JP7101374B2 - 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 - Google Patents
垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 Download PDFInfo
- Publication number
- JP7101374B2 JP7101374B2 JP2021128821A JP2021128821A JP7101374B2 JP 7101374 B2 JP7101374 B2 JP 7101374B2 JP 2021128821 A JP2021128821 A JP 2021128821A JP 2021128821 A JP2021128821 A JP 2021128821A JP 7101374 B2 JP7101374 B2 JP 7101374B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- semiconductor
- semiconductor layer
- gan
- refractive index
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18344—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] characterized by the mesa, e.g. dimensions or shape of the mesa
- H01S5/1835—Non-circular mesa
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/26—Reflecting filters
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
- H01S5/04253—Electrodes, e.g. characterised by the structure characterised by the material having specific optical properties, e.g. transparent electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
- H01S5/18369—Structure of the reflectors, e.g. hybrid mirrors based on dielectric materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/173—The laser chip comprising special buffer layers, e.g. dislocation prevention or reduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/04—MOCVD or MOVPE
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04256—Electrodes, e.g. characterised by the structure characterised by the configuration
- H01S5/04257—Electrodes, e.g. characterised by the structure characterised by the configuration having positive and negative electrodes on the same side of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3054—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping
- H01S5/3063—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping using Mg
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Semiconductor Lasers (AREA)
Description
例1と同様に、InAlN層L1及びGaN層H1の界面の平坦性が向上していることがわかる。従って、GaN層H1が第1及び第2のGaN層H11及びH12を有する場合、第1及び第2のGaN層H11及びH12のいずれか一方がドーパントを有していればよい。なお、実施例2のように、第2のGaN層H12がドーパントを有する場合でも、そのドーパントはMgでもよいことが推察される。
ML 半導体多層膜反射鏡
L1 InAlN層
H11 第1のGaN層
H12 第2のGaN層
Claims (9)
- 第1の反射鏡と、
前記第1の反射鏡上に積層された、第1の導電型を有する第1の半導体層、活性層及び前記第1の導電型とは反対の第2の導電型を有する第2の半導体層を含む半導体構造層と、
前記半導体構造層上に積層され前記第1の反射鏡に対向する第2の反射鏡と、
部分的に露出した前記第1の半導体層の上面上に形成された第1電極と、
前記第2の半導体層上に形成された第2電極と、を有し、
前記第1の反射鏡は、ノンドープのInAlN層からなる低屈折率半導体層と前記低屈折率半導体層上に形成されかつドーパントを含むGaN層からなる高屈折率半導体層とが複数回積層された半導体多層膜からなり、前記半導体多層膜は全体として非導電性であることを特徴とする垂直共振器型発光素子。 - 前記第1の半導体層及び前記第2の半導体層はGaNであることを特徴とする請求項1に記載の垂直共振器型発光素子。
- 前記第2電極は、前記第2の半導体層側に形成された透光電極と、当該透光電極上に形成された接続電極と、を含み、
前記第2の反射鏡は、前記透光電極及び前記半導体構造層を挟んで前記第1の反射鏡に対向している誘電体多層膜反射鏡であることを特徴とする請求項1又は2に記載の垂直共振器型発光素子。 - 前記活性層はInGaN層及びGaN層からなる多重量子井戸構造を有し、
前記活性層と前記第2の半導体層との間にAlGaN層からなる電子ブロック層をさらに有していることを特徴とする請求項1乃至3のいずれか1項に記載の垂直共振器型発光素子。 - 前記ドーパントはSiもしくはMgであることを特徴とする請求項1乃至4のいずれか1項に記載の垂直共振器型発光素子。
- 前記ドーパントはSiであり、
前記高屈折率半導体層は、3×1018個/cm3以上のSi濃度を有することを特徴とする請求項5に記載の垂直共振器型発光素子。 - 前記高屈折率半導体層の各々は第1のGaN層、第2のGaN層がこの順に前記低屈折率半導体層上に積層された層構造を有し、前記ドーパントは前記第2のGaN層に含まれることを特徴とする請求項1乃至6のいずれか1項に記載の垂直共振器型発光素子。
- 基板を準備する工程と、
前記基板上に、ノンドープのInAlN層からなる低屈折率半導体層と、前記低屈折率半導体層上にドーパントを含むGaN層からなる高屈折率半導体層とを複数回積層して、全体としては非導電性の半導体多層膜である第1の反射鏡を形成する工程と、
前記第1の反射鏡上に、第1の導電型を有する第1の半導体層、活性層及び前記第1の導電型とは反対の第2の導電型を有する第2の半導体層を含む半導体構造層を積層する工程と、
前記半導体構造層上に第2の反射鏡を形成する工程と、
前記第2の半導体層及び前記活性層を部分的に除去し露出された前記第1の半導体層の上面上に第1電極を形成する工程と、
前記第2の半導体層上に第2電極を形成する工程と、を有することを特徴とする垂直共振器型発光素子の製造方法。 - 前記第1の反射鏡を形成する工程において、
前記高屈折率半導体層の形成は、前記低屈折率半導体層上に相対的に低温で第1のGaN層を積層する工程と、前記第1のGaN層上に相対的に高温で第2のGaN層を積層する工程と、によって行われ、
前記ドーパントは少なくても前記第2のGaN層に含ませることを特徴とする請求項8に記載の垂直共振器型発光素子の製造方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021128821A JP7101374B2 (ja) | 2017-03-27 | 2021-08-05 | 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017060345A JP6932345B2 (ja) | 2017-03-27 | 2017-03-27 | 半導体多層膜反射鏡及び垂直共振器型発光素子 |
JP2021128821A JP7101374B2 (ja) | 2017-03-27 | 2021-08-05 | 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017060345A Division JP6932345B2 (ja) | 2017-03-27 | 2017-03-27 | 半導体多層膜反射鏡及び垂直共振器型発光素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2021170686A JP2021170686A (ja) | 2021-10-28 |
JP7101374B2 true JP7101374B2 (ja) | 2022-07-15 |
Family
ID=63675601
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017060345A Active JP6932345B2 (ja) | 2017-03-27 | 2017-03-27 | 半導体多層膜反射鏡及び垂直共振器型発光素子 |
JP2021128821A Active JP7101374B2 (ja) | 2017-03-27 | 2021-08-05 | 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017060345A Active JP6932345B2 (ja) | 2017-03-27 | 2017-03-27 | 半導体多層膜反射鏡及び垂直共振器型発光素子 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11146040B2 (ja) |
JP (2) | JP6932345B2 (ja) |
WO (1) | WO2018180450A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7166871B2 (ja) * | 2018-10-18 | 2022-11-08 | スタンレー電気株式会社 | 垂直共振器型発光素子 |
JP7109079B2 (ja) * | 2018-12-06 | 2022-07-29 | 学校法人 名城大学 | 窒化物半導体多層膜反射鏡 |
JP2020188143A (ja) * | 2019-05-15 | 2020-11-19 | スタンレー電気株式会社 | 半導体多層膜反射鏡を用いた垂直共振器型発光素子及びその製造方法 |
JPWO2022004146A1 (ja) * | 2020-06-30 | 2022-01-06 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000082866A (ja) | 1998-07-06 | 2000-03-21 | Matsushita Electric Ind Co Ltd | 窒化物半導体レ―ザ素子及びその製造方法 |
JP2001284291A (ja) | 2000-03-31 | 2001-10-12 | Toyoda Gosei Co Ltd | 半導体ウエハーのチップ分割方法 |
JP2009200478A (ja) | 2008-01-21 | 2009-09-03 | Sanyo Electric Co Ltd | 半導体レーザ素子およびその製造方法 |
JP2011227980A (ja) | 2010-03-29 | 2011-11-10 | Sanyo Electric Co Ltd | 光ピックアップ装置 |
JP2011243857A (ja) | 2010-05-20 | 2011-12-01 | Nec Corp | 半導体基板の製造方法 |
WO2017055490A1 (de) | 2015-10-01 | 2017-04-06 | Osram Opto Semiconductors Gmbh | Optoelektronisches bauelement |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08172238A (ja) * | 1994-12-16 | 1996-07-02 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レーザ素子の製法 |
US6121638A (en) * | 1995-09-12 | 2000-09-19 | Kabushiki Kaisha Toshiba | Multi-layer structured nitride-based semiconductor devices |
JP3304787B2 (ja) * | 1996-09-08 | 2002-07-22 | 豊田合成株式会社 | 半導体発光素子及びその製造方法 |
US5834331A (en) * | 1996-10-17 | 1998-11-10 | Northwestern University | Method for making III-Nitride laser and detection device |
KR100304881B1 (ko) * | 1998-10-15 | 2001-10-12 | 구자홍 | Gan계화합물반도체및그의결정성장방법 |
JP4342134B2 (ja) * | 2000-12-28 | 2009-10-14 | 日亜化学工業株式会社 | 窒化物半導体レーザ素子 |
US6822272B2 (en) | 2001-07-09 | 2004-11-23 | Nichia Corporation | Multilayered reflective membrane and gallium nitride-based light emitting element |
JP4360066B2 (ja) * | 2001-07-09 | 2009-11-11 | 日亜化学工業株式会社 | 窒化ガリウム系発光素子 |
US6526083B1 (en) * | 2001-10-09 | 2003-02-25 | Xerox Corporation | Two section blue laser diode with reduced output power droop |
US6515308B1 (en) * | 2001-12-21 | 2003-02-04 | Xerox Corporation | Nitride-based VCSEL or light emitting diode with p-n tunnel junction current injection |
JP5189734B2 (ja) * | 2006-01-24 | 2013-04-24 | ローム株式会社 | 窒化物半導体発光素子 |
JP5515575B2 (ja) * | 2009-09-30 | 2014-06-11 | 住友電気工業株式会社 | Iii族窒化物半導体光素子、エピタキシャル基板、及びiii族窒化物半導体光素子を作製する方法 |
JP6159642B2 (ja) * | 2013-10-16 | 2017-07-05 | 学校法人 名城大学 | 発光素子 |
JP2016111131A (ja) | 2014-12-04 | 2016-06-20 | 学校法人 名城大学 | 周期利得活性層を有する窒化物半導体発光素子 |
-
2017
- 2017-03-27 JP JP2017060345A patent/JP6932345B2/ja active Active
-
2018
- 2018-03-13 US US16/498,385 patent/US11146040B2/en active Active
- 2018-03-13 WO PCT/JP2018/009656 patent/WO2018180450A1/ja active Application Filing
-
2021
- 2021-08-05 JP JP2021128821A patent/JP7101374B2/ja active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000082866A (ja) | 1998-07-06 | 2000-03-21 | Matsushita Electric Ind Co Ltd | 窒化物半導体レ―ザ素子及びその製造方法 |
JP2001284291A (ja) | 2000-03-31 | 2001-10-12 | Toyoda Gosei Co Ltd | 半導体ウエハーのチップ分割方法 |
JP2009200478A (ja) | 2008-01-21 | 2009-09-03 | Sanyo Electric Co Ltd | 半導体レーザ素子およびその製造方法 |
JP2011227980A (ja) | 2010-03-29 | 2011-11-10 | Sanyo Electric Co Ltd | 光ピックアップ装置 |
JP2011243857A (ja) | 2010-05-20 | 2011-12-01 | Nec Corp | 半導体基板の製造方法 |
WO2017055490A1 (de) | 2015-10-01 | 2017-04-06 | Osram Opto Semiconductors Gmbh | Optoelektronisches bauelement |
Also Published As
Publication number | Publication date |
---|---|
US11146040B2 (en) | 2021-10-12 |
JP2018163991A (ja) | 2018-10-18 |
JP6932345B2 (ja) | 2021-09-08 |
JP2021170686A (ja) | 2021-10-28 |
US20210111538A1 (en) | 2021-04-15 |
WO2018180450A1 (ja) | 2018-10-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7101374B2 (ja) | 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 | |
KR102320790B1 (ko) | 자외선 발광 다이오드 및 그 제조 방법 | |
JP6819956B2 (ja) | 半導体多層膜反射鏡、これを用いた垂直共振器型発光素子及びこれらの製造方法。 | |
JP2010177651A (ja) | 半導体レーザ素子 | |
JP2007158285A (ja) | Iii族窒化物基反射器を製造する方法 | |
JP6654069B2 (ja) | 半導体発光素子及びその製造方法 | |
WO2020230669A1 (ja) | 半導体多層膜反射鏡を用いた垂直共振器型発光素子及びその製造方法 | |
TWI381557B (zh) | 發光二極體裝置及其製造方法 | |
US10116120B2 (en) | Semiconductor multilayer film mirror, vertical cavity type light-emitting element using the mirror, and methods for manufacturing the mirror and the element | |
JP2010272593A (ja) | 窒化物半導体発光素子及びその製造方法 | |
JP2004247563A (ja) | 半導体素子 | |
JP2017204579A (ja) | 垂直共振器型発光素子及び垂直共振器型発光素子の製造方法 | |
JP2000091701A (ja) | 反射鏡、半導体レーザ、反射鏡の形成方法および半導体レーザの製造方法 | |
JP2008177438A (ja) | 窒化物半導体発光素子 | |
JP2009212343A (ja) | 窒化物半導体素子および窒化物半導体素子の製造方法 | |
JP3455500B2 (ja) | 半導体レーザ及び半導体レーザの製造方法 | |
KR100809226B1 (ko) | 질화물 반도체 발광 소자 및 제조방법 | |
WO2002069466A1 (fr) | Element et substrat semi-conducteurs en nitrure du groupe iii | |
JP2009049221A (ja) | 半導体発光素子 | |
US20230144914A1 (en) | Method of manufacturing vertical cavity surface emitting laser element and vertical cavity surface emitting laser element | |
US12009637B2 (en) | Semiconductor light emitting device | |
US20210328410A1 (en) | Semiconductor light emitting device | |
JP4057473B2 (ja) | 化合物半導体発光素子及びその製造方法 | |
JP3456980B2 (ja) | 化合物半導体層の形成方法 | |
JP2003234544A (ja) | 窒化物系半導体レーザ素子とその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20210805 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20220520 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20220607 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20220624 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7101374 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |