JP6902947B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP6902947B2
JP6902947B2 JP2017136328A JP2017136328A JP6902947B2 JP 6902947 B2 JP6902947 B2 JP 6902947B2 JP 2017136328 A JP2017136328 A JP 2017136328A JP 2017136328 A JP2017136328 A JP 2017136328A JP 6902947 B2 JP6902947 B2 JP 6902947B2
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JP
Japan
Prior art keywords
threshold value
output
output terminal
semiconductor device
circuit
Prior art date
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Active
Application number
JP2017136328A
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English (en)
Japanese (ja)
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JP2018036253A (ja
Inventor
友生 挽地
友生 挽地
稔 有山
稔 有山
功造 飯島
功造 飯島
聖史 志賀
聖史 志賀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Priority to TW106128234A priority Critical patent/TWI712808B/zh
Priority to KR1020170107289A priority patent/KR102399143B1/ko
Priority to US15/685,508 priority patent/US10110213B2/en
Priority to CN201710735785.0A priority patent/CN107786189B/zh
Publication of JP2018036253A publication Critical patent/JP2018036253A/ja
Application granted granted Critical
Publication of JP6902947B2 publication Critical patent/JP6902947B2/ja
Active legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2017136328A 2016-08-26 2017-07-12 半導体装置 Active JP6902947B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW106128234A TWI712808B (zh) 2016-08-26 2017-08-21 半導體裝置
KR1020170107289A KR102399143B1 (ko) 2016-08-26 2017-08-24 반도체 장치
US15/685,508 US10110213B2 (en) 2016-08-26 2017-08-24 Semiconductor device
CN201710735785.0A CN107786189B (zh) 2016-08-26 2017-08-24 半导体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016165828 2016-08-26
JP2016165828 2016-08-26

Publications (2)

Publication Number Publication Date
JP2018036253A JP2018036253A (ja) 2018-03-08
JP6902947B2 true JP6902947B2 (ja) 2021-07-14

Family

ID=61567295

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017136328A Active JP6902947B2 (ja) 2016-08-26 2017-07-12 半導体装置

Country Status (3)

Country Link
JP (1) JP6902947B2 (zh)
KR (1) KR102399143B1 (zh)
TW (1) TWI712808B (zh)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957759A (zh) * 1972-10-02 1974-06-05
JPS5186957A (ja) * 1975-01-29 1976-07-30 Japan Broadcasting Corp Heiretsufugokakairo
JPS60148227A (ja) * 1984-01-12 1985-08-05 Fujitsu Ltd Ａ／ｄ変換器の試験方法
JPH0484782A (ja) * 1990-07-27 1992-03-18 Nec Corp テスト回路
JP2002026269A (ja) * 2000-07-10 2002-01-25 Mitsubishi Electric Corp モード制御回路
DE10038323A1 (de) * 2000-08-05 2002-02-14 Philips Corp Intellectual Pty Schaltungsanordnung
KR100375986B1 (ko) * 2000-11-27 2003-03-15 삼성전자주식회사 프로그래머블 임피던스 제어회로
JP2004085526A (ja) * 2001-12-05 2004-03-18 Renesas Technology Corp 半導体装置
JP2006121377A (ja) * 2004-10-21 2006-05-11 Nec Electronics Corp 入力回路及び半導体装置
KR100804567B1 (ko) * 2005-08-24 2008-02-20 후지쯔 가부시끼가이샤 반도체 장치
US8457192B2 (en) * 2006-12-18 2013-06-04 Telefonaktiebolaget L M Ericsson (Publ) Pulse width modulator
JP4786608B2 (ja) * 2007-07-30 2011-10-05 パナソニック株式会社 磁界検出装置
JP2010216998A (ja) * 2009-03-17 2010-09-30 Panasonic Corp テストモード設定回路およびそれを備えた半導体集積回路
JP2013190256A (ja) * 2012-03-13 2013-09-26 Ricoh Co Ltd 半導体集積回路及びその半導体集積回路のテストモード設定方法
US9506979B2 (en) * 2014-04-02 2016-11-29 Freescale Semiconductor, Inc. Test mode entry interlock
US11404866B2 (en) * 2016-04-08 2022-08-02 Infineon Technologies Ag Electronic switching and protection circuit with several operation modes
US9985571B2 (en) * 2016-04-29 2018-05-29 Texas Instruments Incorporated Motor driver circuit and process of matching received, determined voltages

Also Published As

Publication number Publication date
JP2018036253A (ja) 2018-03-08
TW201825918A (zh) 2018-07-16
KR102399143B1 (ko) 2022-05-17
TWI712808B (zh) 2020-12-11
KR20180023851A (ko) 2018-03-07

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