JP6924208B2 - マルチウェルセレンデバイス及びその製作方法 - Google Patents
マルチウェルセレンデバイス及びその製作方法 Download PDFInfo
- Publication number
- JP6924208B2 JP6924208B2 JP2018554649A JP2018554649A JP6924208B2 JP 6924208 B2 JP6924208 B2 JP 6924208B2 JP 2018554649 A JP2018554649 A JP 2018554649A JP 2018554649 A JP2018554649 A JP 2018554649A JP 6924208 B2 JP6924208 B2 JP 6924208B2
- Authority
- JP
- Japan
- Prior art keywords
- dielectric layer
- conductive grid
- grid electrode
- layer
- well
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000011669 selenium Substances 0.000 title claims description 35
- 238000004519 manufacturing process Methods 0.000 title claims description 23
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 title claims description 20
- 229910052711 selenium Inorganic materials 0.000 title claims description 20
- 238000005530 etching Methods 0.000 claims description 53
- 239000000758 substrate Substances 0.000 claims description 41
- 238000000151 deposition Methods 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 18
- 230000005684 electric field Effects 0.000 description 16
- 230000005855 radiation Effects 0.000 description 15
- 238000006243 chemical reaction Methods 0.000 description 13
- 239000007787 solid Substances 0.000 description 13
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 11
- 238000001020 plasma etching Methods 0.000 description 9
- 238000001312 dry etching Methods 0.000 description 8
- 238000003384 imaging method Methods 0.000 description 8
- 239000012212 insulator Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 239000004642 Polyimide Substances 0.000 description 6
- 230000008021 deposition Effects 0.000 description 6
- 229920001721 polyimide Polymers 0.000 description 6
- 238000002600 positron emission tomography Methods 0.000 description 6
- 239000011651 chromium Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000000206 photolithography Methods 0.000 description 5
- 238000000231 atomic layer deposition Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000007493 shaping process Methods 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 3
- 229910052681 coesite Inorganic materials 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 229910052906 cristobalite Inorganic materials 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 229920002313 fluoropolymer Polymers 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 238000002161 passivation Methods 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 229910052682 stishovite Inorganic materials 0.000 description 3
- 229910052905 tridymite Inorganic materials 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000000609 electron-beam lithography Methods 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 239000010437 gem Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000002784 hot electron Substances 0.000 description 2
- 230000002427 irreversible effect Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 230000004807 localization Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 206010028980 Neoplasm Diseases 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000013475 authorization Methods 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006931 brain damage Effects 0.000 description 1
- 231100000874 brain damage Toxicity 0.000 description 1
- 208000029028 brain injury Diseases 0.000 description 1
- 201000011510 cancer Diseases 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000003759 clinical diagnosis Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001017 electron-beam sputter deposition Methods 0.000 description 1
- 238000000313 electron-beam-induced deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 208000019622 heart disease Diseases 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- MYWUZJCMWCOHBA-VIFPVBQESA-N methamphetamine Chemical compound CN[C@@H](C)CC1=CC=CC=C1 MYWUZJCMWCOHBA-VIFPVBQESA-N 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 238000009206 nuclear medicine Methods 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- HUAUNKAZQWMVFY-UHFFFAOYSA-M sodium;oxocalcium;hydroxide Chemical compound [OH-].[Na+].[Ca]=O HUAUNKAZQWMVFY-UHFFFAOYSA-M 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0272—Selenium or tellurium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/1461—Pixel-elements with integrated switching, control, storage or amplification elements characterised by the photosensitive area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1463—Pixel isolation structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14634—Assemblies, i.e. Hybrid structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14636—Interconnect structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
- H01L27/14659—Direct radiation imagers structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14696—The active layers comprising only AIIBVI compounds, e.g. CdS, ZnS, CdTe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035209—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0376—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including amorphous semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the PIN type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier working in avalanche mode, e.g. avalanche photodiode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14632—Wafer-level processed structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14692—Thin film technologies, e.g. amorphous, poly, micro- or nanocrystalline silicon
Description
本出願は、2016年1月7日に米国特許商標庁に出願された米国仮特許出願第62/275,919号に対する優先権を主張するものであり、この文献の開示は全体が引用により本明細書に組み入れられる。
本発明は、国立衛生研究所によって授与された認可番号1R21 EB01952601A1に基づき政府の支援を受けて行われたものである。政府は、本発明における一定の権利を有する。
Δx=cΔt/2 (1)
ここでのcは、光の速度である。TOF PET検出器の目標は、Δt<10ピコ秒(ps)になることである。しかしながら、この目標は達成されていない。
アルミニウムスパッタリングによって基板260上に画素電極230を堆積させ、
コンタクトフォトリソグラフィを用いて画素電極230をパターン形成し、
スピンキャストポリイミドを介して第1の誘電体層241を堆積させ、
ポリイミドを硬化させ、
タングステンスパッタリングを通じて第1の誘電体層241上に第1の導電グリッド電極層251を堆積させ、
タングステンスパッタリングを通じて第1の導電グリッド電極層251上に第2の誘電体層242を堆積させ、
スピンキャストポリイミドを介して第2の導電グリッド電極層252上に第3の誘電体層243を堆積させ、
ポリイミドを硬化させ、
Crのスパッタリングを通じて第3の誘電体層243上にエッチングマスク層280を堆積させ、
コンタクトフォトリソグラフィを用いてエッチングマスク層280をパターン形成し、
RIEシステムを用いてCrエッチングを行い、
画素電極に達するまでウェルをエッチングする。
画素電極までのウェルのエッチングは、以下のステップによって行うことが好ましい。
ICP深掘りRIEシステム内で酸素プラズマ(02プラズマ)を用いて第3の誘電体層243を異方性エッチングし、
SF6プラズマを用いたWのドライエッチングを通じて第2の導電グリッド電極層252をエッチングし、
ICP深掘りRIEシステム内で02プラズマを用いて第2の誘電体層を異方性エッチングし、
SFGプラズマを用いたWのドライエッチングを通じて第1の導電グリッド電極層をエッチングし、
ICP深掘りRIEシステム内で02プラズマを用いて第1の誘電体層241を異方性エッチングする。
[1]:J.A.Rowlands及びS.Kasap著、「デジタルX線撮像における非晶質半導体アッシャ(Amorphous Semiconductors Usher in Digital X−Ray Imaging)」、Phys. Today、50(11):24−30、1997年
[2]:N.F.Mott著、「非結晶系の伝導VII、非オーム挙動及びスイッチング(Conduction in non−crystalline systems VII. Non−ohmic behavior and switching)」、Phil. Mag.、24(190):911−934、1971年
[3]:G.Juska及びK.Arlauskas著、「非晶質セレンの高電界における電荷キャリアの衝突電離及び移動度(Impact ionization and mobilities of charge carriers at high electric fields in amorphous selenium)」、Phys. Stat. Sol.(a)、59(l):389−393、1980年
[4]:M.M.Wronski及びJ.A.Rowlands著、「アバランシェ利得を有する直接変換型フラットパネルイメージャ:HARP−AMFPIの実現可能性調査(Direct−conversion flat−panel imager with avalanche gain: Feasibility investigation for HARP−AMFPI)」、Medical Physics、35(12):5207−5218、2008年
[5]:M.M.Wronski、W.Zhao、A.Reznik、G.DeCrescenzo、K.Tanioka、及びJ.A.Rowlands著、「低光子束撮像用途のための固体非晶質セレンアバランシェ技術(A solid−state amorphous selenium avalanche technology for low photon flux imaging applications)」、Med. Phys.37(9):4982、2010年
[6]:G.Juska、K.Arlauskas、J.Kocka、M.Hoheisel、及びP.Chabloz著、「非晶質シリコンにおけるホットエレクトロン(Hot Electrons in Amorphous Silicon)」、Physical Review Letters、75:2984−2987、1995年
[7]:K.Tanioka著、「超高感度TV撮像管の概念から新展開まで(The ultrasensitive TV pickup tube from conception to recent development)」、J. Mater. Sci.:Mater. Electron.、18(0):321−325、2007年
[8]:内容が引用により本明細書に組み入れられる、Lee他に付与された米国特許第6,437,339号明細書
[9]:D.L.Y.Lee著、「セレン電荷利得のためのグリッドを有するセレン検出器(Selenium detector with a grid for selenium charge gain)」、Proceedings of SPIE(SPIE議事録)、5745:216−222、2005年
[10]:D.C.Hunt、K.Tanioka、及びJ.A.Rowlands著、「非晶質セレンのアバランシェ増倍を用いたX線撮像:深さ依存アバランシェノイズの調査(X−ray imaging using avalanche multiplication in amorphous selenium: Investigation of depth dependent avalanche noise)」、Med, Phys.、34(3):976−986、2007年
[11]:内容が引用により本明細書に組み入れられる、A.H.Goldan他に付与された米国特許第8,129,688号明細書
[12]:A.H.Goldan、O.Tousignant、K.S.Karim、及びJ.A.Rowlands著、「固体シャルパク光伝導体を用いた単極性時間微分パルス応答(Unipolar time−differential pulse response with a solid−state Charpak photoconductor)」、Appl. Phys. Lett.、101(21):213503、2012年
[13]:A.H.Goldan、J.A.Rowlands、O.Tousignant、及びK.S.Karim著、「非分散型無定形固体における単極性時間微分電荷検知(Unipolar time−differential charge sensing in non−dispersive amorphous solids)」、J. Appl. Phys.、113(22):224502、2013年
[14]:F.Sauli著、「GEM:ガス検出器における電子増幅のための新概念(GEM: A new concept for electron amplification in gas detectors)」、Nucl. Instr. and Meth. A、386(2−3):531−534、1997年
[15]:内容が引用により本明細書に組み入れられる、A.H.Goldan他に付与された米国特許出願第14/888,879号の米国特許出願公開第2016/0087113号明細書
[16]:内容が引用により本明細書に組み入れられる、A.H.Goldan他に付与された米国特許出願第14/414,607号の米国特許公開第2015/0171232号明細書
[17]:A.H.Goldan、J.A.Rowlands、M.Lu、及びW.Zhao著、「ピコ秒時間分解能を有するナノパターンマルチウェルアバランシェセレン検出器(Nanopattern multi−well avalanche selenium detector with picosecond time resolution)」、In Proc. Conf. Rec. IEEE NSS/MIC、N32−4頁、シアトル、2014年
242 第2の誘電体層
243 第3の誘電体層
Claims (7)
- マルチウェル非晶質セレン(a−Se)検出器の製作方法であって、
基板に隣接して画素電極を堆積させるステップと、
第1の誘電体層を堆積させるステップと、
前記第1の誘電体層上に第1の導電グリッド電極層を堆積させるステップと、
前記第1の導電グリッド電極層上に第2の誘電体層を堆積させるステップと、
前記第2の誘電体層上に第2の導電グリッド電極層を堆積させるステップと、
前記第2の導電グリッド電極層上に第3の誘電体層を堆積させるステップと、
前記第3の誘電体層上にエッチングマスクを堆積させるステップと、
前記エッチングマスクを使用して、前記第3の誘電体層、前記第2の導電グリッド電極層、前記第2の誘電体層、前記第1の導電グリッド電極層、前記第1の誘電体層を、前記画素電極をエッチングすることなく、異方性エッチングすることによって第1のエッチングを行って、間に少なくとも1つのウェルを含む少なくとも2つのピラーを形成し、前記画素電極は複数の前記ウェルに対応するものであるステップと、
前記少なくとも2つのピラー上及び前記少なくとも1つのウェルの底部に酸化物誘電体層を堆積させるステップと、
前記少なくとも1つのウェルを含む前記少なくとも2つのピラーの側面から前記酸化物誘電体層を除去することなく、前記マスク層の上面及び前記少なくとも1つのウェルの前記底部の酸化物を異方性エッチングし、前記画素電極をエッチングすることなく、前記少なくとも2つのピラーの間の前記少なくとも1つのウェルの前記底部の前記酸化物誘電体層を除去することによって第2のエッチングを行って、前記少なくとも1つのウェルの前記底部から前記酸化物誘電体層を除去するステップと、
前記ウェル及び前記ピラー上に非晶質セレン層を形成するステップと、
前記非晶質セレン層上に共通電極を形成するステップと、
を含むことを特徴とする方法。 - 前記少なくとも2つのピラーの各々は、前記第1の導電グリッド電極層と前記第2の導電グリッド電極層とを含んで、前記少なくとも1つのウェルの両側に第1の導電グリッド電極層の対と第2の導電グリッド電極層の対とを形成する、
請求項1に記載の方法。 - 前記第1の導電グリッド電極層の対は、前記画素電極から第1の距離だけ間隔を置き、
前記第2の導電グリッド電極層の対は、前記画素電極から第2の距離だけ間隔を置き、
前記第1の距離は前記第2の距離と異なる、
請求項2に記載の方法。 - 前記酸化物誘電体層は、前記第1の導電グリッド電極層の対の各々を完全に封入する、
請求項2に記載の方法。 - 前記酸化物誘電体層は、前記第2の導電グリッド電極層の対の各々を完全に封入する、
請求項2に記載の方法。 - 前記第1の導電グリッド電極層の対は、前記第1のエッチングを行う前に前記第1の導電グリッド電極層と前記第2の導電グリッド電極層とを整列させることなく前記第2の導電グリッド電極層の対と整列する、
請求項2に記載の方法。 - 前記第1の導電グリッド電極層及び前記第2の導電グリッド電極層は、前記第1の誘電体層上又は前記第2の誘電体層上にそれぞれ積層する前にパターン形成されない、
請求項1に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662275919P | 2016-01-07 | 2016-01-07 | |
US62/275,919 | 2016-01-07 | ||
PCT/US2017/012712 WO2017120582A1 (en) | 2016-01-07 | 2017-01-09 | Multi-well selenium device and method for fabrication thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019508903A JP2019508903A (ja) | 2019-03-28 |
JP6924208B2 true JP6924208B2 (ja) | 2021-08-25 |
Family
ID=59274078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018554649A Active JP6924208B2 (ja) | 2016-01-07 | 2017-01-09 | マルチウェルセレンデバイス及びその製作方法 |
Country Status (8)
Country | Link |
---|---|
US (3) | US10658530B2 (ja) |
EP (1) | EP3400615A4 (ja) |
JP (1) | JP6924208B2 (ja) |
KR (1) | KR102255739B1 (ja) |
CN (1) | CN108780823B (ja) |
AU (1) | AU2017205207B2 (ja) |
CA (1) | CA3010852C (ja) |
WO (1) | WO2017120582A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA3010845C (en) | 2016-01-07 | 2023-09-19 | Amirhossein Goldan | Selenium photomultiplier and method for fabrication thereof |
EP3400615A4 (en) | 2016-01-07 | 2019-08-14 | The Research Foundation for The State University of New York | SELENIUM-BASED MULTI-WELL DEVICE AND METHOD FOR MANUFACTURING THE SAME |
US10763290B2 (en) | 2017-02-22 | 2020-09-01 | Elwha Llc | Lidar scanning system |
US11005186B2 (en) | 2019-03-18 | 2021-05-11 | Lumotive, LLC | Tunable liquid crystal metasurfaces |
WO2021167657A2 (en) | 2019-11-13 | 2021-08-26 | Lumotive, LLC | Lidar systems based on tunable optical metasurfaces |
WO2022187188A1 (en) * | 2021-03-01 | 2022-09-09 | The Research Foundation For The State University Of New York | Dual-layer detector system and method for spectral imaging and contrast enhanced digital breast tomosynthesis |
KR102567895B1 (ko) * | 2021-08-19 | 2023-08-17 | 청주대학교 산학협력단 | 분산 마이크로 전극 그리드를 갖는 3차원 투명 태양전지 |
US11429008B1 (en) | 2022-03-03 | 2022-08-30 | Lumotive, LLC | Liquid crystal metasurfaces with cross-backplane optical reflectors |
US11487183B1 (en) | 2022-03-17 | 2022-11-01 | Lumotive, LLC | Tunable optical device configurations and packaging |
US11493823B1 (en) | 2022-05-11 | 2022-11-08 | Lumotive, LLC | Integrated driver and heat control circuitry in tunable optical devices |
US11487184B1 (en) | 2022-05-11 | 2022-11-01 | Lumotive, LLC | Integrated driver and self-test control circuitry in tunable optical devices |
Family Cites Families (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3359406B2 (ja) * | 1993-12-27 | 2002-12-24 | 三菱電機株式会社 | 半導体装置の製造方法 |
US6051446A (en) | 1998-04-09 | 2000-04-18 | National Semiconductor Corporation | Thin liquid crystal transducer pixel cell having self-aligned support pillars |
US5982472A (en) | 1998-12-14 | 1999-11-09 | National Semiconductor Corporation | Self-aligned pixel with support pillars for a liquid crystal light valve |
WO2001008224A1 (en) * | 1999-07-26 | 2001-02-01 | Edge Medical Devices Ltd. | Digital detector for x-ray imaging |
JP3479010B2 (ja) * | 1999-11-04 | 2003-12-15 | Necエレクトロニクス株式会社 | 不揮発性半導体記憶装置の製造方法 |
US6437339B2 (en) | 2000-03-24 | 2002-08-20 | Hologic, Inc. | Flat panel x-ray imager with gain layer |
JP2002353472A (ja) * | 2001-05-28 | 2002-12-06 | Fuji Photo Film Co Ltd | 光検出装置および方法 |
JP3785501B2 (ja) * | 2001-11-15 | 2006-06-14 | 財団法人新産業創造研究機構 | ガス増幅型x線イメージング検出器及びガス増幅型x線イメージング検出方法 |
US7256402B1 (en) | 2004-04-15 | 2007-08-14 | Denny Lee | Flat panel X-ray imager with a grid structure |
TWI343654B (en) | 2007-07-25 | 2011-06-11 | Au Optronics Corp | Method for fabricating pixel structures |
CA2615827A1 (en) | 2008-01-22 | 2009-07-22 | Karim S. Karim | Method and apparatus for single-polarity charge sensing for semiconductor radiation detectors deposited by physical vapor deposition techniques |
US7989275B2 (en) | 2008-03-10 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, manufacturing method thereof, display device, and manufacturing method thereof |
KR100991255B1 (ko) * | 2008-06-27 | 2010-11-04 | 주식회사 디알텍 | 디지털 방사선 영상 검출기의 기판 장치 및 방사선 영상검출기 기판 장치의 제조 방법 |
US8741702B2 (en) | 2008-10-24 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
JP5602598B2 (ja) * | 2010-11-29 | 2014-10-08 | 富士フイルム株式会社 | 放射線検出器及び放射線検出器の製造方法 |
JP5849489B2 (ja) | 2011-07-21 | 2016-01-27 | セイコーエプソン株式会社 | 電気光学装置、投射型表示装置、電子機器、および電気光学装置の製造方法 |
CN102903674B (zh) | 2011-07-26 | 2016-04-27 | 群创光电股份有限公司 | 显示面板及其制作方法 |
US9553220B2 (en) * | 2012-07-19 | 2017-01-24 | The Research Foundation For The State University Of New York | Field-shaping multi-well avalanche detector for direct conversion amorphous selenium |
WO2014194071A1 (en) | 2013-05-29 | 2014-12-04 | The Research Foundation For The State University Of New York | Nano-electrode milti-well high-gain avalanche rushing photoconductor |
CN111430393A (zh) | 2015-08-27 | 2020-07-17 | 中国科学院微电子研究所 | 一种x射线传感器及其制造方法 |
KR102491580B1 (ko) | 2015-12-15 | 2023-01-25 | 삼성전자주식회사 | 이미지 센서 및 그 제조 방법 |
EP3400615A4 (en) | 2016-01-07 | 2019-08-14 | The Research Foundation for The State University of New York | SELENIUM-BASED MULTI-WELL DEVICE AND METHOD FOR MANUFACTURING THE SAME |
CN107507834B (zh) | 2016-06-14 | 2020-06-12 | 群创光电股份有限公司 | 显示装置及显示装置的制造方法 |
US10553733B2 (en) | 2016-11-29 | 2020-02-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | QE approach by double-side, multi absorption structure |
CN108008583B (zh) | 2017-12-04 | 2020-10-16 | 武汉华星光电半导体显示技术有限公司 | 柔性显示器件及其制备方法 |
CN108899327B (zh) | 2018-06-29 | 2021-01-26 | 武汉华星光电技术有限公司 | 一种阵列基板及其制备方法、显示器 |
CN109786257B (zh) | 2019-01-18 | 2022-04-01 | 惠科股份有限公司 | 薄膜晶体管的制作方法、阵列基板和显示面板 |
CN111048685A (zh) | 2019-11-08 | 2020-04-21 | 深圳市华星光电半导体显示技术有限公司 | 显示面板及其制备方法 |
CN111029344A (zh) | 2019-11-19 | 2020-04-17 | 深圳市华星光电半导体显示技术有限公司 | 一种阵列基板及其制备方法 |
US11910617B2 (en) | 2020-05-28 | 2024-02-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ferroelectric memory device and method of forming the same |
US11729988B2 (en) | 2020-06-18 | 2023-08-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device comprising conductive pillars and method of forming the same |
US11696448B2 (en) | 2020-06-18 | 2023-07-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device and method of forming the same |
CN111968981B (zh) | 2020-08-26 | 2021-12-24 | 无锡拍字节科技有限公司 | 一种fcob存储器件的制造方法及其电容器 |
CN111968980B (zh) | 2020-08-26 | 2021-11-23 | 无锡拍字节科技有限公司 | 一种存储器件的制造方法及其电容器 |
US11844224B2 (en) | 2021-01-13 | 2023-12-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory structure and method of forming the same |
CN114512507A (zh) | 2022-01-28 | 2022-05-17 | 长江先进存储产业创新中心有限责任公司 | 一种三维存储器及其形成方法 |
-
2017
- 2017-01-09 EP EP17736511.1A patent/EP3400615A4/en active Pending
- 2017-01-09 JP JP2018554649A patent/JP6924208B2/ja active Active
- 2017-01-09 WO PCT/US2017/012712 patent/WO2017120582A1/en active Application Filing
- 2017-01-09 CN CN201780015785.1A patent/CN108780823B/zh active Active
- 2017-01-09 US US16/068,563 patent/US10658530B2/en active Active
- 2017-01-09 CA CA3010852A patent/CA3010852C/en active Active
- 2017-01-09 AU AU2017205207A patent/AU2017205207B2/en active Active
- 2017-01-09 KR KR1020187022773A patent/KR102255739B1/ko active IP Right Grant
-
2020
- 2020-04-10 US US16/845,471 patent/US10868202B2/en active Active
- 2020-12-01 US US17/108,094 patent/US11508858B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20200243696A1 (en) | 2020-07-30 |
CA3010852C (en) | 2023-09-19 |
JP2019508903A (ja) | 2019-03-28 |
CN108780823B (zh) | 2022-04-19 |
EP3400615A4 (en) | 2019-08-14 |
KR102255739B1 (ko) | 2021-05-27 |
US10658530B2 (en) | 2020-05-19 |
CN108780823A (zh) | 2018-11-09 |
CA3010852A1 (en) | 2017-07-13 |
AU2017205207B2 (en) | 2021-12-16 |
EP3400615A1 (en) | 2018-11-14 |
US11508858B2 (en) | 2022-11-22 |
US20190006533A1 (en) | 2019-01-03 |
AU2017205207A1 (en) | 2018-08-02 |
US20210111286A1 (en) | 2021-04-15 |
US10868202B2 (en) | 2020-12-15 |
KR20180094117A (ko) | 2018-08-22 |
WO2017120582A1 (en) | 2017-07-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6924208B2 (ja) | マルチウェルセレンデバイス及びその製作方法 | |
US8129688B2 (en) | Method and apparatus for a radiation detector | |
CA2910922C (en) | Nano-electrode multi-well high-gain avalanche rushing photoconductor | |
US7060523B2 (en) | Lithium-drifted silicon detector with segmented contacts | |
US9553220B2 (en) | Field-shaping multi-well avalanche detector for direct conversion amorphous selenium | |
US11710798B2 (en) | Selenium photomultiplier and method for fabrication thereof | |
LaBella et al. | Multi-well avalanche selenium detector for time-of-flight pet | |
D’Ascenzo et al. | The Digital Silicon Photomultiplier | |
Spieler | Semiconductor Detectors | |
Dead | 24. PARTICLE DETECTORS |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20200107 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20210212 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20210301 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20210528 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20210701 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20210730 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6924208 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |