JP7065159B2 - 表示装置とその製造方法 - Google Patents
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- 238000004519 manufacturing process Methods 0.000 title claims description 20
- 125000006850 spacer group Chemical group 0.000 claims description 103
- 230000000903 blocking effect Effects 0.000 claims description 73
- 239000011368 organic material Substances 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 24
- 239000003989 dielectric material Substances 0.000 claims description 23
- 238000005530 etching Methods 0.000 claims description 17
- 238000000151 deposition Methods 0.000 claims description 15
- 239000004973 liquid crystal related substance Substances 0.000 claims description 15
- 238000006243 chemical reaction Methods 0.000 claims description 14
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- 238000001312 dry etching Methods 0.000 claims description 10
- 239000012495 reaction gas Substances 0.000 claims description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 claims description 4
- 239000000463 material Substances 0.000 description 32
- 229920002120 photoresistant polymer Polymers 0.000 description 16
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- 239000003086 colorant Substances 0.000 description 6
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- 239000002184 metal Substances 0.000 description 6
- 150000004767 nitrides Chemical class 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
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- 238000005452 bending Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 238000004806 packaging method and process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- -1 titanium nitride Chemical class 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910016570 AlCu Inorganic materials 0.000 description 1
- 241001391944 Commicarpus scandens Species 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- WPPDFTBPZNZZRP-UHFFFAOYSA-N aluminum copper Chemical compound [Al].[Cu] WPPDFTBPZNZZRP-UHFFFAOYSA-N 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 230000003190 augmentative effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
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- 230000009467 reduction Effects 0.000 description 1
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- 230000000717 retained effect Effects 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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Description
110、310:集積回路
120、320:絶縁層
122、322:ビアプラグ
124:バリア層
140、140a、140b:有機発光ダイオードユニット
142、330:第1の電極
142':電極層
142t:上面
142b:下面
142s:斜面
144、144'、146、146'、340、342:ブロッキング層
1462:第1の部分
1464:第2の部分
148、148a、148b、350:スペーサー層
1482:第1の段部
1484:第2の段部
1486:第3の段部
148':誘電体材料層
150、150a、150b:有機材料積層体
152、380:第2の電極
160、162:パターン化フォトレジスト層
200:ヘッドマウントデバイス
210:フレーム
212:耳掛け部
214:パネル部
220:投影装置
222:光源
224:光学アセンブリ
226、300:LCOS表示パネル
230:画像形成スクリーン
360:対向基板
370:液晶層
G:段差
θ:夾角
O1、O1a、O1b:開口領域
R:領域
t3、t4、t5、t5b、t6、t6b:厚さ
S10、S20、S30、S40、S50、S60、S70、S80、S90、S100:工程
Claims (9)
- 集積回路と、
前記集積回路に電気的に接続され、上面、下面、及び前記上面と前記下面とを接続する斜面を有し、前記斜面と前記下面との夾角が約45度~約80度である第1の電極と、
前記第1の電極の前記斜面を被覆するスペーサー層と、
前記第1の電極に設けられる有機材料積層体と、
前記有機材料積層体と前記スペーサー層に設けられる第2の電極と、
を備える有機発光ダイオード表示装置。 - 前記第2の電極は、うねった上面を有する請求項1に記載の有機発光ダイオード表示装置。
- 前記第1の電極の前記上面に設けられるブロッキング層を更に備え、前記ブロッキング層の前記スペーサー層と前記第1の電極との間での第1の部分の厚さが前記ブロッキング層の前記第1の電極と前記有機材料積層体との間での第2の部分の厚さよりも大きい請求項1に記載の有機発光ダイオード表示装置。
- 電極層を絶縁層に形成し、前記電極層が前記絶縁層におけるビアプラグを介して集積回路に電気的に接続される工程と、
前記電極層をエッチングして、第1の電極を取得し、前記電極層に対するエッチングがドライエッチングであり、前記ドライエッチングの反応ガスが塩化ホウ素(BCl3)を含み、これにより、前記第1の電極に上面、下面及び前記上面と前記下面とを接続する斜面を持たせる工程と、
前記第1の電極の前記斜面を被覆するスペーサー層を形成する工程と、
有機材料積層体を前記第1の電極に形成する工程と、
第2の電極を前記有機材料積層体と前記スペーサー層に形成する工程と、
を備える有機発光ダイオード表示装置の製造方法であって、
前記スペーサー層を形成する工程は、
厚さが約100Å~約400Åである誘電体材料層を前記第1の電極に堆積させることと、
前記有機材料積層体が充填される開口領域を前記第1の電極に定義するように、前記誘電体材料層の一部を除去することと、を含む、
有機発光ダイオード表示装置の製造方法。 - 前記誘電体材料層を前記第1の電極に堆積させる前に、厚さが約30Å~約200Åであるブロッキング層を前記第1の電極に形成することを更に備える請求項4に記載の方法。
- 前記開口領域を前記第1の電極に定義するように前記誘電体材料層の一部を除去することは、
前記ブロッキング層の前記スペーサー層と前記第1の電極との間での第1の部分の厚さが前記ブロッキング層の前記第1の電極と前記有機材料積層体との間での第2の部分の厚さよりも大きくするように、前記ブロッキング層の一部を除去することを備える請求項5に記載の方法。 - 前記反応ガスの流量は、約50sccm~約500sccmである請求項4に記載の方法。
- 電極層を絶縁層に形成し、前記電極層が前記絶縁層におけるビアプラグを介して集積回路に電気的に接続され、且つ前記電極層を形成する堆積速率が毎秒約30Å~毎秒約200Åであり、これにより、前記電極層の厚さが約300Å~約900Åにある工程と、
前記電極層をエッチングして、第1の電極を取得する工程と、
前記第1の電極の側壁を被覆するスペーサー層を形成する工程と、
液晶層と第2の電極を前記第1の電極と前記スペーサー層に形成する工程と、
を備える液晶オンシリコン(Liquid Crystal on Silicon;LCOS)表示パネルの製造方法。 - 前記電極層を形成する反応パワーは、約1500W~約3150Wである請求項8に記載の方法。
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CN201910899516.7 | 2019-09-23 | ||
CN201910899516.7A CN112542485A (zh) | 2019-09-23 | 2019-09-23 | 显示设备与其制作方法 |
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JP2021051304A JP2021051304A (ja) | 2021-04-01 |
JP7065159B2 true JP7065159B2 (ja) | 2022-05-11 |
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CN112542485A (zh) | 2021-03-23 |
KR20210035749A (ko) | 2021-04-01 |
JP2021051304A (ja) | 2021-04-01 |
US20210091329A1 (en) | 2021-03-25 |
TWI761925B (zh) | 2022-04-21 |
TW202114209A (zh) | 2021-04-01 |
KR102452010B1 (ko) | 2022-10-06 |
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