するスパッタリング装置 |
JP2004083985A (ja) | 2002-08-26 | 2004-03-18 | Mitsui Mining & Smelting Co Ltd | スパッタリングターゲットおよびその製造方法 |
JP2007505217A (ja) | 2003-09-09 | 2007-03-08 | プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド | 長寿命スパッタ用ターゲット |
WO2009069658A1 (ja) | 2007-11-28 | 2009-06-04 | Mitsui Mining & Smelting Co., Ltd. | スパッタリングターゲット材およびこれから得られるスパッタリングターゲット |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01290764A (ja) | 1988-05-16 | 1989-11-22 | Tosoh Corp | 透明導電膜用スパッタリングターゲット |
JPH03287763A (ja) | 1990-04-04 | 1991-12-18 | Sumitomo Metal Ind Ltd | マグネトロン・スパッタリング用ターゲット |
JPH05287522A (ja) | 1992-04-10 | 1993-11-02 | Asahi Glass Co Ltd | セラミックス製スパッタターゲット |
JPH06172991A (ja) | 1992-11-30 | 1994-06-21 | Mitsui Mining & Smelting Co Ltd | マグネトロンスパッタリング用セラミックスターゲット |
TW381123B (en) * | 1997-02-28 | 2000-02-01 | Tosoh Corp | A process for surface-treating a sputtering target |
JP4081840B2 (ja) * | 1997-02-28 | 2008-04-30 | 東ソー株式会社 | スパッタリングターゲットの製造方法 |
JP3760652B2 (ja) | 1999-01-08 | 2006-03-29 | 東ソー株式会社 | 多分割スパッタリングターゲット |
CN100537822C (zh) * | 2006-07-31 | 2009-09-09 | 北京有色金属研究总院 | 金属基带上连续生长的多层立方织构隔离层的制备方法 |
JP2008038229A (ja) | 2006-08-09 | 2008-02-21 | Mitsui Mining & Smelting Co Ltd | スパッタリング方法およびそれに用いられるスパッタリングターゲット |
JP5651095B2 (ja) | 2010-11-16 | 2015-01-07 | 株式会社コベルコ科研 | 酸化物焼結体およびスパッタリングターゲット |
JP5750063B2 (ja) * | 2011-02-10 | 2015-07-15 | 株式会社コベルコ科研 | 酸化物焼結体およびスパッタリングターゲット |
KR102142845B1 (ko) | 2012-05-31 | 2020-08-10 | 이데미쓰 고산 가부시키가이샤 | 스퍼터링 타겟 |
JP6731147B2 (ja) | 2015-08-10 | 2020-07-29 | 日立金属株式会社 | 酸化物スパッタリングターゲット材 |
-
2018
- 2018-08-01 CN CN201880047311.XA patent/CN110892089B/zh active Active
- 2018-08-01 JP JP2019534557A patent/JP7201595B2/ja active Active
- 2018-08-01 WO PCT/JP2018/028843 patent/WO2019026955A1/ja active Application Filing
- 2018-08-01 KR KR1020207000896A patent/KR102535445B1/ko active IP Right Grant
- 2018-08-01 TW TW107126734A patent/TWI803501B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002173766A (ja) | 2000-12-01 | 2002-06-21 | Toshiba Corp | スパッタリングターゲットおよびそれを具備するスパッタリング装置 |
JP2004083985A (ja) | 2002-08-26 | 2004-03-18 | Mitsui Mining & Smelting Co Ltd | スパッタリングターゲットおよびその製造方法 |
JP2007505217A (ja) | 2003-09-09 | 2007-03-08 | プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド | 長寿命スパッタ用ターゲット |
WO2009069658A1 (ja) | 2007-11-28 | 2009-06-04 | Mitsui Mining & Smelting Co., Ltd. | スパッタリングターゲット材およびこれから得られるスパッタリングターゲット |
Also Published As
Publication number | Publication date |
---|---|
KR102535445B1 (ko) | 2023-05-22 |
CN110892089A (zh) | 2020-03-17 |
WO2019026955A1 (ja) | 2019-02-07 |
JPWO2019026955A1 (ja) | 2020-09-10 |
CN110892089B (zh) | 2022-05-24 |
KR20200037209A (ko) | 2020-04-08 |
TWI803501B (zh) | 2023-06-01 |
TW201917109A (zh) | 2019-05-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI791835B (zh) | 高壓崩潰漸縮型垂直導電接面電晶體 | |
JP6397878B2 (ja) | 半導体装置の作製方法 | |
Park et al. | Simulation study of enhancement mode multi-gate vertical gallium oxide MOSFETs | |
KR20190034547A (ko) | 반도체 장치, 반도체 모듈, 및 반도체 패키지 장치 | |
CN106571363B (zh) | 半导体器件 | |
US11107915B2 (en) | Semiconductor device | |
Moroz et al. | The impact of defects on GaN device behavior: Modeling dislocations, traps, and pits | |
JP5801500B2 (ja) | 反応性スパッタ装置 | |
JP6242997B2 (ja) | トランジスタ、半導体装置 | |
Ma et al. | 1200 V multi-channel power devices with 2.8 Ω• mm ON-resistance | |
JP7201595B2 (ja) | スパッタリングターゲット、酸化物半導体膜の成膜方法、およびバッキングプレート | |
CN105322020A (zh) | 高压金属氧化物半导体器件及其形成方法 | |
KR101643510B1 (ko) | 타겟 조립체 | |
TWI809039B (zh) | 磁控濺鍍裝置的磁體集合體 | |
Naydenov et al. | Operation and performance of the 4H-SiC junctionless FinFET | |
Ishida et al. | Impact of channel mobility on design optimization of 600–3300 V-class high-speed GaN vertical-trench MOSFETs based on TCAD simulation | |
Iskandarova et al. | The role of neutral point defects in carrier mobility degradation in bulk 4H-SiC and at 4H-SiC/SiO2 interface: First-principles investigation using Green's functions | |
JP7487739B2 (ja) | 半導体チップ及び半導体チップの製造方法 | |
TWI588283B (zh) | 濺鍍靶材組裝體 | |
Eremin et al. | Operation of voltage termination structure in silicon n+-p-p+ detectors with Al2O3 field isolator grown by atomic layer deposition method | |
TW201127975A (en) | Thin film forming device, production method of thin film, and production method of electronic component | |
Dannecker et al. | Design and simulation of gallium nitride trench MOSFETs for applications with high lifetime demand | |
JP6022838B2 (ja) | 酸化物半導体膜の評価方法 | |
Rahman et al. | Analytical optimization of AlGaN/GaN/AlGaN DH-HEMT device performance based on buffer characteristics | |
US9006798B2 (en) | Semiconductor device including trench transistor cell array and manufacturing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20210402 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20220208 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20220408 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20220816 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20221111 |
|
C60 | Trial request (containing other claim documents, opposition documents) |
Free format text: JAPANESE INTERMEDIATE CODE: C60 Effective date: 20221111 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20221118 |
|
C21 | Notice of transfer of a case for reconsideration by examiners before appeal proceedings |
Free format text: JAPANESE INTERMEDIATE CODE: C21 Effective date: 20221122 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20221206 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20221222 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7201595 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |